Advancing Semiconductor Materials and Device Characterization using Aberration-Corrected Electron Microscopy

Physics & Astronomy

1. semiconductor devices 100%
2. aberration 87%
3. electron microscopy 84%
4. characterization 54%
5. microscopy 51%
6. nitrides 45%
7. holography 23%
8. sapphire 20%
9. examination 20%
10. physical properties 19%
11. synthesis 17%
12. gradients 16%
13. physics 15%
14. microstructure 14%
15. profiles 13%
16. electronics 12%
17. electrons 10%