• 17516 Citations
  • 64 h-Index
1900 …2022

Research output per year

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Research Output

1983

Surface imaging of III-V semiconductors by reflection electron microscopy and inner potential measurements

Yamamoto, N. & Spence, J., Jun 17 1983, In : Thin Solid Films. 104, 1-2, p. 43-55 13 p.

Research output: Contribution to journalArticle

31 Scopus citations
1982

ATOMIC SITE AND SPECIES DETERMINATION USING THE CHANNELING EFFECT IN ELECTRON DIFFRACTION.

Spence, J. C. H. & Tafto, J., Jan 1 1982, In : Scanning Electron Microscopy. pt 2, p. 523-531 9 p.

Research output: Contribution to journalArticle

19 Scopus citations

Atomic site determination using the channeling effect in electron-induced x-ray emission

Taftø, J. & Spence, J., 1982, In : Ultramicroscopy. 9, 3, p. 243-247 5 p.

Research output: Contribution to journalArticle

53 Scopus citations

Atomic structure of the NiSi2/(111)Si interface

Cherns, D., Anstis, G. R., Hutchison, J. L. & Spence, J., Nov 1982, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 46, 5, p. 849-862 14 p.

Research output: Contribution to journalArticle

196 Scopus citations

Crystal site location of iron and trace elements in a magnesium-iron olivine by a new crystallographic technique

Taftø, J. & Spence, J., Jan 1 1982, In : Science. 218, 4567, p. 49-51 3 p.

Research output: Contribution to journalArticle

73 Scopus citations

Electron energy loss spectroscopy as a probe of the local atomic environment

Krivanek, O. L., Disko, M. M., Taftø, J. & Spence, J., 1982, In : Ultramicroscopy. 9, 3, p. 249-254 6 p.

Research output: Contribution to journalArticle

42 Scopus citations

Stem microanalysis by transmission electron energy loss spectroscopy in crystals

Spence, J. & Lynch, J., 1982, In : Ultramicroscopy. 9, 3, p. 267-276 10 p.

Research output: Contribution to journalArticle

25 Scopus citations
79 Scopus citations
1981

CHARACTERIZATION OF DISLOCATIONS AND INTERFACES IN SEMICONDUCTORS BY HIGH RESOLUTION ELECTRON MICROSCOPY.

Spence, J. C. H. & Olsen, A., Dec 1 1981, Mat Res Soc Symp Proc. p. 279-284 6 p. (Mat Res Soc Symp Proc).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Convergent beam electron microdiffraction from small crystals

Cowley, J. M. & Spence, J., 1981, In : Ultramicroscopy. 6, 1, p. 359-366 8 p.

Research output: Contribution to journalArticle

41 Scopus citations
95 Scopus citations

Electronic structure of the unreconstructed 30°partial dislocation in silicon

Northrup, J. E., Cohen, M. L., Chelikowsky, J. R., Spence, J. & Olsen, A., Jan 1 1981, In : Physical Review B. 24, 8, p. 4623-4628 6 p.

Research output: Contribution to journalArticle

39 Scopus citations

RESOLUTION AND ILLUMINATION COHERENCE IN ELECTRON MICROSCOPY.

Humphreys, C. J. & Spence, J. C. H., Jan 1 1981, In : Optik (Jena). 58, 2, p. 125-142 18 p.

Research output: Contribution to journalArticle

18 Scopus citations
4 Scopus citations
1980

A real‐time optical image projection system for electron microscopy

Spence, J. & Bleha, W. P., Nov 1980, In : Journal of Microscopy. 120, 2, p. 121-128 8 p.

Research output: Contribution to journalArticle

2 Scopus citations

Gliding dissociated dislocations in CdS

Cockayne, D. J. H., Hons, A. & Spence, J., 1980, In : Micron (1969). 11, 3-4, p. 299-300 2 p.

Research output: Contribution to journalArticle

2 Scopus citations

Gliding dissociated dislocations in hexagonal CdS

Cockayne, D. J. H., Hons, A. & Spence, J., Dec 1980, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 42, 6, p. 773-781 9 p.

