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Research Output 1900 2019

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2000
15 Citations (Scopus)

Transmission electron diffraction at 200 eV and damage thresholds below the carbon K edge

Stevens, M. R., Chen, Q., Weierstall, U. & Spence, J., Jul 2000, In : Microscopy and Microanalysis. 6, 4, p. 368-379 12 p.

Research output: Contribution to journalArticle

yield point
Electron diffraction
Ionization
electron diffraction
damage
1999
5 Citations (Scopus)

Atomistics and mechanical properties of silicon

Spence, J., Nov 1999, In : Acta Materialia. 47, 15, p. 4153-4159 7 p.

Research output: Contribution to journalArticle

Silicon
Mechanical properties
Electron microscopy
Ductility
Ions
2 Citations (Scopus)

Convergent-beam RHEED in a dedicated UHV diffraction camera and applications to Si reconstructed surfaces

Weierstall, U., Zuo, J. M., Kjorsvik, T. & Spence, J., Nov 20 1999, In : Surface Science. 442, 2, p. 239-250 12 p.

Research output: Contribution to journalArticle

Reflection high energy electron diffraction
Diffraction
Cameras
cameras
Wave filters
324 Citations (Scopus)

Direct observation of d-orbital holes and Cu-Cu bonding in Cu2O

Zuo, J. M., Kim, M., O'Keeffe, M. & Spence, J., Sep 2 1999, In : Nature. 401, 6748, p. 49-52 4 p.

Research output: Contribution to journalArticle

Metals
Oxides
Cations
Oxide superconductors
Copper oxides
14 Citations (Scopus)

Dynamic inversion by the method of generalized projections

Spence, J., Calef, B. & Zuo, J. M., Mar 1 1999, In : Acta Crystallographica Section A: Foundations of Crystallography. 55, 2 PART I, p. 112-118 7 p.

Research output: Contribution to journalArticle

Electron diffraction
projection
Electrons
inversions
Multiple scattering
67 Citations (Scopus)

Future of atomic resolution electron microscopy for materials science

Spence, J., Oct 26 1999, In : Materials Science and Engineering R: Reports. 26, 1, p. 1-49 49 p.

Research output: Contribution to journalArticle

Materials science
Electron microscopy
Imaging techniques
Defects
Fullerenes
14 Citations (Scopus)

Kinks on partials of 60° dislocations in silicon as revealed by a novel TEM technique

Alexander, H., Kolar, H. R. & Spence, J., 1999, In : Physica Status Solidi (A) Applied Research. 171, 1, p. 5-16 12 p.

Research output: Contribution to journalArticle

Stacking faults
Silicon
Dislocations (crystals)
Shear stress
Electron microscopes
31 Citations (Scopus)

Point-projection electron imaging of tobacco mosaic virus at 40 eV electron energy

Weierstall, U., Spence, J., Stevens, M. & Downing, K. H., Aug 1999, In : Micron. 30, 4, p. 335-338 4 p.

Research output: Contribution to journalArticle

Tobacco Mosaic Virus
tobacco
Tobacco
viruses
Viruses
13 Citations (Scopus)

Scanning system for high-energy electron diffractometry

Avilov, A. S., Kuligin, A. K., Pietsch, U., Spence, J., Tsirelson, V. G. & Zuo, J. M., 1999, In : Journal of Applied Crystallography. 32, 6, p. 1033-1038 6 p.

Research output: Contribution to journalArticle

high energy electrons
Electrons
Scanning
scanning
Diffractometers
15 Citations (Scopus)

Wavefront reconstruction for in-line holograms formed by pure amplitude objects

Huang, X. M. H., Zuo, J. M. & Spence, J., Jul 1999, In : Applied Surface Science. 148, 3, p. 229-234 6 p.

