• 17516 Citations
  • 64 h-Index
1900 …2022

Research output per year

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Research Output

1998

Crystal structure determination by direct inversion of dynamical microdiffraction patterns

Spence, J., 1998, In : Journal of Microscopy. 190, 1-2, p. 214-221 8 p.

Research output: Contribution to journalArticle

2 Scopus citations
51 Scopus citations

Reflection shadow imaging of crystal surface by low-voltage point- reflection electron microscopy

Zhang, X., Weierstall, U. & Spence, J., Apr 1 1998, In : Ultramicroscopy. 72, 1-2, p. 67-81 15 p.

Research output: Contribution to journalArticle

6 Scopus citations
1997

Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Morniroli, J. P., Cordier, P., Van Cappellen, É., Zuo, J. M. & Spence, J., 1997, In : Microscopy Microanalysis Microstructures. 8, 3, p. 187-202 16 p.

Research output: Contribution to journalArticle

4 Scopus citations

Charge density of MgO: Implications of precise new measurements for theory

Zuo, J. M., Rez, P., Spence, J. & Spence, J. C. H., 1997, In : Physical Review Letters. 78, 25, p. 4777-4780 4 p.

Research output: Contribution to journalArticle

84 Scopus citations

Does electron holography energy-filter?

Spence, J. & Zuo, J. M., Oct 1 1997, In : Ultramicroscopy. 69, 3, p. 185-190 6 p.

Research output: Contribution to journalArticle

8 Scopus citations

Stem and shadow-imaging of biomolecules at 6 eV beam energy

Spence, J., Apr 1997, In : Micron. 28, 2, p. 101-116 16 p.

Research output: Contribution to journalArticle

17 Scopus citations

TEM imaging of dislocation kinks, their motion and pinning

Spence, J., Kolar, H. R. & Alexander, H., 1997, In : Journal de Physique III. 7, 12, p. 2325-2338 14 p.

Research output: Contribution to journalArticle

7 Scopus citations
1996
27 Scopus citations

Dislocation kink motion - ab-initio calculations and atomic resolution movies

Spence, J., Kolar, H. R., Huang, Y. & Alexander, H., 1996, Materials Research Society Symposium - Proceedings. Kaxiras, E., Joannopoulos, J., Vashishta, P. & Kalia, R. K. (eds.). Materials Research Society, Vol. 408. p. 261-270 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations

Observation of moving dislocation kinks and unpinning

Kolar, H. R., Spence, J. & Alexander, H., 1996, In : Physical Review Letters. 77, 19, p. 4031-4034 4 p.

Research output: Contribution to journalArticle

120 Scopus citations

Performance of imaging plates for electron recording

Zuo, J. M., McCartney, M. & Spence, J., Nov 1996, In : Ultramicroscopy. 66, 1-2, p. 35-47 13 p.

Research output: Contribution to journalArticle

38 Scopus citations

Quantitative electron microdiffraction

Spence, J., 1996, In : Journal of Electron Microscopy. 45, 1, p. 19-26 8 p.

Research output: Contribution to journalArticle

4 Scopus citations
1995

Dislocation kink motion in silicon

Huang, Y. M., Spence, J. & Sankey, O. F., 1995, In : Physical Review Letters. 74, 17, p. 3392-3395 4 p.

Research output: Contribution to journalArticle

60 Scopus citations

Dynamics of vortices in superconductors observed by electron waves

Tonomura, A., Hawkes, P. W. & Spence, J., 1995, In : Scanning Microscopy. 9, 2, p. 311-320 10 p.

Research output: Contribution to journalArticle

Effect of Mn doping on charge density in γ-TiAl by quantitative convergent beam electron diffraction

Holmestad, R., Zuo, J. M., Spence, J., Hoiert, R. & Horita, Z., 1995, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 72, 3, p. 579-601 23 p.

Research output: Contribution to journalArticle

47 Scopus citations
1994

Contrast and radiation damage in point-projection electron imaging of purple membrane at 100 V

Spence, J., Qian, W. & Zhang, X., 1994, In : Ultramicroscopy. 55, 1, p. 19-23 5 p.

