Autoated Defect Identification and Classification for Semi-conductor Units Undergoing Assembly and Test

  • Karam, Lina (PI)

Project: Research project

Project Details

StatusFinished
Effective start/end date9/1/089/30/10

Funding

  • INDUSTRY: Domestic Company: $92,000.00

Fingerprint

Explore the research topics touched on by this project. These labels are generated based on the underlying awards/grants. Together they form a unique fingerprint.