Research output: Contribution to journalArticle

Holograms
Wavefronts
Holography
holography
1998
25 Citations (Scopus)

Ab-initio LDA calculations of the mean Coulomb potential V0 in slabs of crystalline Si, Ge and MgO

Kim, M. Y., Zuo, J. M. & Spence, J., 1998, In : Physica Status Solidi (A) Applied Research. 166, 1, p. 445-454 10 p.

Research output: Contribution to journalArticle

Coulomb potential
Electron holography
slabs
holography
Crystalline materials
8 Citations (Scopus)

Atomic species identification in STM using an imaging atom-probe technique

Weierstall, U. & Spence, J., 1998, In : Surface Science. 398, 1-2, p. 267-279 13 p.

Research output: Contribution to journalArticle

Microscopes
microscopes
Scanning
Imaging techniques
Atoms
1 Citation (Scopus)

Crystal structure determination by direct inversion of dynamical microdiffraction patterns

Spence, J., 1998, In : Journal of Microscopy. 190, 1-2, p. 214-221 8 p.

Research output: Contribution to journalArticle

Crystal structure
Electrons
inversions
Crystals
crystal structure
50 Citations (Scopus)
Electron diffraction
Diffraction patterns
diffraction patterns
electron diffraction
Electrons
6 Citations (Scopus)

Reflection shadow imaging of crystal surface by low-voltage point- reflection electron microscopy

Zhang, X., Weierstall, U. & Spence, J., Apr 1 1998, In : Ultramicroscopy. 72, 1-2, p. 67-81 15 p.

Research output: Contribution to journalArticle

crystal surfaces
low voltage
Electron microscopy
electron microscopy
Imaging techniques
1997
4 Citations (Scopus)

Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Morniroli, J. P., Cordier, P., Van Cappellen, É., Zuo, J. M. & Spence, J., 1997, In : Microscopy Microanalysis Microstructures. 8, 3, p. 187-202 16 p.

Research output: Contribution to journalArticle

Crystal defects
crystal defects
imaging techniques
Imaging techniques
Garnets
84 Citations (Scopus)

Charge density of MgO: Implications of precise new measurements for theory

Zuo, J. M., Rez, P., Spence, J. & Spence, J. C. H., 1997, In : Physical Review Letters. 78, 25, p. 4777-4780 4 p.

Research output: Contribution to journalArticle

breathing
charge distribution
electron diffraction
ions
8 Citations (Scopus)

Does electron holography energy-filter?

Spence, J. & Zuo, J. M., Oct 1 1997, In : Ultramicroscopy. 69, 3, p. 185-190 6 p.

Research output: Contribution to journalArticle

Electron holography
electron sources
Holograms
trucks
holography

Imaging moving dislocation kinks and buried interfaces by HREM

Spence, J., Jun 1 1997, In : Ultramicroscopy. 67, 1-4, p. 171-180 10 p.

Research output: Contribution to journalArticle

High resolution electron microscopy
Motion control
Materials science
Electron microscopy
Ductility
7 Citations (Scopus)

Low energy point reflection electron microscopy

Spence, J., Zhang, X., Weierstall, U., Zuo, J. M., Munro, E. & Rouse, J., Jun 1997, In : Surface Review and Letters. 4, 3, p. 577-587 11 p.

Research output: Contribution to journalArticle

Electron microscopy
electron microscopy
energy
16 Citations (Scopus)

Stem and shadow-imaging of biomolecules at 6 eV beam energy

Spence, J., Apr 1997, In : Micron. 28, 2, p. 101-116 16 p.

Research output: Contribution to journalArticle

pulse position modulation
Biomolecules
stems
Electron microscopes
electron microscopes
7 Citations (Scopus)

TEM imaging of dislocation kinks, their motion and pinning

Spence, J., Kolar, H. R. & Alexander, H., 1997, In : Journal de Physique III. 7, 12, p. 2325-2338 14 p.