Research output: Contribution to journalArticle

26 Scopus citations
1 Scopus citations
74 Scopus citations
99 Scopus citations
50 Scopus citations
11 Scopus citations

Reflection electron microscopy of buried interfaces in the transmission geometry

Spence, J., 1994, In : Ultramicroscopy. 55, 3, p. 293-301 9 p.

Research output: Contribution to journalArticle

2 Scopus citations

The effect of impurities on the ideal tensile strength of silicon

Huang, Y. M., Spence, J. & Sankey, O. F., 1994, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 70, 1, p. 53-62 10 p.

Research output: Contribution to journalArticle

21 Scopus citations
1993

Aberrations of emission cathodes: Nanometer diameter field-emission electron sources

Scheinfein, M. R., Qian, W. & Spence, J., 1993, In : Journal of Applied Physics. 73, 5, p. 2057-2068 12 p.

Research output: Contribution to journalArticle

37 Scopus citations

Are HOLZ lines kinematic in off-zone-axis orientations?

Zuo, J. M., Weickenmeier, A. L., Holmestad, R. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 692-693 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Brightness measurements of nanometer-sized field-emission-electron sources

Qian, W., Scheinfein, M. R. & Spence, J., 1993, In : Journal of Applied Physics. 73, 11, p. 7041-7045 5 p.

Research output: Contribution to journalArticle

52 Scopus citations

Brightness measurements of nanometer-sized field-emission tips

Scheinfein, M. R., Qian, W. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 632-633 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
21 Scopus citations

Comment on "electron holographic study of ferroelectric domain walls"

Spence, J., Cowley, J. M. & Zuo, J. M., 1993, In : Applied Physics Letters. 62, 19, p. 2446-2447 2 p.

Research output: Contribution to journalArticle

11 Scopus citations

Commercial spectrometer modifications for energy filtering of electron diffraction patterns and images

Holmestad, R., Krivanek, O. L., Høier, R., Marthinsen, K. & Spence, J., 1993, In : Ultramicroscopy. 52, 3-4, p. 454-458 5 p.

Research output: Contribution to journalArticle

5 Scopus citations
11 Scopus citations

Experimental low-voltage-point projection microscopy

Spence, J., Qian, W., Liu, J. & Lo, W., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1060-1061 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

33 Scopus citations

Investigation of STM image artifacts by in-situ reflection electron microscopy

Lo, W. K. & Spence, J., 1993, In : Ultramicroscopy. 48, 4, p. 433-444 12 p.

Research output: Contribution to journalArticle

25 Scopus citations

Lattice trapping and surface reconstruction for silicon cleavage on (111). Ab-initio quantum molecular dynamics calculations

Spence, J., Huang, Y. M. & Sankey, O., 1993, In : Acta Metallurgica et Materialia. 41, 10, p. 2815-2824 10 p.

Research output: Contribution to journalArticle

71 Scopus citations

Location of adatoms on Si(100) surface using the electron channeling effect on Auger electron emission

Qian, W., Spence, J. & Hembree, G. G., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1130-1131 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Scopus citations
129 Scopus citations

Theory of transmission low-energy electron diffraction

Qian, W. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 696-697 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

17 Scopus citations
1992

Channelling effects on oxygen-characteristic X-ray emission and their use as reference sites for ALCHEMI

Qian, W., Tötdal, B., Hoier, R. & Spence, J., 1992, In : Ultramicroscopy. 41, 1-3, p. 147-151 5 p.

Research output: Contribution to journalArticle

9 Scopus citations

Comment on eeAtomic resolution in lensless low-energy electron holographyee

Spence, J., Zuo, J. M. & Qian, W., 1992, In : Physical Review Letters. 68, 21, p. 3256 1 p.

Research output: Contribution to journalArticle

1 Scopus citations

Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy

Batson, P. E., Johnson, D. W. & Spence, J., 1992, In : Ultramicroscopy. 41, 1-3, p. 137-145 9 p.

Research output: Contribution to journalArticle

38 Scopus citations