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Research Output 1900 2019

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Article
1993
17 Citations (Scopus)
Electrons
1992
9 Citations (Scopus)

Channelling effects on oxygen-characteristic X-ray emission and their use as reference sites for ALCHEMI

Qian, W., Tötdal, B., Hoier, R. & Spence, J., 1992, In : Ultramicroscopy. 41, 1-3, p. 147-151 5 p.

Research output: Contribution to journalArticle

Oxygen
X rays
Atoms
oxygen
atoms
1 Citation (Scopus)

Comment on eeAtomic resolution in lensless low-energy electron holographyee

Spence, J., Zuo, J. M. & Qian, W., 1992, In : Physical Review Letters. 68, 21, p. 3256 1 p.

Research output: Contribution to journalArticle

electron energy
38 Citations (Scopus)

Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

Batson, P. E., Johnson, D. W. & Spence, J., 1992, In : Ultramicroscopy. 41, 1-3, p. 137-145 9 p.

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
Deconvolution
Field emission
field emission
energy dissipation
25 Citations (Scopus)

Transmission-electron Fourier imaging of crystal lattices using low-voltage field-emission sources: Theory

Spence, J. & Qian, W., 1992, In : Physical Review B. 45, 18, p. 10271-10279 9 p.

Research output: Contribution to journalArticle

Multiple scattering
crystal lattices
Crystal lattices
Field emission
low voltage
1991
102 Citations (Scopus)

Automated structure factor refinement from convergent-beam patterns

Zuo, J. M. & Spence, J., 1991, In : Ultramicroscopy. 35, 3-4, p. 185-196 12 p.

Research output: Contribution to journalArticle

Crystals
R Factors
Neutron diffraction
Electron diffraction
Diffraction patterns
4 Citations (Scopus)

Fine structure in coherent bremsstrahlung spectra

Spence, J. & Lund, M., 1991, In : Physical Review B. 44, 13, p. 7054-7057 4 p.

Research output: Contribution to journalArticle

bremsstrahlung
fine structure
Lattice vibrations
plane waves
solid state
5 Citations (Scopus)

First-principles electronic structure calculations with molecular dynamics made easy

Sankey, O. F., Adams, G. B., Weng, X., Dow, J. D., Huang, Y. M., Spence, J., Drabold, D. A., Hu, W. M., Wang, R. P., Klemm, S. & Fedders, P. A., 1991, In : Superlattices and Microstructures. 10, 4, p. 407-414 8 p.

Research output: Contribution to journalArticle

Electronic structure
Molecular dynamics
molecular dynamics
electronic structure
amorphous materials
6 Citations (Scopus)

Least-squares axial alchemi for Nb site determination in a TiAl intermetallic alloy

Qian, W. D., Spence, J., Kuwabara, M. & Strychor, R., 1991, In : Scripta Metallurgica et Materiala. 25, 2, p. 337-341 5 p.

Research output: Contribution to journalArticle

Microanalysis
Intermetallics
2 Citations (Scopus)

Quantitative electron crystallography with omega energy filtering

Spence, J., Mayer, J. & Zuo, J. M., 1991, In : Micron and Microscopica Acta. 22, 1-2, p. 173-174 2 p.

Research output: Contribution to journalArticle

Crystallography
Electrons
22 Citations (Scopus)

The influence of internal surfaces on the (2 × 1) shuffle and glide cleavage reconstructions for Si(111)

Huang, Y. M., Spence, J., Sankey, O. F. & Adams, G. B., Oct 2 1991, In : Surface Science. 256, 3, p. 344-353 10 p.

Research output: Contribution to journalArticle

Reconstruction (structural)
cleavage
Atoms
Surface reconstruction
Lattice vibrations
1990
114 Citations (Scopus)

Charge ordering in magnetite at low temperatures

Zuo, J. M., Spence, J. & Petuskey, W., 1990, In : Physical Review B. 42, 13, p. 8451-8464 14 p.

