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Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 32 Similar Profiles
Data storage equipment Engineering & Materials Science
random access memory Physics & Astronomy
Oxides Engineering & Materials Science
Neural networks Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Static random access storage Engineering & Materials Science
Metals Chemical Compounds
Electric potential Engineering & Materials Science

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Research Output 2008 2019

24.5 A Twin-8T SRAM Computation-In-Memory Macro for Multiple-Bit CNN-Based Machine Learning

Si, X., Chen, J. J., Tu, Y. N., Huang, W. H., Wang, J. H., Chiu, Y. C., Wei, W. C., Wu, S. Y., Sun, X., Liu, R., Yu, S., Liu, R. S., Hsieh, C. C., Tang, K. T., Li, Q. & Chang, M. F., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 396-398 3 p. 8662392. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Static random access storage
Macros
Learning systems
Data storage equipment
Energy efficiency

25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source with <6×10 -6 Native Bit Error Rate

Pang, Y., Gao, B., Wu, D., Yi, S., Liu, Q., Chen, W. H., Chang, T. W., Lin, W. E., Sun, X., Yu, S., Qian, H., Chang, M. F. & Wu, H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 402-404 3 p. 8662307. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bit error rate
Silicon
Authentication
Cryptography
RRAM

Benchmark of RRAM based Architectures for Dot-Product Computation

Peng, X. & Yu, S., Jan 8 2019, 2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018. Institute of Electrical and Electronics Engineers Inc., p. 378-381 4 p. 8605606. (2018 IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

products
Data storage equipment
TOPS (spacecraft)
chips
machine learning

Characterizing Endurance Degradation of Incremental Switching in Analog RRAM for Neuromorphic Systems

Zhao, M., Wu, H., Gao, B., Sun, X., Liu, Y., Yao, P., Xi, Y., Li, X., Zhang, Q., Wang, K., Yu, S. & Qian, H., Jan 16 2019, 2018 IEEE International Electron Devices Meeting, IEDM 2018. Institute of Electrical and Electronics Engineers Inc., p. 20.2.1-20.2.4 8614664. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2018-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

endurance
random access memory
Durability
Computer systems
analogs

Demonstration of Generative Adversarial Network by Intrinsic Random Noises of Analog RRAM Devices

Lin, Y., Wu, H., Gao, B., Yao, P., Wu, W., Zhang, Q., Zhang, X., Li, X., Li, F., Lu, J., Li, G., Yu, S. & Qian, H., Jan 16 2019, 2018 IEEE International Electron Devices Meeting, IEDM 2018. Institute of Electrical and Electronics Engineers Inc., p. 3.4.1-3.4.4 8614483. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2018-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

random noise
Demonstrations
analogs
RRAM
Neural networks

Projects 2007 2022