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Research Output

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Patent
1900
2000
2001
2002
2003

Wafer Bond Strength Evaluation Apparatus

Alford, T., Jan 17 2003

Research output: Patent

2004
2005
2006

Flexible Electronic ID Tag

Aberle, J., Alford, T., Allee, D., Balanis, C. & Clark, L., Dec 1 2006

Research output: Patent

2013
2014