Research output: Contribution to journalArticle

Ferrosoferric Oxide
Magnetite
magnetite
Temperature
Electron diffraction
4 Citations (Scopus)

Magnetic constrast in reflection electron microscopy

Wang, Z. L. & Spence, J., Aug 1 1990, In : Surface Science. 234, 1-2, p. 98-107 10 p.

Research output: Contribution to journalArticle

Electron microscopy
Monolayers
electron microscopy
Image recording
Lorentz force
25 Citations (Scopus)

Observation of the graphite surface by reflection electron microscopy during STM operation

Spence, J., Lo, W. & Kuwabara, M., 1990, In : Ultramicroscopy. 33, 2, p. 69-82 14 p.

Research output: Contribution to journalArticle

Graphite
Scanning tunneling microscopy
scanning tunneling microscopy
Microscopes
graphite
9 Citations (Scopus)

On differentiation of the scattering matrix in dynamical transmission electron diffraction

Speer, S., Spence, J. & Ihrig, E., 1990, In : Acta Crystallographica Section A: Foundations of Crystallography. 46, 9, p. 763-772 10 p.

Research output: Contribution to journalArticle

Electrons
1989
51 Citations (Scopus)

Accurate structure-factor phase determination by electron diffraction in noncentrosymmetric crystals

Zuo, J. M., Spence, J. & Hoier, R., 1989, In : Physical Review Letters. 62, 5, p. 547-550 4 p.

Research output: Contribution to journalArticle

electron diffraction
charge distribution
crystals
high voltages
diffraction patterns
31 Citations (Scopus)

FORTRAN source listing for simulating three-dimensional convergent beam patterns with absorption by the Bloch wave method.

Zuo, J. M., Gjonnes, K. & Spence, J., May 1989, In : Journal of Electron Microscopy Technique. 12, 1, p. 29-55 27 p.

Research output: Contribution to journalArticle

FORTRAN
Subroutines
Computer program listings
Software
Diffraction
36 Citations (Scopus)

On the atomic structure of the Nb/Al2O3 interface and the growth of Al2O3 particles

Kuwabara, M., Spence, J. & Ruhle, M., Jul 1989, In : Journal of Materials Research. 4, 4, p. 972-977 6 p.

Research output: Contribution to journalArticle

Internal oxidation
Cermets
Dislocations (crystals)
atomic structure
Precipitates
24 Citations (Scopus)

On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

Spence, J., Zuo, J. M. & Lynch, J., 1989, In : Ultramicroscopy. 31, 2, p. 233-240 8 p.

Research output: Contribution to journalArticle

Silicon
stems
Electron diffraction
Diffraction patterns
Detectors
22 Citations (Scopus)

Reflection electron microscope imaging of an operating scanning tunneling microscope

Kuwabara, M., Lo, W. & Spence, J., 1989, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 7, 4, p. 2745-2751 7 p.

Research output: Contribution to journalArticle

Microscopes
Electron microscopes
electron microscopes
microscopes
Scanning
1 Citation (Scopus)

Spence, zuo and hoier reply

Spence, J., Zuo, J. M. & Hoier, R., 1989, In : Physical Review Letters. 63, 10, p. 1119 1 p.

Research output: Contribution to journalArticle

2 Citations (Scopus)

Surface imaging techniques and magnetic materials

Spence, J., 1989, In : Materials Science and Engineering B. 3, 4, p. 421-425 5 p.

Research output: Contribution to journalArticle

Magnetic materials
magnetic materials
imaging techniques
Electron reflection
Imaging techniques
4 Citations (Scopus)

Zuo, Spence, and OKeeffe reply [2]

Zuo, J. M., Spence, J. & Okeeffe, M., 1989, In : Physical Review Letters. 62, 19, p. 2329 1 p.

Research output: Contribution to journalArticle

1988
28 Citations (Scopus)
holders
entry
Electron microscopy
electron microscopy
Microscopes
111 Citations (Scopus)

Bonding in GaAs

Zuo, J. M., Spence, J. & O'Keeffe, M., 1988, In : Physical Review Letters. 61, 3, p. 353-356 4 p.

