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Engineering & Materials Science

Thin films
Silver
Metallizing
Substrates
Indium
Annealing
Temperature
Rutherford backscattering spectroscopy
Thin film transistors
Silicon
Spectrometry
Nitridation
Zinc oxide
Electric properties
Tin oxides
Copper
Diffusion barriers
Encapsulation
Oxide films
Electrodes
Thermodynamic stability
Ions
Microwaves
Ion beams
Hydroxyapatite
Optical properties
Electromigration
Glass
Oxides
Titanium
Doping (additives)
X ray diffraction
Metals
Sheet resistance
Multilayers
Transmission electron microscopy
Chemical analysis
Nitrides
Sol-gels
Adhesion
Sputtering
Refractory metals
Polyethylenes
Composite materials
Chemical activation
Textures
Ammonia
Titanium nitride
Aluminum
Processing

Chemical Compounds

Silver
Thin films
Silicon
Substrates
Annealing
Rutherford backscattering spectroscopy
Temperature
Zinc Oxide
Metallizing
Spectrometry
Nitridation
Electric properties
Copper
Indium
Oxides
Thin film transistors
Ions
Titanium
Encapsulation
Microwaves
Durapatite
Metals
Electrodes
Ion beams
Oxide films
Optical properties
Diffusion barriers
Thermodynamic stability
X ray diffraction
Doping (additives)
Sheet resistance
Polyethylene
Multilayers
Aluminum
Sol-gels
Transmission electron microscopy
Refractory metals
Chemical analysis
Silicon Dioxide
Composite materials
Sputtering
Chemical activation
Adhesion
Glass
Ammonia
Processing
Nitrides
Textures
MOS capacitors
Crystalline materials

Physics & Astronomy

Chemistry and Materials

silver
silicon
indium oxides
tin oxides
zinc oxides
copper
glass
oxides
aluminum
adhesion
titanium nitrides
silicides
titanium
ammonia
yttrium
silicon dioxide
composite materials

General

thin films
microwaves
thermal stability
polyethylenes
electromigration
implantation
textures
oxide films
metals
ion implantation
transmission electron microscopy
conduction
electronics
barrier layers

Engineering

annealing
backscattering
electrical properties
electrical resistivity
electrodes
transistors
x rays
solar cells
fabrication
sputtering

Physics

ions
temperature
optical properties
ion beams
transmittance
diffraction
room temperature
vacuum

Aerospace Sciences

spectroscopy