Characterization of Total Ionizing Dose Response in 22 nm FDX CMOS Technology P2

Project: Research project

Project Details

Description

Characterization of Total Ionizing Dose Response in 22 nm FDX CMOS Technology P2 Characterization of Total Ionizing Dose Response in 22 nm FDX CMOS Technology P2
StatusFinished
Effective start/end date11/18/214/24/22

Funding

  • Jet Propulsion Laboratory (JPL): $35,000.00

Fingerprint

Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.