Research output: Contribution to journalArticle

Transmission electron microscopy
Imaging techniques
Silicon
transmission electron microscopy
High resolution electron microscopy
32 Citations (Scopus)

The enhancement of electron microscope resolution by use of atomic focusers

Cowley, J. M., Spence, J. & Smirnov, V. V., Jun 15 1997, In : Ultramicroscopy. 68, 2, p. 135-148 14 p.

Research output: Contribution to journalArticle

Electron microscopes
electron microscopes
Transmission electron microscopy
transmission electron microscopy
augmentation
1996
27 Citations (Scopus)
Scanning tunneling microscopy
scanning tunneling microscopy
Spectroscopy
Atoms
spectroscopy
117 Citations (Scopus)

Observation of moving dislocation kinks and unpinning

Kolar, H. R., Spence, J. & Alexander, H., 1996, In : Physical Review Letters. 77, 19, p. 4031-4034 4 p.

Research output: Contribution to journalArticle

silicon
energy of formation
oxygen atoms
electron microscopy
dosage
36 Citations (Scopus)

Performance of imaging plates for electron recording

Zuo, J. M., McCartney, M. & Spence, J., Nov 1996, In : Ultramicroscopy. 66, 1-2, p. 35-47 13 p.

Research output: Contribution to journalArticle

CCD cameras
recording
Imaging techniques
Electrons
Pixels
4 Citations (Scopus)

Quantitative electron microdiffraction

Spence, J., 1996, In : Journal of Electron Microscopy. 45, 1, p. 19-26 8 p.

Research output: Contribution to journalArticle

Electron diffraction
Doping (additives)
Electrons
Multiple scattering
Charge density
1995
57 Citations (Scopus)

Dislocation kink motion in silicon

Huang, Y. M., Spence, J. & Sankey, O. F., 1995, In : Physical Review Letters. 74, 17, p. 3392-3395 4 p.

Research output: Contribution to journalArticle

ductility
silicon
valence
saddle points
shearing

Dynamics of vortices in superconductors observed by electron waves

Tonomura, A., Hawkes, P. W. & Spence, J., 1995, In : Scanning Microscopy. 9, 2, p. 311-320 10 p.

Research output: Contribution to journalArticle

Superconducting materials
Electron beams
Vortex flow
electron beams
vortices
47 Citations (Scopus)

Effect of Mn doping on charge density in γ-TiAl by quantitative convergent beam electron diffraction

Holmestad, R., Zuo, J. M., Spence, J., Hoiert, R. & Horita, Z., 1995, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 72, 3, p. 579-601 23 p.

Research output: Contribution to journalArticle

Charge density
Electron diffraction
electron diffraction
Doping (additives)
Covalent bonds
1994
26 Citations (Scopus)

Contrast and radiation damage in point-projection electron imaging of purple membrane at 100 V

Spence, J., Qian, W. & Zhang, X., 1994, In : Ultramicroscopy. 55, 1, p. 19-23 5 p.

Research output: Contribution to journalArticle

Radiation damage
radiation damage
projection
membranes
damage
74 Citations (Scopus)
Electron sources
electron sources
Field emission
field emission
Luminance
97 Citations (Scopus)
Electrons
50 Citations (Scopus)

On the mean inner potential in high- and low-energy electron diffraction

Saldin, D. K. & Spence, J., 1994, In : Ultramicroscopy. 55, 4, p. 397-406 10 p.

Research output: Contribution to journalArticle

Low energy electron diffraction
electron diffraction
Inelastic scattering
Electrons
Holography
11 Citations (Scopus)

On the minimum number of beams needed to distinguish enantiomorphs in X‐ray and electron diffraction

Spence, J., Zuo, J. M., O'Keeffe, M., Marthinsen, K. & Hoier, R., 1994, In : Acta Crystallographica Section A: Foundations of Crystallography. 50, 5, p. 647-650 4 p.

