Engineering & Materials Science
Thin films
100%
Silver
83%
Rutherford backscattering spectroscopy
72%
Indium
66%
Substrates
66%
Annealing
66%
Temperature
57%
Metallizing
51%
Spectrometry
45%
Thin film transistors
45%
Electric properties
41%
Silicon
41%
Nitridation
40%
Zinc oxide
40%
Tin oxides
39%
Ions
39%
Perovskite solar cells
37%
Oxide films
34%
Optical properties
33%
Ion beams
32%
Diffusion barriers
31%
Thermodynamic stability
31%
Electrodes
31%
Organic solar cells
29%
Copper
29%
Encapsulation
29%
X ray diffraction
28%
Silicides
27%
Doping (additives)
26%
Oxides
26%
Microwaves
25%
Hydroxyapatite
25%
Transmission electron microscopy
23%
Glass
22%
Titanium
22%
Metals
21%
Sol-gels
21%
Perovskite
19%
Sheet resistance
19%
Chemical analysis
19%
Sputtering
19%
Chalcogenides
19%
Nitrides
18%
Multilayers
18%
Refractory metals
16%
Crystalline materials
16%
Electromigration
16%
Adhesion
16%
Polyethylenes
15%
Passivation
15%
Physics & Astronomy
silver
68%
thin films
63%
annealing
45%
silicon
43%
indium oxides
42%
backscattering
42%
tin oxides
36%
electrical properties
30%
electrical resistivity
30%
ions
30%
thermal stability
28%
silicides
28%
microwaves
27%
zinc oxides
25%
copper
23%
polyethylenes
22%
temperature
21%
electromigration
21%
optical properties
21%
spectroscopy
21%
textures
20%
solar cells
19%
ion beams
19%
implantation
19%
x rays
18%
electrodes
18%
oxides
17%
transistors
17%
glass
16%
titanium nitrides
16%
adhesion
16%
diffraction
15%
transmittance
14%
metals
14%
aluminum
14%
fabrication
14%
oxide films
14%
transmission electron microscopy
13%
activation
13%
ion implantation
13%
characterization
13%
ammonia
13%
performance
12%
perovskites
12%
titanium
12%
chalcogenides
12%
barrier layers
12%
yttrium
11%
oxygen
11%
vacuum
11%
Chemical Compounds
Liquid Film
87%
Annealing
49%
Rutherford Backscattering Spectroscopy
46%
Electrical Property
31%
Alloy
26%
Microwave
24%
Diffusion Barrier
22%
Zinc Oxide
20%
Diffusion
19%
Optical Property
19%
Behavior as Electrode
19%
Surface
17%
Encapsulation
17%
Doping Material
17%
Sheet Resistance
16%
Transmittance
16%
Nitride
16%
Ion Beam
16%
X-Ray Diffraction
16%
Sputtering
16%
Multilayer
15%
Amorphous Silicon
14%
Thermal Stability
14%
Composite Material
14%
Application
13%
Ambient Reaction Temperature
13%
Oxide
13%
Figure of Merit
13%
Crystalline Texture
13%
Time
13%
Transmission Electron Microscopy
12%
Silicon Dioxide
12%
Epitaxial Film
12%
Refractory Metal
12%
Glass
12%
Dielectric Material
11%
Vacuum
11%
Solar Cell
11%
Ion Implantation
10%
Compound Mobility
10%
Secondary Ion Mass Spectroscopy
10%
Metal
9%
Magnetron Sputtering
9%
Ammonia
9%
Chemical Passivation
9%
Microstructure
8%
Amorphous Material
8%
Ion Channeling
8%
Nonconductor
8%
Length
7%