• 17516 Citations
  • 64 h-Index
1900 …2022

Research output per year

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Research Output

Article

3D nanocrystal images at atomic resolution from diffraction data using iterative algorithms

Wu, J. S. & Spence, J., Sep 4 2003, In : Microscopy and Microanalysis. 9, SUPPL. 2, p. 1184-1185 2 p.

Research output: Contribution to journalArticle

7 Å resolution in protein twodimensional-crystal X-ray diffraction at Linac Coherent Light Source

Pedrini, B., Tsai, C. J., Capitani, G., Padeste, C., Hunter, M. S., Zatsepin, N., Barty, A., Henry Benner, W., Boutet, S., Feld, G. K., Hau-Riege, S. P., Kirian, R., Kupitz, C., Messerschmitt, M., Ogren, J. I., Pardini, T., Segelke, B., Williams, G. J., Spence, J., Abela, R. & 5 others, Coleman, M., Evans, J. E., Schertler, G. F. X., Frank, M. & Li, X. D., Jul 17 2014, In : Philosophical Transactions of the Royal Society B: Biological Sciences. 369, 1647, 20130500.

Research output: Contribution to journalArticle

29 Scopus citations

Aberration-free imaging by coherent diffractive imaging

Wu, J. S., Spence, J. & Weierstall, U., Aug 1 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 1464-1465 2 p.

Research output: Contribution to journalArticle

Aberrations of emission cathodes: Nanometer diameter field-emission electron sources

Scheinfein, M. R., Qian, W. & Spence, J., Dec 1 1993, In : Journal of Applied Physics. 73, 5, p. 2057-2068 12 p.

Research output: Contribution to journalArticle

37 Scopus citations

Ab-initio LDA calculations of the mean Coulomb potential V0 in slabs of crystalline Si, Ge and MgO

Kim, M. Y., Zuo, J. M. & Spence, J., Jan 1 1998, In : Physica Status Solidi (A) Applied Research. 166, 1, p. 445-451 7 p.

Research output: Contribution to journalArticle

26 Scopus citations

Ab initio phasing of X-ray powder diffraction patterns by charge flipping

Wu, J., Leinenweber, K., Spence, J. & O'Keeffe, M., Aug 21 2006, In : Nature materials. 5, 8, p. 647-652 6 p.

Research output: Contribution to journalArticle

61 Scopus citations

Ab-initio phasing using nanocrystal shape transforms with incomplete unit cells

Liu, H., Zatsepin, N. & Spence, J., Jan 1 2014, In : IUCrJ. 1, p. 19-27 9 p.

Research output: Contribution to journalArticle

14 Scopus citations

Accurate structure-factor phase determination by electron diffraction in noncentrosymmetric crystals

Zuo, J. M., Spence, J. & Hoier, R., Jan 1 1989, In : Physical Review Letters. 62, 5, p. 547-550 4 p.

Research output: Contribution to journalArticle

51 Scopus citations

A coherent photofield electron source for fast diffractive and point-projection imaging

Spence, J., Vecchione, T. & Weierstall, U., Dec 14 2010, In : Philosophical Magazine. 90, 35-36, p. 4691-4702 12 p.

Research output: Contribution to journalArticle

10 Scopus citations

ALCHEMI: a new technique for locating atoms in small crystals

Spence, J. & Taftø, J., 1983, In : Journal of Microscopy. 130, 2, p. 147-154 8 p.

Research output: Contribution to journalArticle

252 Scopus citations

Analysis of nano-scale strain near shallow trench isolation structures by energy-filtered convergent beam electron diffraction

Zhang, P., Mardinly, J., Karpenko, O., Istratov, A., He, H., Ager, J., Nelson, C., Stach, E., Kisielowski, C., Weber, E. & Spence, J., Aug 1 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 938-939 2 p.

Research output: Contribution to journalArticle

An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

Howells, M. R., Beetz, T., Chapman, H. N., Cui, C., Holton, J. M., Jacobsen, C. J., Kirz, J., Lima, E., Marchesini, S., Miao, H., Sayre, D., Shapiro, D. A., Spence, J. & Starodub, D., Mar 1 2009, In : Journal of Electron Spectroscopy and Related Phenomena. 170, 1-3, p. 4-12 9 p.

Research output: Contribution to journalArticle

295 Scopus citations

Anisotropic excitons in (formula presented) from orientation-dependent electron-energy-loss spectroscopy

Jiang, N., Jiang, B., Spence, J., Yu, R. C., Li, S. C. & Jin, C. Q., Jan 1 2002, In : Physical Review B - Condensed Matter and Materials Physics. 66, 17, p. 1-4 4 p.

Research output: Contribution to journalArticle

Anisotropic excitons in MgB2 from orientation-dependent electron-energy-loss spectroscopy

Jiang, N., Jiang, B., Spence, J., Yu, R. C., Li, S. C. & Jin, C. Q., Nov 1 2002, In : Physical Review B - Condensed Matter and Materials Physics. 66, 17, p. 1725021-1725024 4 p., 172502.

