Research Output 1900 2018

Filter
Conference contribution
2015

As-doped Si's complex permittivity and its effects on heating curve at 2.45 GHz frequency

Varadan, S., Pan, G., Zhao, Z. & Alford, T. Jun 29 2015 2015 Joint Conference of the IEEE International Frequency Control Symposium and the European Frequency and Time Forum, FCS 2015 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 111-116 6 p. 7138802

Research output: ResearchConference contribution

Silicon wafers
Permittivity
Doping (additives)
Heating
Silicon

Determination of complex permittivity for low- and high-loss materials at microwave frequencies

Varadan, S. K., Zhang, L., Pan, G. & Alford, T. May 7 2015 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS 2014. Institute of Electrical and Electronics Engineers Inc., p. 219-222 4 p. 7103638

Research output: ResearchConference contribution

Microwave frequencies
Polychlorinated biphenyls
Permittivity
Copper
Bessel functions
2 Citations

Optimization of flexible Ag-chalcogenide glass sensors for radiation detection

Mahmud, A., Gonzalez-Velo, Y., Saremi, M., Barnaby, H. J., Kozicki, M. N., Holbert, K. E., Mitkova, M., Alford, T. L., Goryll, M., Mahalanabis, D., Yu, W., Chen, W. & Taggart, J. Dec 24 2015 2015 15th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-December, 7365644

Research output: ResearchConference contribution

optimization
glass
sensors
radiation
Radiation

The extent of dopant activation after microwave and rapid thermal anneals using similar heating profiles

Gunawansa, T., Zhao, Z., Theodore, N. D., Lanz, A. R. & Alford, T. L. 2015 TMS Annual Meeting. January ed. Minerals, Metals and Materials Society, Vol. 2015-January, p. 141-148 8 p.

Research output: ResearchConference contribution

Chemical activation
Microwaves
Doping (additives)
Heating
Hot Temperature
2 Citations

The impact of two-way formative feedback and web-enabled resources on student resource use and performance in materials courses

Krause, S. J., Baker, D. R., Carberry, A. R., Alford, T. L., Ankeny, C. J., Brooks, B. J., Koretsky, M. & Gibbons, B. J. 2015 122nd ASEE Annual Conference and Exposition: Making Value for Society. American Society for Engineering Education

Research output: ResearchConference contribution

Students
Feedback
Textbooks
Teaching
2014
2 Citations

Characterizing and addressing student learning issues and misconceptions (SLIMs) in materials science with muddiest point reflections and fast formative feedback

Krause, S. J., Baker, D. R., Carberry, A. R., Alford, T. L., Ankeny, J., Koretsky, M., Brooks, B. J., Waters, C., Gibbons, B. J., Maass, S. & Chan, C. K. 2014 ASEE Annual Conference and Exposition, Conference Proceedings. American Society for Engineering Education

Research output: ResearchConference contribution

Materials science
Students
Feedback
Monitoring
Warehouses
1 Citations

JTF web-enabled faculty and student tools for more effective teaching and learning through two-way, Frequent Formative Feedback

Krause, S. J., Baker, D. R., Carberry, A. R., Alford, T. L., Ankeny, C. J., Koretsky, M., Brooks, B. J., Gilbuena, D. M., Waters, C., Gibbons, B. J., Stuart, W. J., Maass, S. & Chan, C. K. 2014 ASEE Annual Conference and Exposition, Conference Proceedings. American Society for Engineering Education

Research output: ResearchConference contribution

Teaching
Students
Feedback
Textbooks
Warehouses
2013

Effect of silver thickness and annealing on optical and electrical properties of Nb2O5/Ag/Nb2O5 multilayers as transparent composite electrode on flexible substrate

Dhar, A. & Alford, T. L. 2013 Materials Research Society Symposium Proceedings. Vol. 1552, p. 101-106 6 p.

