If you made any changes in Pure these will be visible here soon.

Personal profile

Education/Academic qualification

PHD, University of California-Berkeley

… → 1966

MS, University of California-Berkeley

… → 1959

BS, University of California-Berkeley

… → 1958

Fingerprint Fingerprint is based on mining the text of the experts' scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

  • 3 Similar Profiles
High resolution electron microscopy Engineering & Materials Science
Electron energy loss spectroscopy Engineering & Materials Science
Oxygen Engineering & Materials Science
Electron microscopy Engineering & Materials Science
energy dissipation Physics & Astronomy
Transmission electron microscopy Engineering & Materials Science
Silicon Chemical Compounds
electron microscopy Physics & Astronomy

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1966 2017

  • 2054 Citations
  • 24 h-Index
  • 108 Article
  • 36 Conference contribution
  • 4 Chapter

Electrochemical Cycling of Polycrystalline Silver Nanoparticles Produces Single-Crystal Silver Nanocrystals

Singh, P., Carpenter, R. W. & Buttry, D. A., Nov 28 2017, In : Langmuir. 33, 47, p. 13490-13495 6 p.

Research output: Contribution to journalArticle

Silver
Nanocrystals
nanocrystals
silver
Single crystals
145 Citations

Vibrational spectroscopy in the electron microscope

Krivanek, O. L., Lovejoy, T. C., Dellby, N., Aoki, T., Carpenter, R. W., Rez, P., Soignard, E., Zhu, J., Batson, P. E., Lagos, M. J., Egerton, R. F. & Crozier, P. A., Oct 2 2015, In : Nature. 514, 7521, p. 209-212 4 p.

Research output: Contribution to journalArticle

Spectrum Analysis
Electrons
Electron Energy-Loss Spectroscopy
Radiation
Raman Spectrum Analysis
2 Citations

Challenges and opportunities in materials science with next generation monochromated EELS

Crozier, P. A., Zhu, J., Aoki, T., Rez, P., Bowman, W. J., Carpenter, R. W., Krivanek, O. L., Dellby, N., Lovejoy, T. C. & Egerton, R. F., Aug 1 2014, In : Microscopy and Microanalysis. 20, 3, p. 72-73 2 p.

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
Materials science
materials science
3 Citations

Exploring phonon signals by high energy / high spatial resolution EELS

Krivanek, O. L., Dellby, N., Lovejoy, T. C., Bacon, N. J., Corbin, G. J., Hrncirik, P., Szilagyi, Z. S., Aoki, T., Carpenter, R. W., Crozier, P. A., Zhu, J., Rez, P., Egerton, R. F. & Batson, P. E., Aug 1 2014, In : Microscopy and Microanalysis. 20, 3, p. 66-67 2 p.

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
spatial resolution
high resolution
energy

High energy and spatial resolution EELS band gap measurements using a nion monochromated cold field emission HERMES dedicated STEM

Carpenter, R. W., Xie, H., Lehner, S., Aoki, T., Mardinly, J., Vahidi, M., Newman, N. & Ponce, F. A., Aug 1 2014, In : Microscopy and Microanalysis. 20, 3, p. 70-71 2 p.

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
Field emission
field emission
Energy gap
spatial resolution

Projects 1985 2020