Research output: Contribution to journalArticle

X-Ray Diffraction
Electrons
2 Citations (Scopus)

Reflection electron microscopy of buried interfaces in the transmission geometry

Spence, J., 1994, In : Ultramicroscopy. 55, 3, p. 293-301 9 p.

Research output: Contribution to journalArticle

Electron microscopy
electron microscopy
Geometry
geometry
Multiple scattering
21 Citations (Scopus)

The effect of impurities on the ideal tensile strength of silicon

Huang, Y. M., Spence, J. & Sankey, O. F., 1994, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 70, 1, p. 53-62 10 p.

Research output: Contribution to journalArticle

Silicon
tensile strength
Tensile strength
Doping (additives)
Impurities
1993
36 Citations (Scopus)

Aberrations of emission cathodes: Nanometer diameter field-emission electron sources

Scheinfein, M. R., Qian, W. & Spence, J., 1993, In : Journal of Applied Physics. 73, 5, p. 2057-2068 12 p.

Research output: Contribution to journalArticle

electron sources
aberration
field emission
cathodes
low voltage
52 Citations (Scopus)

Brightness measurements of nanometer-sized field-emission-electron sources

Qian, W., Scheinfein, M. R. & Spence, J., 1993, In : Journal of Applied Physics. 73, 11, p. 7041-7045 5 p.

Research output: Contribution to journalArticle

electron sources
field emission
brightness
flux (rate)
tungsten
21 Citations (Scopus)
Lighting
illumination
Scattering
Crystals
Electrons
11 Citations (Scopus)

Comment on "electron holographic study of ferroelectric domain walls"

Spence, J., Cowley, J. M. & Zuo, J. M., 1993, In : Applied Physics Letters. 62, 19, p. 2446-2447 2 p.

Research output: Contribution to journalArticle

domain wall
electrons
5 Citations (Scopus)

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

Holmestad, R., Krivanek, O. L., Høier, R., Marthinsen, K. & Spence, J., 1993, In : Ultramicroscopy. 52, 3-4, p. 454-458 5 p.

Research output: Contribution to journalArticle

Electron diffraction
Diffraction patterns
Spectrometers
diffraction patterns
electron diffraction
11 Citations (Scopus)
Microanalysis
microanalysis
Atoms
Intermetallics
atoms
9 Citations (Scopus)

Electron optical properties of nanometer field emission electron sources

Qian, W., Scheinfein, M. R. & Spence, J., 1993, In : Applied Physics Letters. 62, 3, p. 315-317 3 p.

Research output: Contribution to journalArticle

electron sources
field emission
optical properties
electrons
aberration
32 Citations (Scopus)

Experimental low-voltage point-projection microscopy and its possibilities

Spence, J., Qian, W. & Melmed, A. J., 1993, In : Ultramicroscopy. 52, 3-4, p. 473-477 5 p.

Research output: Contribution to journalArticle

Carbon films
Radiation damage
Image resolution
Aberrations
low voltage
1 Citation (Scopus)

Foreword

Smith, D. & Spence, J., Dec 1993, In : Ultramicroscopy. 52, 3-4

Research output: Contribution to journalArticle

24 Citations (Scopus)

Investigation of STM image artifacts by in-situ reflection electron microscopy

Lo, W. K. & Spence, J., 1993, In : Ultramicroscopy. 48, 4, p. 433-444 12 p.

Research output: Contribution to journalArticle

Electron microscopy
artifacts
electron microscopy
Microscopes
microscopes
71 Citations (Scopus)

Lattice trapping and surface reconstruction for silicon cleavage on (111). Ab-initio quantum molecular dynamics calculations

Spence, J., Huang, Y. M. & Sankey, O., 1993, In : Acta Metallurgica et Materialia. 41, 10, p. 2815-2824 10 p.

Research output: Contribution to journalArticle

Surface reconstruction
Silicon
Molecular dynamics
Atoms
Cracks
18 Citations (Scopus)
X-Ray Diffraction
Electrons
127 Citations (Scopus)
Electrons