Research output: ResearchConference contribution

figure of merit
electrical properties
silver
optical properties
annealing
1 Citations

High mobility IGZO/ITO double-layered transparent composite electrode: A thermal stability study

Dhar, A. & Alford, T. L. 2013 Materials Research Society Symposium Proceedings. Materials Research Society, Vol. 1577, p. 54-59 6 p.

Research output: ResearchConference contribution

indium oxides
tin oxides
thermal stability
composite materials
electrodes

Optimization of IGZO/Cu/IGZO multilayers as transparent composite electrode on flexible substrate by room-temperature sputtering and post-deposition anneals

Dhar, A. & Alford, T. L. 2013 Materials Research Society Symposium Proceedings. Materials Research Society, Vol. 1577, p. 48-53 6 p.

Research output: ResearchConference contribution

Sputtering
Multilayers
Electrodes
Composite materials
Substrates

Transparent composite electrodes for future flexible photovoltaic applications

Alford, T. L. 2013 TMS Annual Meeting. p. 183-190 8 p.

Research output: ResearchConference contribution

Oxides
Electrodes
Composite materials
composite materials
electrodes
2012

Influence of thermal stress and kinetic bias stress on the electrical performance of mixed oxide thin film transistors

Vemuri, R. N. P. & Alford, T. L. 2012 ECS Transactions. 8 ed. Vol. 50, p. 161-166 6 p.

Research output: ResearchConference contribution

Thin film transistors
Thermal stress
Oxide films
Kinetics
Temperature

Mechanical and electro-mechanical stress effects on performance of flexible IZO TFTs

Alford, T. L., Indluru, A. & Vemuri, R. N. P. 2012 Materials Research Society Symposium Proceedings. Vol. 1443, p. 21-26 6 p.

Research output: ResearchConference contribution

zinc oxides
indium oxides
transistors
thin films
Zinc Oxide

Mixed oxide thin film transistors under combinatory optical irradiation and electrical bias

Alford, T. L., Vemuri, R. N. P. & Mathews, W. P. 2012 ECS Transactions. 8 ed. Vol. 50, p. 179-184 6 p.

Research output: ResearchConference contribution

Thin film transistors
Oxide films
Irradiation
Vacancies
Lighting

The stability and reliability of mixed oxide-based thin film transistors under gamma irradiation

Alford, T. L., Indluru, A., Vemuri, R. N. P. & Holbert, K. E. 2012 ECS Transactions. 8 ed. Vol. 50, p. 191-196 6 p.

Research output: ResearchConference contribution

Thin film transistors
Zinc oxide
Gamma rays
Indium
Irradiation
2011
1 Citations

Gold nanolayers embedded in zinc oxide for large area flexible photovoltaics

Alford, T. L. & Sivaramakrishnan, K. 2011 Materials Research Society Symposium Proceedings. Vol. 1322, p. 13-19 7 p.

Research output: ResearchConference contribution

zinc oxides
gold
conduction
Zinc Oxide
Gold
1 Citations

ZnO-based transparent anodes for organic light-emitting devices

Sivaramakrishnan, K., Bakken, N. & Alford, T. L. 2011 Materials Research Society Symposium Proceedings. Vol. 1359, p. 43-48 6 p.

Research output: ResearchConference contribution

anodes
electrodes
Anodes
Electrodes
ITO (semiconductors)
2010

Aluminum thermo-compression bonding characterization

Cakmak, E., Dragoi, V., Pabo, E., Matthias, T. & Alford, T. 2010 Materials Research Society Symposium Proceedings. Vol. 1222, p. 167-172 6 p.

Research output: ResearchConference contribution

aluminum
Aluminum
Temperature
wafers
temperature

Effect of thermal processing on silver contacts for zinc oxide and indium tin oxide

Sivaramakrishnan, K., Iyer, S., Theodore, N. D. & Alford, T. L. 2010 Advanced Metallization Conference (AMC). p. 281-290 10 p.

