CAREER:Hierarchical Process Variability Analysis of Analog Circuits Geared for Test and Diagnosis

Project: Research project

Project Details

Description

CAREER:Hierarchical Process Variability Analysis of Analog Circuits Geared for Test and Diagnosis CAREER:Hierarchical Process Variability Analysis of Analog Circuits Geared for Test and Diagnosis
StatusFinished
Effective start/end date8/1/082/8/13

Funding

  • National Science Foundation (NSF): $285,757.00