Research output: Contribution to journalArticle

33 Scopus citations

USE OF CHARACTERISTIC LOSS ENERGY SELECTED ELECTRON DIFFRACTION PATTERNS FOR SITE SYMMETRY DETERMINATION.

Spence, J. C. H., Jan 1 1980, In : Optik (Jena). 57, 3, p. 451-456 6 p.

Research output: Contribution to journalArticle

10 Scopus citations
3 Scopus citations
1979

INNOVATIVE IMAGING AND MICRODIFFRACTION IN STEM.

Cowley, J. M. & Spence, J. C. H., Jan 1 1979, In : Ultramicroscopy. 2, 9, p. 433-438 6 p.

Research output: Contribution to journalArticle

13 Scopus citations
32 Scopus citations

The effect of lens aberrations on lattice images of spinodally decomposed alloys

Spence, J., Cowley, J. M. & Gronsky, R., 1979, In : Ultramicroscopy. 4, 4, p. 429-433 5 p.

Research output: Contribution to journalArticle

22 Scopus citations

Uniqueness and the inversion problem of incoherent multiple scattering

Spence, J., 1979, In : Ultramicroscopy. 4, 1, p. 9-12 4 p.

Research output: Contribution to journalArticle

29 Scopus citations
1978
49 Scopus citations

Innovative imaging and microdiffraction in stem

Cowley, J. M. & Spence, J., 1978, In : Ultramicroscopy. 3, C, p. 433-438 6 p.

Research output: Contribution to journalArticle

43 Scopus citations

LATTICE IMAGING IN STEM.

Spence, J. C. H. & Cowley, J. M., Jan 1 1978, In : Optik (Jena). 50, 2, p. 129-142 14 p.

Research output: Contribution to journalArticle

115 Scopus citations
23 Scopus citations

PRACTICAL PHASE DETERMINATION OF INNER DYNAMICAL REFLECTIONS IN STEM.

Spence, J. C. H., Jan 1 1978, In : [No source information available]. v, 1, p. 61-68 8 p.

Research output: Contribution to journalConference article

7 Scopus citations
1977

HIGH RESOLUTION IMAGE INTERPRETATION IN CRYSTALLINE GERMANIUM.

Spence, J. C. H., O'Keefe, M. A. & Kolar, H., Jan 1 1977, In : Optik (Jena). 49, 3, p. 307-323 17 p.

Research output: Contribution to journalArticle

41 Scopus citations

PHASE DETERMINATION OF MULTIPLY SCATTERED BEAMS IN STEM.

Spence, J. C. H., Jan 1 1977, In : Optik (Jena). 49, 1, p. 117-120 4 p.

Research output: Contribution to journalArticle

5 Scopus citations
1976

SINGLE ATOM CONTRAST.

Spence, J., 1976, Unknown Host Publication Title. New York, NY: Academic Press, Inc, p. 257-260 4 p.

Research output: Chapter in Book/Report/Conference proceedingChapter

2 Scopus citations
1974

Complex image determination in electron microscopy

Spence, J. C., Oct 1974, In : OPTICA ACTA. 21, 10, p. 835-837 3 p.

Research output: Contribution to journalArticle

3 Scopus citations

Determination of the single-scattering probability distribution from plural-scattering data

Johnson, D. W. & Spence, J. C. H., Dec 1 1974, In : Journal of Physics D: Applied Physics. 7, 6, p. 771-780 10 p., 304.

Research output: Contribution to journalArticle

103 Scopus citations
1971

Observation of double-plasmon excitation in aluminum

Spence, J. C. H. & Spargo, A. E. C., Jan 1 1971, In : Physical Review Letters. 26, 15, p. 895-897 3 p.

Research output: Contribution to journalArticle

25 Scopus citations
1970

Plasmon mean free path in aluminium

Spence, J. C. H. & Spargo, A. E. C., Oct 5 1970, In : Physics Letters A. 33, 2, p. 116-117 2 p.

Research output: Contribution to journalArticle

3 Scopus citations
1900

Atomic Focusers in Electron Microscopy

Spence, J., Jan 1 1900

Research output: Patent