Advanced Microscopy and Analysis for Infrared Detector Materials

Project: Research project

Description

This effort will be directed towards the characterization of infrared detector materials using various advanced electron microscopy imaging and analysis techniques. Initial attention will be focused on examination of Ga-free InAs/InAsSb Type II superlattices, where important issues include quantifying the extent of Sb incorporation into the Sb layers and assessing the degree of Sb segregation within the InAsSb layers. A second project will involve examination of colloidal HgTe quantum dot samples, where features of interest include determining the size and shape distribution of the particles, and as well as the basic microstructure as a function of their preparation conditions. Further projects and other materials will be determined by discussion.
Advanced electron microscopy and chemical mapping techniques are readily accessible with the state-of-the-art collection of microscopes located on the ASU campus, as described below, which include three aberration-corrected electron microscopes housed in a specially constructed facility. Available TEM operating modes include transmission and high-resolution electron microscopy (defect identification, strain-field analysis), incoherent Z-contrast imaging in scanning TEM (cation distribution), convergent beam electron diffraction (local lattice parameter), electron holography (internal electrostatic field) and energy-filtered or chemical imaging (elemental mapping). In addition, aberration-corrected electron microscopy and spectrum imaging will be used as appropriate to determine interfacial structure and local chemistry at the atomic scale. These materials characterization studies will be carried out in close collaboration with scientists at Sivananthan Laboratories responsible for sample synthesis in order to ensure that rapid progress is made towards achieving their overall research objectives.
StatusActive
Effective start/end date8/1/187/31/21

Funding

  • DOD-ARMY-ARL: Army Research Office (ARO): $149,999.00

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infrared detectors
electron microscopy
microscopy
aberration
examination
transmission electron microscopy
imaging techniques
holography
superlattices
lattice parameters
electron diffraction
electron microscopes
microscopes
quantum dots
chemistry
cations
preparation
microstructure
scanning
electric fields