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Research Output 1900 2019

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Conference contribution
2016
1 Citation (Scopus)

Measurements of transmitted electron beam extinction through Si crystal membranes

Nanni, E. A., Li, R. K., Limborg, C., Shen, X., Weathersby, S., Graves, W., Kirian, R., Spence, J. & Weierstall, U., 2016, IPAC 2016 - Proceedings of the 7th International Particle Accelerator Conference. Joint Accelerator Conferences Website (JACoW), p. 1611-1614 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

extinction
electron beams
membranes
crystals
modulation
2015
1 Citation (Scopus)

Biphasic droplet-based sample delivery of protein crystals for serial femtosecond crystallography with an x-ray free electron laser

Echelmeier, A., Nelson, G., Abdallah, B. G., James, D., Roy-Chowdhury, S., Tolstikova, A., Mariani, V., Kirian, R., Oberthüer, D., Dörner, K., Fromme, P., Chapman, H. N., Weierstall, U., Spence, J. & Ros, A., 2015, MicroTAS 2015 - 19th International Conference on Miniaturized Systems for Chemistry and Life Sciences. Chemical and Biological Microsystems Society, p. 1374-1376 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Crystallography
Free electron lasers
X ray lasers
Proteins
X rays
1 Citation (Scopus)

Image reconstruction in serial femtosecond nanocrystallography using x-ray free-electron lasers

Chen, J. P. J., Kirian, R., Beyerlein, K. R., Bean, R. J., Morgan, A. J., Yefanov, O. M., Arnal, R. D., Wojtas, D. H., Bones, P. J., Chapman, H. N., Spence, J. & Millane, R. P., 2015, Proceedings of SPIE - The International Society for Optical Engineering. SPIE, Vol. 9600. 960002

Research output: Chapter in Book/Report/Conference proceedingConference contribution

X-ray Laser
Free Electron Laser
x ray lasers
Femtosecond
Free electron lasers
2012
5 Citations (Scopus)

Microscopic linear liquid streams in vacuum: Injection of solvated biological samples into X-ray free electron lasers

Doak, R. B., Deponte, D. P., Nelson, G., Camacho-Alanis, F., Ros, A., Spence, J. & Weierstall, U., 2012, AIP Conference Proceedings. 1 ed. Vol. 1501. p. 1314-1323 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

gas dynamics
free electron lasers
free flow
injection
vacuum
2 Citations (Scopus)

Phase retrieval in femtosecond X-ray nanocrystallography

Chen, J. P. J., Spence, J. & Millane, R. P., 2012, ACM International Conference Proceeding Series. p. 43-48 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diffraction
Charge density
X rays
Crystals
X ray crystallography

Phase retrieval in nanocrystallography

Chen, J. P. J., Spence, J. & Millane, R. P., 2012, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 8500. 85000I

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Phase Retrieval
retrieval
Diffraction
Crystal
diffraction
2010
3 Citations (Scopus)

Reconstruction of the electron density of molecules with single-axis alignment

Starodub, D., Spence, J. & Saldin, D. K., 2010, Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7800. 78000O

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Carrier concentration
Diffraction
Alignment
alignment
Molecules
2008
1 Citation (Scopus)

Automated electron nanocrystallography

Spence, J., McKeown, J., He, H. & Wu, J., 2008, Materials Research Society Symposium Proceedings. Vol. 1026. p. 20-29 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

precession
Electron diffraction
electron diffraction
Electrons
Nanocrystals
2006
3 Citations (Scopus)

Analysis of nano-scale stress in strained silicon materials and microelectronics devices by energy-filtered convergent beam electron diffraction

Zhang, P., Istratov, A. A., He, H., Ager, J. W., Nelson, C., Stach, E., Mardinly, J., Kisielowski, C., Weber, E. R. & Spence, J., 2006, ECS Transactions. 2 ed. Vol. 2. p. 559-568 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microelectronics
Electron diffraction
Strain relaxation
Transmission electron microscopy
Strain measurement

A new apparatus for serial crystallography at the Advanced Light Source

Shapiro, D., Bruce Doak, R., Spence, J., Starodub, D., Weierstall, U. & Chapman, H., 2006, Progress in Biomedical Optics and Imaging - Proceedings of SPIE. Vol. 6318. 63180L

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Crystallography
Light sources
Proteins
Synchrotrons
Diffraction patterns
2005

Electron microscopy of the operation of nanoscale devices

Cumings, J., Goldhaber-Gordon, D., Zettl, A., McCartney, M. & Spence, J., 2005, Materials Research Society Symposium Proceedings. Martin, D. C., Muller, D. A., Midgley, P. A. & Stach, E. A. (eds.). Vol. 839. p. 165-176 12 p. P7.1

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanotubes
Electron microscopy
Electron holography
Carbon Nanotubes
Electron microscopes
2004
1 Citation (Scopus)

Coherent diffractive imaging with X-rays and electrons

Spence, J. & Howells, M. R., May 12 2004, Synchrotron Radiation Instrumentation: 8th International Conference on Synchrotron Radiation Instrumentation. American Institute of Physics Inc., Vol. 705. p. 1372-1375 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

field emission
electron microscopes
fusion
recording
illumination

Prospects for single-particle imaging at XFELs

Chapman, H. N., Hau-Riege, S. P., London, R. A., Marchesini, S., Noy, A., Szoke, A., Szoke, H., Ingerman, E., Hajdu, J., Huldt, G., Howells, M. R., He, H., Spence, J. & Weierstall, U., 2004, LEOS Summer Topical Meeting. p. 1-2 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

