• 17516 Citations
  • 64 h-Index
1900 …2022

Research output per year

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Research Output

1992

Transmission-electron Fourier imaging of crystal lattices using low-voltage field-emission sources: Theory

Spence, J. & Qian, W., 1992, In : Physical Review B. 45, 18, p. 10271-10279 9 p.

Research output: Contribution to journalArticle

25 Scopus citations
1991

Automated structure factor refinement from convergent-beam patterns

Zuo, J. M. & Spence, J., 1991, In : Ultramicroscopy. 35, 3-4, p. 185-196 12 p.

Research output: Contribution to journalArticle

104 Scopus citations

Fine structure in coherent bremsstrahlung spectra

Spence, J. & Lund, M., 1991, In : Physical Review B. 44, 13, p. 7054-7057 4 p.

Research output: Contribution to journalArticle

4 Scopus citations
5 Scopus citations
6 Scopus citations

Quantitative electron crystallography with omega energy filtering

Spence, J., Mayer, J. & Zuo, J. M., 1991, In : Micron and Microscopica Acta. 22, 1-2, p. 173-174 2 p.

Research output: Contribution to journalArticle

2 Scopus citations
22 Scopus citations
1990

Charge ordering in magnetite at low temperatures

Zuo, J. M., Spence, J. & Petuskey, W., 1990, In : Physical Review B. 42, 13, p. 8451-8464 14 p.

Research output: Contribution to journalArticle

115 Scopus citations

Magnetic constrast in reflection electron microscopy

Wang, Z. L. & Spence, J., Aug 1 1990, In : Surface Science. 234, 1-2, p. 98-107 10 p.

Research output: Contribution to journalArticle

4 Scopus citations

Observation of the graphite surface by reflection electron microscopy during STM operation

Spence, J., Lo, W. & Kuwabara, M., 1990, In : Ultramicroscopy. 33, 2, p. 69-82 14 p.

Research output: Contribution to journalArticle

26 Scopus citations

On differentiation of the scattering matrix in dynamical transmission electron diffraction

Speer, S., Spence, J. & Ihrig, E., 1990, In : Acta Crystallographica Section A: Foundations of Crystallography. 46, 9, p. 763-772 10 p.

Research output: Contribution to journalArticle

9 Scopus citations
1989

FORTRAN source listing for simulating three-dimensional convergent beam patterns with absorption by the Bloch wave method.

Zuo, J. M., Gjonnes, K. & Spence, J., May 1989, In : Journal of Electron Microscopy Technique. 12, 1, p. 29-55 27 p.

Research output: Contribution to journalArticle

32 Scopus citations

On the atomic structure of the Nb/Al2O3 interface and the growth of Al2O3 particles

Kuwabara, M., Spence, J. & Ruhle, M., Jul 1989, In : Journal of Materials Research. 4, 4, p. 972-977 6 p.

Research output: Contribution to journalArticle

36 Scopus citations

On the Holz contribution to stem lattice images formed using high-angle dark-field detectors

Spence, J., Zuo, J. M. & Lynch, J., 1989, In : Ultramicroscopy. 31, 2, p. 233-240 8 p.

Research output: Contribution to journalArticle

24 Scopus citations

Reflection electron microscope imaging of an operating scanning tunneling microscope

Kuwabara, M., Lo, W. & Spence, J., 1989, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 7, 4, p. 2745-2751 7 p.

Research output: Contribution to journalArticle

22 Scopus citations

Spence, zuo and hoier reply

Spence, J., Zuo, J. M. & Hoier, R., 1989, In : Physical Review Letters. 63, 10, p. 1119 1 p.

Research output: Contribution to journalArticle

1 Scopus citations

Surface imaging techniques and magnetic materials

Spence, J., 1989, In : Materials Science and Engineering B. 3, 4, p. 421-425 5 p.

Research output: Contribution to journalArticle

2 Scopus citations

Zuo, Spence, and OKeeffe reply [2]

Zuo, J. M., Spence, J. & Okeeffe, M., 1989, In : Physical Review Letters. 62, 19, p. 2329 1 p.

Research output: Contribution to journalArticle

4 Scopus citations
1988
28 Scopus citations

Bonding in GaAs

Zuo, J. M., Spence, J. & O'Keeffe, M., 1988, In : Physical Review Letters. 61, 3, p. 353-356 4 p.

Research output: Contribution to journalArticle

111 Scopus citations

Determination of structure factor phase invariants from non-systematic many-beam effects in convergent-beam patterns

Høier, R., Zuo, J. M., Marthinsen, K. & Spence, J., 1988, In : Ultramicroscopy. 26, 1-2, p. 25-30 6 p.

Research output: Contribution to journalArticle

17 Scopus citations

Kink mechanism for formation of the Si(111)-(2×1) reconstructed surface

Spence, J., 1988, In : Physical Review B. 38, 17, p. 12672-12674 3 p.

Research output: Contribution to journalArticle

4 Scopus citations

Large dynamic range, parallel detection system for electron diffraction and imaging

Spence, J. & Zuo, J. M., 1988, In : Review of Scientific Instruments. 59, 9, p. 2102-2105 4 p.

Research output: Contribution to journalArticle

54 Scopus citations

Structural characterization of Ba2YCu3O7 by high resolution transmission electron microscopy.

