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Research Output 1900 2019

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1983
31 Citations (Scopus)

Surface imaging of III-V semiconductors by reflection electron microscopy and inner potential measurements

Yamamoto, N. & Spence, J., Jun 17 1983, In : Thin Solid Films. 104, 1-2, p. 43-55 13 p.

Research output: Contribution to journalArticle

Electron microscopy
electron microscopy
Imaging techniques
spatial resolution
Electron diffraction
1982
19 Citations (Scopus)

ATOMIC SITE AND SPECIES DETERMINATION USING THE CHANNELING EFFECT IN ELECTRON DIFFRACTION.

Spence, J. & Tafto, J., 1982, In : Scanning Electron Microscopy. pt 2, p. 523-531 9 p.

Research output: Contribution to journalArticle

Electron diffraction
Electrons
Radiation
Olivine
Crystals
53 Citations (Scopus)

Atomic site determination using the channeling effect in electron-induced x-ray emission

Taftø, J. & Spence, J., 1982, In : Ultramicroscopy. 9, 3, p. 243-247 5 p.

Research output: Contribution to journalArticle

X rays
Atoms
Electrons
atoms
electrons
196 Citations (Scopus)

ATOMIC STRUCTURE OF THE NiSi//2/(111)Si INTERFACE.

Cherns, D., Anstis, G. R., Hutchison, J. L. & Spence, J., Nov 1982, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 46, 5, p. 849-862 14 p.

Research output: Contribution to journalArticle

Silicon
Film thickness
Electron microscopes
Imaging techniques
film thickness
73 Citations (Scopus)

Crystal site location of iron and trace elements in a magnesium-iron olivine by a new crystallographic technique

Taftø, J. & Spence, J., 1982, In : Science. 218, 4567, p. 49-51 3 p.

Research output: Contribution to journalArticle

Trace Elements
Magnesium
Iron
Manganese
Nickel
41 Citations (Scopus)

Electron energy loss spectroscopy as a probe of the local atomic environment

Krivanek, O. L., Disko, M. M., Taftø, J. & Spence, J., 1982, In : Ultramicroscopy. 9, 3, p. 249-254 6 p.

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
energy dissipation
electron energy
Atoms
probes
24 Citations (Scopus)

Stem microanalysis by transmission electron energy loss spectroscopy in crystals

Spence, J. & Lynch, J., 1982, In : Ultramicroscopy. 9, 3, p. 267-276 10 p.

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
Microanalysis
microanalysis
stems
energy dissipation
1981
40 Citations (Scopus)

Convergent beam electron microdiffraction from small crystals

Cowley, J. M. & Spence, J., 1981, In : Ultramicroscopy. 6, 1, p. 359-366 8 p.

Research output: Contribution to journalArticle

Electron beams
fine structure
electron beams
Diffraction patterns
Crystals
94 Citations (Scopus)
High resolution electron microscopy
electron microscopy
Electrons
high resolution
Silicon
38 Citations (Scopus)

Electronic structure of the unreconstructed 30°partial dislocation in silicon

Northrup, J. E., Cohen, M. L., Chelikowsky, J. R., Spence, J. & Olsen, A., 1981, In : Physical Review B. 24, 8, p. 4623-4628 6 p.

Research output: Contribution to journalArticle

Dangling bonds
High resolution electron microscopy
Silicon
Electronic structure
Sand
18 Citations (Scopus)

RESOLUTION AND ILLUMINATION COHERENCE IN ELECTRON MICROSCOPY.

Humphreys, C. J. & Spence, J., Feb 1981, In : Optik (Jena). 58, 2, p. 125-142 18 p.

Research output: Contribution to journalArticle

transfer functions
Electron microscopy
Transfer functions
spherical waves
electron microscopy
4 Citations (Scopus)
Diffraction patterns
diffraction patterns
Electrons
Energy dissipation
energy dissipation
1980
2 Citations (Scopus)

A real-time optical image projection system for electron microscopy

Spence, J. & Bleha, W. P., 1980, In : Journal of Microscopy. 120, 2, p. 121-128 8 p.

Research output: Contribution to journalArticle

Electron Microscopy
Electrons
Light
Liquid Crystals
Vacuum
2 Citations (Scopus)

Gliding dissociated dislocations in CdS

Cockayne, D. J. H., Hons, A. & Spence, J., 1980, In : Micron (1969). 11, 3-4, p. 299-300 2 p.

Research output: Contribution to journalArticle

33 Citations (Scopus)

GLIDING DISSOCIATED DISLOCATIONS IN HEXAGONAL CdS.

Cockayne, D. J. H., Hons, A. & Spence, J., Dec 1980, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 42, 6, p. 773-781 9 p.