Research output: Contribution to journalArticle

19 Scopus citations

A novel inert crystal delivery medium for serial femtosecond crystallography

Conrad, C. E., Basu, S., James, D., Wang, D., Schaffer, A., Roy-Chowdhury, S., Zatsepin, N., Aquila, A., Coe, J., Gati, C., Hunter, M. S., Koglin, J. E., Kupitz, C., Nelson, G., Subramanian, G., White, T. A., Zhao, Y., Zook, J., Boutet, S., Cherezov, V. & 4 others, Spence, J., Fromme, R., Weierstall, U. & Fromme, P., Jul 1 2015, In : IUCrJ. 2, p. 421-430 10 p.

Research output: Contribution to journalArticle

69 Scopus citations

Application of a modified Oszlányi and Süto ab initio charge-flipping algorithm to experimental data

Wu, J. S., Spence, J., O'Keeffe, M. & Groy, T. L., Jul 1 2004, In : Acta Crystallographica Section A: Foundations of Crystallography. 60, 4, p. 326-330 5 p.

Research output: Contribution to journalArticle

15 Scopus citations

Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Morniroli, J. P., Cordier, P., Van Cappellen, É., Zuo, J. M. & Spence, J., Jan 1 1997, In : Microscopy Microanalysis Microstructures. 8, 3, p. 187-202 16 p.

Research output: Contribution to journalArticle

Open Access
4 Scopus citations

Applications of modern microdiffraction to materials science

Carpenter, R. & Spence, J., 1984, In : Journal of Microscopy. 136, 2, p. 165-178 14 p.

Research output: Contribution to journalArticle

10 Scopus citations

Approaches to time-resolved diffraction using an XFEL

Spence, J., Dec 1 2014, In : Faraday Discussions. 171, p. 429-438 10 p.

Research output: Contribution to journalArticle

15 Scopus citations
49 Scopus citations

A Quantitative Nanodiffraction System for Ultrahigh Vacuum Scanning Transmission Electron Microscopy

Hembree, G. G., Koch, C. & Spence, J., Oct 1 2003, In : Microscopy and Microanalysis. 9, 5, p. 468-474 7 p.

Research output: Contribution to journalArticle

1 Scopus citations

A real‐time optical image projection system for electron microscopy

Spence, J. & Bleha, W. P., Nov 1980, In : Journal of Microscopy. 120, 2, p. 121-128 8 p.

Research output: Contribution to journalArticle

2 Scopus citations
28 Scopus citations

ATOMIC SITE AND SPECIES DETERMINATION USING THE CHANNELING EFFECT IN ELECTRON DIFFRACTION.

Spence, J. C. H. & Tafto, J., Jan 1 1982, In : Scanning Electron Microscopy. pt 2, p. 523-531 9 p.

Research output: Contribution to journalArticle

19 Scopus citations

Atomic site determination using the channeling effect in electron-induced x-ray emission

Taftø, J. & Spence, J., 1982, In : Ultramicroscopy. 9, 3, p. 243-247 5 p.

Research output: Contribution to journalArticle

53 Scopus citations
27 Scopus citations

Atomic species identification in STM using an imaging atom-probe technique

Weierstall, U. & Spence, J., Jan 1 1998, In : Surface Science. 398, 1-2, p. 267-279 13 p.

Research output: Contribution to journalArticle

9 Scopus citations

Atomic string holography

Spence, J. & Koch, C., Jun 11 2001, In : Physical Review Letters. 86, 24, p. 5510-5513 4 p.

Research output: Contribution to journalArticle

8 Scopus citations

Atomic structure of granulin determined from native nanocrystalline granulovirus using an X-ray free-electron laser

Gati, C., Oberthuer, D., Yefanov, O., Bunker, R. D., Stellato, F., Chiu, E., Yeh, S. M., Aquila, A., Basu, S., Bean, R., Beyerlein, K. R., Botha, S., Boutet, S., DePonte, D. P., Doak, R. B., Fromme, R., Galli, L., Grotjohann, I., James, D. R., Kupitz, C. & 17 others, Lomb, L., Messerschmidt, M., Nass, K., Rendek, K., Shoeman, R. L., Wang, D., Weierstall, U., White, T. A., Williams, G. J., Zatsepin, N., Fromme, P., Spence, J., Goldie, K. N., Jehle, J. A., Metcalf, P., Barty, A. & Chapman, H. N., Feb 28 2017, In : Proceedings of the National Academy of Sciences of the United States of America. 114, 9, p. 2247-2252 6 p.

Research output: Contribution to journalArticle

31 Scopus citations

Atomic structure of the NiSi2/(111)Si interface

Cherns, D., Anstis, G. R., Hutchison, J. L. & Spence, J., Nov 1982, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 46, 5, p. 849-862 14 p.