Research output: Contribution to journalArticle

pseudopotentials
electron diffraction
crystals
electrons
17 Citations (Scopus)

Determination of structure factor phase invariants from non-systematic many-beam effects in convergent-beam patterns

Høier, R., Zuo, J. M., Marthinsen, K. & Spence, J., 1988, In : Ultramicroscopy. 26, 1-2, p. 25-30 6 p.

Research output: Contribution to journalArticle

Semiconductor materials
intersections
simulation
energy
4 Citations (Scopus)

Kink mechanism for formation of the Si(111)-(2×1) reconstructed surface

Spence, J., 1988, In : Physical Review B. 38, 17, p. 12672-12674 3 p.

Research output: Contribution to journalArticle

Reconstruction (structural)
Surface reconstruction
Silicon
Phase transitions
Temperature
51 Citations (Scopus)

Large dynamic range, parallel detection system for electron diffraction and imaging

Spence, J. & Zuo, J. M., 1988, In : Review of Scientific Instruments. 59, 9, p. 2102-2105 4 p.

Research output: Contribution to journalArticle

Electron diffraction
dynamic range
electron diffraction
Pixels
pixels
18 Citations (Scopus)

Localization effects on quantification in axial and planar ALCHEMI

Spence, J., Kuwabara, M. & Kim, Y., 1988, In : Ultramicroscopy. 26, 1-2, p. 103-112 10 p.

Research output: Contribution to journalArticle

Microanalysis
microanalysis
X rays
Atoms
atoms
11 Citations (Scopus)

Structural characterization of Ba2YCu3O7 by high resolution transmission electron microscopy.

Ourmazd, A., Spence, J., Zuo, J. M. & Li, C. H., Mar 1988, In : Journal of Electron Microscopy Technique. 8, 3, p. 251-262 12 p.

Research output: Contribution to journalArticle

Specimen preparation
Oxygen vacancies
High resolution transmission electron microscopy
Transmission Electron Microscopy
misalignment
12 Citations (Scopus)
Electrons
gallium arsenide
1987
8 Citations (Scopus)

Comment on Submicrocrystallites and orientational proximity effect

Fan, G. Y., Cowley, J. M. & Spence, J., 1987, In : Physical Review Letters. 58, 3, p. 282 1 p.

Research output: Contribution to journalArticle

60 Citations (Scopus)

DETECTION OF OXYGEN ORDERING IN SUPERCONDUCTING CUPRATES.

Ourmazd, A. & Spence, J., Oct 1 1987, In : Nature. 329, 6138, p. 425-427 3 p.

Research output: Contribution to journalArticle

cuprates
oxygen
neutron diffraction
transmission electron microscopy
high resolution

Electron microdiffraction studies of new SiO2 precipitates in silicon

Kim, Y., Spence, J., Long, N., Bergholz, W. & O'Keeffe, M., 1987, In : Journal of Applied Physics. 62, 2, p. 419-422 4 p.

Research output: Contribution to journalArticle

precipitates
silicon
electrons
wafers
oxygen
116 Citations (Scopus)

MICROSTRUCTURE, OXYGEN ORDERING AND PLANAR DEFECTS IN THE HIGH-T//c SUPERCONDUCTOR YBa//2Cu//3O//6//. //9.

Ourmazd, A., Rentschler, J. A., Spence, J., O'Keeffe, M., Graham, R. J., Johnson, D. W. & Rhodes, W. W., Jan 1 1987, In : Nature. 327, 6120, p. 308-310 3 p.

Research output: Contribution to journalArticle

Phonons
Electrons
Oxygen
Temperature
1986
34 Citations (Scopus)

Electron-energy-loss near-edge structure of Be2C

Disko, M. M., Spence, J., Sankey, O. F. & Saldin, D., 1986, In : Physical Review B. 33, 8, p. 5642-5651 10 p.