Research output: ResearchConference contribution

Zinc oxide
Tin oxides
Indium
Silver
Zinc Oxide

Enhanced performance and thermal stability of a-Si: H TFTs

Indluru, A. & Alford, T. L. 2010 ECS Transactions. 5 ed. Vol. 33, p. 57-64 8 p.

Research output: ResearchConference contribution

Thin film transistors
Thermodynamic stability
Temperature
Electron mobility
Bias voltage

Improved thermal stability of indium zinc oxide TFTs by low temperature post annealing

Indluru, A. & Alford, T. L. 2010 ECS Transactions. 5 ed. Vol. 33, p. 337-344 8 p.

Research output: ResearchConference contribution

Thin film transistors
Zinc oxide
Indium
Oxide films
Thermodynamic stability

Low temperature dopant activation using variable frequency microwave annealing

Alford, T. L., Sivaramakrishnan, K., Indium, A., Ahmad, I., Hubbard, R. & Theodore, N. D. 2010 Materials Research Society Symposium Proceedings. Vol. 1245, p. 331-336 6 p.

Research output: ResearchConference contribution

Rapid thermal annealing
Microwave frequencies
Chemical activation
Doping (additives)
Annealing

Metallic conduction in ZnO/Cu/ZnO thin films

Sivaramakrishnan, K., Theodore, N. D., Moulder, J. F. & Alford, T. L. 2010 Advanced Metallization Conference (AMC). p. 269-279 11 p.

Research output: ResearchConference contribution

Copper
Thin films
Metals
Wavelength
Fermi surface

The role of sputter pressure in influencing electrical and optical properties of ITO on glass

Elhalawaty, S., Sivaramakrishnan, K., Theodore, N. D. & Alford, T. L. 2010 Materials Research Society Symposium Proceedings. Vol. 1256, p. 101-112 12 p.

Research output: ResearchConference contribution

indium oxides
tin oxides
electrical properties
optical properties
glass

The role of sputter pressure in influencing electrical and optical properties of ITO on glass

Elhalawaty, S., Sivaramakrishnan, K., Theodore, N. D. & Alford, T. L. 2010 Materials Research Society Symposium Proceedings. Vol. 1257, p. 265-276 12 p.

Research output: ResearchConference contribution

indium oxides
tin oxides
electrical properties
optical properties
glass
2 Citations

Threshold voltage shift variation of a-Si: H TFTs with anneal time

Indluru, A., Venugopal, S. M., Allee, D. R. & Alford, T. L. 2010 Materials Research Society Symposium Proceedings. Vol. 1245, p. 403-408 6 p.

Research output: ResearchConference contribution

threshold voltage
transistors
shift
thin films
Thin film transistors
2009

Residual stress reduction for air plasma sprayed Al-Si abradable coating

Tucker, J. R., Abbott, B., Sivaramakrishnan, K. & Alford, T. L. 2009 TMS Annual Meeting. Vol. 3, p. 249-255 7 p.

Research output: ResearchConference contribution

Residual stresses
Plasmas
Coatings
Air
residual stress
3 Citations

Variable frequency microwave induced low temperature dopant activation in ion implanted silicon

Alford, T. L., Ahmad, I. & Hubbard, R. 2009 17th IEEE Conference on Advanced Thermal Processing of Semiconductors, RTP 2009. 5373441

Research output: ResearchConference contribution

Microwave frequencies
Silicon
Chemical activation
Doping (additives)
Ions
2008

Effect of inactivated dopants clusters and processing parameters on electrical properties of indium tin oxide on plastic substrates

Han, H., Lewis, J. & Alford, T. 2008 Materials Research Society Symposium Proceedings. Vol. 1074, p. 174-179 6 p.

Research output: ResearchConference contribution

Tin oxides
Indium
Electric properties
Doping (additives)
Plastics

Signal processing for rapid bacterial detection

Nandakumar, V., LaBelle, J. T. & Alford, T. L. 2008 Conference Record - Asilomar Conference on Signals, Systems and Computers. p. 1979-1981 3 p. 5074777

Research output: ResearchConference contribution

Pathogens
Signal processing
Salmonella
Decision theory
Electrochemical impedance spectroscopy

Tailoring electrical conductivity and mechanism of carrier transport in zinc oxide with embedded Ag layer

Han, H., Theodore, N. D. & Alford, T. 2008 Materials Research Society Symposium Proceedings. Vol. 1074, p. 167-173 7 p.