Ourmazd, A., Spence, J., Zuo, J. M. & Li, C. H., Mar 1988, In : Journal of Electron Microscopy Technique. 8, 3, p. 251-262 12 p.

Research output: Contribution to journalArticle

11 Scopus citations
12 Scopus citations
1987

Comment on Submicrocrystallites and orientational proximity effect

Fan, G. Y., Cowley, J. M. & Spence, J., 1987, In : Physical Review Letters. 58, 3, p. 282 1 p.

Research output: Contribution to journalArticle

8 Scopus citations

Electron microdiffraction studies of new SiO2 precipitates in silicon

Kim, Y., Spence, J., Long, N., Bergholz, W. & O'Keeffe, M., 1987, In : Journal of Applied Physics. 62, 2, p. 419-422 4 p.

Research output: Contribution to journalArticle

MICROSTRUCTURE, OXYGEN ORDERING AND PLANAR DEFECTS IN THE HIGH-T//c SUPERCONDUCTOR YBa//2Cu//3O//6//. //9.

Ourmazd, A., Rentschler, J. A., Spence, J., O'Keeffe, M., Graham, R. J., Johnson, D. W. & Rhodes, W. W., Jan 1 1987, In : Nature. 327, 6120, p. 308-310 3 p.

Research output: Contribution to journalArticle

116 Scopus citations
1986

COLD ALCHEMI: IMPURITY ATOM SITE LOCATION AND THE TEMPERATURE DEPENDENCE OF DECHANNELLING.

Spence, J., Graham, R. J. & Shindo, D., 1986, Materials Research Society Symposia Proceedings. Pittsburgh, PA, USA: Materials Research Soc, Vol. 62. p. 153-162 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

Electron-energy-loss near-edge structure of Be2C

Disko, M. M., Spence, J., Sankey, O. F. & Saldin, D., 1986, In : Physical Review B. 33, 8, p. 5642-5651 10 p.

Research output: Contribution to journalArticle

34 Scopus citations

FORBIDDEN-REFLECTION LATTICE IMAGING FOR THE DETERMINATION OF KINK DENSITIES ON PARTIAL DISLOCATIONS.

Alexander, H., Spence, J., Shindo, D., Gottschalk, H. & Long, N., May 1986, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 53, 5 pt 1, p. 627-643 17 p.

Research output: Contribution to journalArticle

45 Scopus citations

Pendellösung radiation and coherent Bremsstrahlung

Spence, J. & Reese, G., 1986, In : Acta Crystallographica Section A: Foundations of Crystallography. 42, 6, p. 577-585 9 p.

Research output: Contribution to journalArticle

14 Scopus citations

TRANSMISSION ELECTRON MICROSCOPY CATHODOLUMINESCENCE INVESTIGATION OF ANOMALOUS SN DIFFUSION IN GAAS.

Graham, R. J., Spence, J. & Roedel, R. J., Jan 1 1986, In : Journal of Applied Physics. 59, 1, p. 164-167 4 p.

Research output: Contribution to journalArticle

1985

The structural sensitivity of electron energy-loss near-edge structure (ELNES)

Spence, J., 1985, In : Ultramicroscopy. 18, 1-4, p. 165-172 8 p.

Research output: Contribution to journalArticle

10 Scopus citations
1984

Applications of modern microdiffraction to materials science

Carpenter, R. & Spence, J., 1984, In : Journal of Microscopy. 136, 2, p. 165-178 14 p.

Research output: Contribution to journalArticle

10 Scopus citations
129 Scopus citations

CHANNELLING RADIATION IN ELECTRON MICROSCOPY.

Spence, J. & Humphreys, C. J., Feb 1984, In : Optik (Jena). 66, 3, p. 225-242 18 p.

Research output: Contribution to journalArticle

7 Scopus citations
26 Scopus citations

Line defects in silicon: The 90°partial dislocation

Chelikowsky, J. R. & Spence, J., 1984, In : Physical Review B. 30, 2, p. 694-701 8 p.

Research output: Contribution to journalArticle

49 Scopus citations

X-RAY MICROANALYSIS AND HIGH RESOLUTION IMAGING OF Ge-Au-Ni METAL LAYERS ON GALLIUM ARSENIDE.

Fathy, D., Krivanek, O. L., Spence, J. & Paulson, W. M., 1984, Materials Research Society Symposia Proceedings. New York, NY, USA: North-Holland, Vol. 25. p. 557-562 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
1983

ALCHEMI: a new technique for locating atoms in small crystals

Spence, J. & Taftø, J., 1983, In : Journal of Microscopy. 130, 2, p. 147-154 8 p.

Research output: Contribution to journalArticle

252 Scopus citations

CRYSTAL SITE LOCATION OF DOPANTS IN SEMICONDUCTORS USING A 100-keV ELECTRON PROBE.

Tafto, J. & Spence, J., Sep 1983, In : Journal of Applied Physics. 54, 9, p. 5014-5015 2 p.

Research output: Contribution to journalArticle

5 Scopus citations

DETERMINATION OF CRYSTAL SITE OCCUPANCY IN AN IMPROVED SYNROC-D CERAMIC USING ANALYTICAL ELECTRON MICROSCOPY.

Tafto, J., Clarke, D. R. & Spence, J., 1983, Materials Research Society Symposia Proceedings. New York, NY, USA: Elsevier Science Publ Co, Vol. 15. p. 9-1 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
38 Scopus citations