Project Details
Description
Characterization of Total Ionizing Dose Response in 22 nm FDX CMOS Technology Characterization of Total Ionizing Dose Response in 22 nm FDX CMOS Technology
Status | Finished |
---|---|
Effective start/end date | 6/4/20 → 8/31/21 |
Funding
- NASA: Headquarters: $50,000.00
Fingerprint
Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.