Research output: ResearchConference contribution

Zinc Oxide
Carrier transport
Electric properties
Electric Conductivity
Zinc oxide
2007
1 Citations

A study of tungsten-titanium barriers in silver metallization

Bhagat, S., Theodore, N. D. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 990, p. 153-158 6 p.

Research output: ResearchConference contribution

Tungsten
Metallizing
Titanium
Silver
Temperature

Enhanced [111] preferred orientation of Ag thin film on amorphous SiO 2 by Cu addition

Zoo, Y., Han, H. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 990, p. 141-146 6 p.

Research output: ResearchConference contribution

Textures
Thin films
Copper
Adhesion
Agglomeration
1 Citations

Influence of metal impurity defects on the electrical and optical properties of ITO films on the PEN substrates

Han, H. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 1012, p. 373-378 6 p.

Research output: ResearchConference contribution

Polyethylenes
Electric properties
Optical properties
Impurities
Defects
1 Citations

Investigation of biaxial strain in strained silicon on insulator (SSOI) using high-resolution x-ray diffraction

Zoo, Y., Theodore, N. D. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 994, p. 191-196 6 p.

Research output: ResearchConference contribution

Diffraction
X rays
Strained silicon
Substrates
Epitaxial layers

Mechanical properties of indium tin oxide on polyethylene napthalate substrate

Bhagat, S., Zoo, Y., Han, H., Lewis, J., Grego, S., Lee, K., Iyer, S. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 1012, p. 401-406 6 p.

Research output: ResearchConference contribution

Tin oxides
Indium
Polyethylenes
Mechanical properties
Substrates
1 Citations

Microwave activation of dopants & solid phase epitaxy in silicon

Thompson, D. C., Decker, J., Alford, T. L., Mayer, J. W. & Theodore, N. D. 2007 Materials Research Society Symposium Proceedings. Vol. 989, p. 145-150 6 p.

Research output: ResearchConference contribution

Arsenic
Silicon
Epitaxial growth
Chemical activation
Microwaves

Microwave activation of exfoliation in ion-cut silicon layer transfer

Thompson, D. C., Alford, T. L., Mayer, J. W., Hochbauer, T., Lee, J. K., Nastasi, M. & David Theodore, N. 2007 Materials Research Society Symposium Proceedings. Vol. 994, p. 137-142 6 p.

Research output: ResearchConference contribution

Silicon
Chemical activation
Microwaves
Ions
Substrates

Potential of Ag interconnect and contact metallization for various applications via Cu additions

Han, H., Zoo, Y., Mayer, J. W. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 990, p. 191-196 6 p.

Research output: ResearchConference contribution

Metallizing
Textures
Tin oxides
Indium
Surface morphology

Texture evolution and stress in silver thin films on different substrates using X-ray diffraction

Zoo, Y. & Alford, T. L. 2007 Materials Research Society Symposium Proceedings. Vol. 990, p. 147-152 6 p.

Research output: ResearchConference contribution

Polyethylene
Silver
Textures
X ray diffraction
Thin films
2004

Morphology of Ti 37Al 63 thin-films deposited by magnetron sputtering

Theodore, N. D., Kim, H. C., Gadre, K. S., Mayer, J. W. & Alford, T. L. 2004 Materials Research Society Symposium Proceedings. Carter, R. J., Hau-Riege, C. S., Kloster, G. M., Lu, T-M. & Schulz, S. E. (eds.). Vol. 812, p. 215-220 6 p.