Research output: Contribution to journalArticle

Energy dissipation
energy dissipation
electron energy
Electrons
Ground state
44 Citations (Scopus)

FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS.

Alexander, H., Spence, J., Shindo, D., Gottschalk, H. & Long, N., May 1986, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 53, 5 pt 1, p. 627-643 17 p.

Research output: Contribution to journalArticle

Stacking faults
Imaging techniques
Silicon
crystal defects
Electron microscopes
14 Citations (Scopus)

Pendellösung radiation and coherent Bremsstrahlung

Spence, J. & Reese, G., 1986, In : Acta Crystallographica Section A: Foundations of Crystallography. 42, 6, p. 577-585 9 p.

Research output: Contribution to journalArticle

Radiation

TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE INVESTIGATION OF ANOMALOUS SN DIFFUSION IN GAAS.

Graham, R. J., Spence, J. & Roedel, R. J., Jan 1 1986, In : Journal of Applied Physics. 59, 1, p. 164-167 4 p.

Research output: Contribution to journalArticle

cathodoluminescence
dopes
transmission electron microscopy
electricity
precipitates
1985
10 Citations (Scopus)

The structural sensitivity of electron energy-loss near-edge structure (ELNES)

Spence, J., 1985, In : Ultramicroscopy. 18, 1-4, p. 165-172 8 p.

Research output: Contribution to journalArticle

Energy dissipation
energy dissipation
electron energy
Electrons
Multiple scattering
1984
10 Citations (Scopus)

Applications of modern microdiffraction to materials science

Carpenter, R. & Spence, J., 1984, In : Journal of Microscopy. 136, 2, p. 165-178 14 p.

Research output: Contribution to journalArticle

Electrons
128 Citations (Scopus)
Burgers vector
Cathodoluminescence
Dislocations (crystals)
Diamonds
Electron microscopes
7 Citations (Scopus)

CHANNELLING RADIATION IN ELECTRON MICROSCOPY.

Spence, J. & Humphreys, C. J., Feb 1984, In : Optik (Jena). 66, 3, p. 225-242 18 p.

Research output: Contribution to journalArticle

Electron microscopy
electron microscopy
Radiation
radiation spectra
radiation
25 Citations (Scopus)
bremsstrahlung
Radiation
Electrons
radiation
electrons
49 Citations (Scopus)

Line defects in silicon: The 90°partial dislocation

Chelikowsky, J. R. & Spence, J., 1984, In : Physical Review B. 30, 2, p. 694-701 8 p.

Research output: Contribution to journalArticle

Silicon
Defects
Geometry
defects
silicon
1983
249 Citations (Scopus)

ALCHEMI: a new technique for locating atoms in small crystals

Spence, J. & Taftø, J., 1983, In : Journal of Microscopy. 130, 2, p. 147-154 8 p.

Research output: Contribution to journalArticle

Electrons
X-Rays
Cations
olivine
17 Citations (Scopus)

COHERENT BREMSSTRAHLUNG PEAKS IN X-RAY MICROANALYSIS SPECTRA.

Spence, J., Reese, G., Yamamoto, N. & Kurizki, G., Oct 1983, In : Philosophical Magazine B: Physics of Condensed Matter; Electronic, Optical and Magnetic Properties. 48, 4

Research output: Contribution to journalArticle

Microanalysis
X rays
Masks
Transmission electron microscopy
5 Citations (Scopus)

CRYSTAL SITE LOCATION OF DOPANTS IN SEMICONDUCTORS USING A 100-keV ELECTRON PROBE.

Tafto, J. & Spence, J., Sep 1983, In : Journal of Applied Physics. 54, 9, p. 5014-5015 2 p.

Research output: Contribution to journalArticle

crystals
electrons
x rays
impurities
atoms
38 Citations (Scopus)
Silicon
Electron diffraction
Surface structure
electron diffraction
Imaging techniques