X ray lasers
Wigglers
Free electron lasers
Synchrotrons
Macromolecules
1 Citation (Scopus)

Tomographic diffractive imaging for nanoscience and biology

Spence, J., 2004, Institute of Physics Conference Series. McVitie, S. & McComb, D. (eds.). Vol. 179. p. 9-16 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

biology
diffraction patterns
aberration
nanotubes
x rays
2003
4 Citations (Scopus)

X-ray microscopy by phase-retrieval methods at the advanced light source

Howells, M. R., Chapman, H., Hau-Riege, S., He, H., Marchesini, S., Spence, J. & Weierstall, U., Mar 2003, Journal De Physique. IV : JP. Susini, J., Joyeux, D. & Polack, F. (eds.). Vol. 104. p. 557-561 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

retrieval
light sources
histories
microscopy
requirements
2002
9 Citations (Scopus)

An off-axis zone-plate monochromator for high-power undulator radiation

Howells, M. R., Charalambous, P., He, H., Marcesini, S. & Spence, J., 2002, Proceedings of SPIE - The International Society for Optical Engineering. Mancini, D. C. (ed.). Vol. 4783. p. 65-73 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Wigglers
Monochromators
monochromators
Radiation
radiation
1996
5 Citations (Scopus)

Dislocation kink motion - ab-initio calculations and atomic resolution movies

Spence, J., Kolar, H. R., Huang, Y. & Alexander, H., 1996, Materials Research Society Symposium - Proceedings. Kaxiras, E., Joannopoulos, J., Vashishta, P. & Kalia, R. K. (eds.). Materials Research Society, Vol. 408. p. 261-270 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Ions
Energy barriers
Charge density
Shearing
1994
1 Citation (Scopus)

Effect of impurities on the ideal tensile strength of covalent crystals - ab-initio quantum molecular dynamics calculations

Huang, Y. M., Spence, J. & Sankey, O. F., 1994, Materials Research Society Symposium - Proceedings. Materials Research Society, Vol. 327. p. 369-374 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Molecular dynamics
Tensile strength
Impurities
Crystals
Doping (additives)
1993
2 Citations (Scopus)

Are HOLZ lines kinematic in off-zone-axis orientations?

Zuo, J. M., Weickenmeier, A. L., Holmestad, R. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 692-693 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kinematics
Diffraction
1 Citation (Scopus)

Brightness measurements of nanometer-sized field-emission tips

Scheinfein, M. R., Qian, W. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 632-633 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Field emission
Luminance
Nanotips
Electrons
Tungsten

Experimental low-voltage-point projection microscopy

Spence, J., Qian, W., Liu, J. & Lo, W., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1060-1061 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanotips
Radiation damage
Ray tracing
Aberrations
Field emission

Location of adatoms on Si(100) surface using the electron channeling effect on Auger electron emission

Qian, W., Spence, J. & Hembree, G. G., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1130-1131 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Adatoms
Electron emission
Atoms
Electrons
Impurities
1 Citation (Scopus)

Measurements of Debye-Waller factors in TiAl from energy-filtered HOLZ line intensities

Holmestad, R., Weickenmeier, A. L., Zuo, J. M., Spence, J. & Horita, Z., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 698-699 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electrolytic polishing
Experiments

Theory of transmission low-energy electron diffraction

Qian, W. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 696-697 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Low energy electron diffraction
Electron microscopes
Diffraction
Crystals
Electrons
1986
11 Citations (Scopus)

COLD ALCHEMI: IMPURITY ATOM SITE LOCATION AND THE TEMPERATURE DEPENDENCE OF DECHANNELLING.

Spence, J., Graham, R. J. & Shindo, D., 1986, Materials Research Society Symposia Proceedings. Pittsburgh, PA, USA: Materials Research Soc, Vol. 62. p. 153-162 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microanalysis
Impurities
Atoms
X ray production
Temperature
1985

ELECTRONIC STRUCTURE OF PARTIAL DISLOCATIONS IN SILICON.

Spence, J. & Chelikowsky, J. R., 1985, Unknown Host Publication Title. Warrendale, PA, USA: Metallurgical Soc of AIME, p. 451 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Metal insulator transition
Dislocations (crystals)
Band structure
Electronic structure
Paramagnetic resonance
1984
4 Citations (Scopus)

X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE.

Fathy, D., Krivanek, O. L., Spence, J. & Paulson, W. M., 1984, Materials Research Society Symposia Proceedings. New York, NY, USA: North-Holland, Vol. 25. p. 557-562 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

microanalysis
gallium
high resolution
metals
x rays
1983
2 Citations (Scopus)

DETERMINATION OF CRYSTAL SITE OCCUPANCY IN AN IMPROVED SYNROC-D CERAMIC USING ANALYTICAL ELECTRON MICROSCOPY.

Tafto, J., Clarke, D. R. & Spence, J., 1983, Materials Research Society Symposia Proceedings. New York, NY, USA: Elsevier Science Publ Co, Vol. 15. p. 9-1 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron microscopy
Crystals
1981

CHARACTERIZATION OF DISLOCATIONS AND INTERFACES IN SEMICONDUCTORS BY HIGH RESOLUTION ELECTRON MICROSCOPY.

Spence, J. & Olsen, A., 1981, Mat Res Soc Symp Proc. p. 279-284 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Dislocations (crystals)
Electron microscopy
Diffraction
Semiconductor materials