Research output: ResearchConference contribution

Magnetron sputtering
Thin films
Electronic equipment
Temperature
Oxidation resistance
1 Citations

Thermal stability and electrical properties of Ag(Al) metallization

Kim, H. C., David Theodore, N., Mayer, J. W. & Alford, T. L. 2004 Materials Research Society Symposium Proceedings. Carter, R. J., Hau-Riege, C. S., Kloster, G. M., Lu, T-M. & Schulz, S. E. (eds.). Vol. 812, p. 209-214 6 p.

Research output: ResearchConference contribution

Metallizing
Electric properties
Thermodynamic stability
Thin films
Agglomeration
2003
32 Citations

Identifying student misconceptions in introductory materials engineering classes

Krause, S., Decker, J. C., Niska, J., Alford, T. & Griffin, R. 2003 ASEE Annual Conference Proceedings. p. 3753-3760 8 p.

Research output: ResearchConference contribution

Students
Crystal atomic structure
Band structure
Phase diagrams
Semiconductor materials
2002
3 Citations

Monolithic transformers in a five metal CMOS process

Jaehning, J., Allee, D. R., El-Sharawy, E. B., Alford, T. L., Yazdi, N. & Allstot, D. J. 2002 Proceedings - IEEE International Symposium on Circuits and Systems. Vol. 2

Research output: ResearchConference contribution

Metals

Nanometer-scale silicide structures formed by focused ion-beam implantation

Alford, T. L., Mitan, M. & Mayer, J. W. 2002 Proceedings of the International Conference on Ion Implantation Technology. Institute of Electrical and Electronics Engineers Inc., Vol. 22-27-September-2002, p. 677-681 5 p. 1258096

Research output: ResearchConference contribution

Focused ion beams
Oxides
implantation
ion beams
Silicon
2000

A comparative study of Ti/low-k HSQ (hydrogen silsesquioxane) and Ti/TEOS (tetraethylorthosilicate) structures at elevated temperatures

Zeng, Y., Chen, L. & Alford, T. L. 2000 Materials Research Society Symposium - Proceedings. Oehrlein, G. S., Maex, K., Joo, Y-C., Ogawa, S. & Wetzel, J. T. (eds.). Vol. 612

Research output: ResearchConference contribution

Hydrogen
Temperature
tetraethoxysilane
Oxygen
Titanium

Formation of Al xO yN z barriers for advanced silver metallization

Wang, Y. & Alford, T. L. 2000 Materials Research Society Symposium - Proceedings. Oehrlein, G. S., Maex, K., Joo, Y-C., Ogawa, S. & Wetzel, J. T. (eds.). Vol. 612

Research output: ResearchConference contribution

Metallizing
Silver
Temperature
Diffusion barriers
Ammonia

Kinetics model for the self-encapsulation of Ag/Al bilayers

Wang, Y., Alford, T. L. & Mayer, J. W. 2000 Materials Research Society Symposium - Proceedings. Oehrlein, G. S., Maex, K., Joo, Y-C., Ogawa, S. & Wetzel, J. T. (eds.). Vol. 612

Research output: ResearchConference contribution

Encapsulation
Atoms
Kinetics
Temperature
Diffusion barriers

The integration of low-k dielectric material hydrogen silsesquioxane (HSQ) with nitride thin films as barriers

Zeng, Y., Chen, L. & Alford, T. L. 2000 Materials Research Society Symposium - Proceedings. Oehrlein, G. S., Maex, K., Joo, Y-C., Ogawa, S. & Wetzel, J. T. (eds.). Vol. 612

Research output: ResearchConference contribution

Nitrides
Hydrogen
Thin films
Low-k dielectric
Physical vapor deposition
1997

Analysis of residual stress in polycrystalline silver thin films by x-ray diffraction

Alford, T. L., Zeng, Y., Zou, Y. L., Deng, F., Lau, S. S., Laursen, T. & Ullrich, B. M. 1997 Materials Research Society Symposium - Proceedings. MRS, Vol. 472, p. 293-298 6 p.

Research output: ResearchConference contribution

Silver
Residual stresses
Diffraction
X rays
Thin films