Research output: Contribution to journalArticle

gliding
Stacking faults
Dislocations (crystals)
Tapes
Electron microscopy
10 Citations (Scopus)

USE OF CHARACTERISTIC LOSS ENERGY SELECTED ELECTRON DIFFRACTION PATTERNS FOR SITE SYMMETRY DETERMINATION.

Spence, J., Dec 1980, In : Optik (Jena). 57, 3, p. 451-456 6 p.

Research output: Contribution to journalArticle

Crystal symmetry
Electron diffraction
Diffraction patterns
Energy dissipation
diffraction patterns
3 Citations (Scopus)
Light modulators
Modulator
image processing
readout
modulators
1979
13 Citations (Scopus)

INNOVATIVE IMAGING AND MICRODIFFRACTION IN STEM.

Cowley, J. M. & Spence, J., Nov 1979, In : Ultramicroscopy. 2, 9, p. 433-438 6 p.

Research output: Contribution to journalArticle

stems
suggestion
central processing units
flexibility
solid state
32 Citations (Scopus)
Silicon
dipoles
Imaging techniques
stacking fault energy
Stacking faults
22 Citations (Scopus)

The effect of lens aberrations on lattice images of spinodally decomposed alloys

Spence, J., Cowley, J. M. & Gronsky, R., 1979, In : Ultramicroscopy. 4, 4, p. 429-433 5 p.

Research output: Contribution to journalArticle

Aberrations
aberration
Lenses
lenses
spacing
29 Citations (Scopus)

Uniqueness and the inversion problem of incoherent multiple scattering

Spence, J., 1979, In : Ultramicroscopy. 4, 1, p. 9-12 4 p.

Research output: Contribution to journalArticle

Incoherent scattering
Aluminum foil
Electron scattering
Multiple scattering
Scattering parameters
43 Citations (Scopus)

Innovative imaging and microdiffraction in stem

Cowley, J. M. & Spence, J., 1978, In : Ultramicroscopy. 3, C, p. 433-438 6 p.

Research output: Contribution to journalArticle

stems
Imaging techniques
113 Citations (Scopus)

LATTICE IMAGING IN STEM.

Spence, J. & Cowley, J. M., Mar 1978, In : Optik (Jena). 50, 2, p. 129-142 14 p.

Research output: Contribution to journalArticle

stems
Detectors
Imaging techniques
detectors
Aberrations
23 Citations (Scopus)
image resolution
Image resolution
periodic variations
Surface relaxation
Stairs
7 Citations (Scopus)

PRACTICAL PHASE DETERMINATION OF INNER DYNAMICAL REFLECTIONS IN STEM.

Spence, J., 1978, In : Scanning Electron Microscopy. v, 1, p. 61-68 8 p.

Research output: Contribution to journalArticle

Scanning Transmission Electron Microscopy
Diffraction
Diffraction gratings
Electric potential
Interferometry
1977
41 Citations (Scopus)

HIGH RESOLUTION IMAGE INTERPRETATION IN CRYSTALLINE GERMANIUM.

Spence, J., O'Keefe, M. A. & Kolar, H., Dec 1977, In : Optik (Jena). 49, 3, p. 307-323 17 p.

Research output: Contribution to journalArticle

Germanium
Image resolution
germanium
Crystalline materials
Multiple scattering
5 Citations (Scopus)

PHASE DETERMINATION OF MULTIPLY SCATTERED BEAMS IN STEM.

Spence, J., Oct 1977, In : Optik (Jena). 49, 1, p. 117-120 4 p.

Research output: Contribution to journalArticle

stems
Electron beams
electron beams
requirements
1974
3 Citations (Scopus)

Complex image determination in electron microscopy

Spence, J., 1974, In : Optica Acta. 21, 10, p. 835-837 3 p.

Research output: Contribution to journalArticle

half planes
Electron microscopy
Lenses
electron microscopy
Electron microscopes
102 Citations (Scopus)

Determination of the single-scattering probability distribution from plural-scattering data

Johnson, D. W. & Spence, J., 1974, In : Journal of Physics D: Applied Physics. 7, 6, p. 771-780 10 p., 304.

Research output: Contribution to journalArticle

Scattering parameters
Probability distributions
Scattering
Electron scattering
Fourier series
1971
25 Citations (Scopus)

Observation of double-plasmon excitation in aluminum

Spence, J. & Spargo, A. E. C., 1971, In : Physical Review Letters. 26, 15, p. 895-897 3 p.

Research output: Contribution to journalArticle

aluminum
excitation
solid state
1970
3 Citations (Scopus)

Plasmon mean free path in aluminium

Spence, J. & Spargo, A. E. C., Oct 5 1970, In : Physics Letters A. 33, 2, p. 116-117 2 p.

Research output: Contribution to journalArticle

mean free path
aluminum