Automated Defect Identification and Classification for Semi-conductor Units Undergoing Assembly and Test

Project: Research project

StatusFinished
Effective start/end date9/23/0912/31/11

Funding

  • INDUSTRY: Domestic Company: $226,864.00

Fingerprint

Defects
Inspection
Cameras
Product development
Image analysis
Industrial plants
Mathematical operators
Lighting
Engineers
X rays
Costs