Research output: Contribution to journalArticle

196 Scopus citations

A useful expansion of the exponential of the sum of two non-commuting matrices, one of which is diagonal

Koch, C. T. & Spence, J., Jan 24 2003, In : Journal of Physics A: Mathematical and General. 36, 3, p. 803-816 14 p.

Research output: Contribution to journalArticle

14 Scopus citations

Automated structure factor refinement from convergent-beam patterns

Zuo, J. M. & Spence, J., Jun 1991, In : Ultramicroscopy. 35, 3-4, p. 185-196 12 p.

Research output: Contribution to journalArticle

104 Scopus citations

Automatic recovery of missing amplitudes and phases in tilt-limited electron crystallography of two-dimensional crystals

Gipson, B. R., Masiel, D. J., Browning, N. D., Spence, J., Mitsuoka, K. & Stahlberg, H., Jul 22 2011, In : Physical Review E - Statistical, Nonlinear, and Soft Matter Physics. 84, 1, 011916.

Research output: Contribution to journalArticle

18 Scopus citations

Background intensity problems in high resolution defect imaging

Howie, A., Jiang, N., Spence, J. & Wu, J., Aug 1 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 900-901 2 p.

Research output: Contribution to journalArticle

Beyond small-angle x-ray scattering: Exploiting angular correlations

Saldin, D. K., Poon, H. C., Shneerson, V. L., Howells, M., Chapman, H. N., Kirian, R., Schmidt, K. & Spence, J., May 7 2010, In : Physical Review B - Condensed Matter and Materials Physics. 81, 17, 174105.

Research output: Contribution to journalArticle

47 Scopus citations

Bonding in GaAs

Zuo, J. M., Spence, J. & O'Keeffe, M., Jan 1 1988, In : Physical Review Letters. 61, 3, p. 353-356 4 p.

Research output: Contribution to journalArticle

111 Scopus citations

Brightness measurements of nanometer-sized field-emission-electron sources

Qian, W., Scheinfein, M. R. & Spence, J., Dec 1 1993, In : Journal of Applied Physics. 73, 11, p. 7041-7045 5 p.

Research output: Contribution to journalArticle

52 Scopus citations

Can electron energy-loss spectroscopy measure the local structure of germanate glasses?

Jiang, N. & Spence, J., Aug 1 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 1152-1153 2 p.

Research output: Contribution to journalArticle

Can near-edge structure of the Bi L3 edge determine the formal valence states of Bi?

Jiang, N. & Spence, J., Aug 30 2006, In : Journal of Physics Condensed Matter. 18, 34, p. 8029-8036 8 p., 014.

Research output: Contribution to journalArticle

29 Scopus citations

Casimir torque between birefringent plates with metamaterials

Chen, X. & Spence, J., Sep 1 2013, In : Physica Status Solidi (A) Applications and Materials Science. 210, 9, p. 1925-1932 8 p.

Research output: Contribution to journalArticle

4 Scopus citations
129 Scopus citations

Channelling effects on oxygen-characteristic X-ray emission and their use as reference sites for ALCHEMI

Qian, W., Tötdal, B., Hoier, R. & Spence, J., Jan 1 1992, In : Ultramicroscopy. 41, 1-3, p. 147-151 5 p.

Research output: Contribution to journalArticle

9 Scopus citations

CHANNELLING RADIATION IN ELECTRON MICROSCOPY.

Spence, J. C. H. & Humphreys, C. J., Jan 1 1984, In : Optik (Jena). 66, 3, p. 225-242 18 p.

Research output: Contribution to journalArticle

7 Scopus citations

Charge density and chemical bonding in rutile, TiO2

Jiang, B., Zuo, J. M., Jiang, N., O'Keeffe, M. & Spence, J., Jul 1 2003, In : Acta Crystallographica Section A: Foundations of Crystallography. 59, 4, p. 341-350 10 p.

Research output: Contribution to journalArticle

58 Scopus citations

Charge Density of MgO: Implications of Precise New Measurements for Theory

Zuo, J. M., Rez, P., Spence, J. & Spence, J. C. H., Jun 23 1997, In : Physical Review Letters. 78, 25, p. 4777-4780 4 p.

Research output: Contribution to journalArticle

84 Scopus citations

Charge ordering in magnetite at low temperatures

Zuo, J. M., Spence, J. & Petuskey, W., Jan 1 1990, In : Physical Review B. 42, 13, p. 8451-8464 14 p.

Research output: Contribution to journalArticle

115 Scopus citations

Coherence and sampling requirements for diffractive imaging

Spence, J., Weierstall, U. & Howells, M., Nov 1 2004, In : Ultramicroscopy. 101, 2-4, p. 149-152 4 p.

Research output: Contribution to journalArticle

77 Scopus citations
26 Scopus citations
18 Scopus citations

Coherent convergent-beam time-resolved X-ray diffraction

Spence, J., Zatsepin, N. & Li, C., Jul 17 2014, In : Philosophical Transactions of the Royal Society B: Biological Sciences. 369, 1647, 20130325.

Research output: Contribution to journalArticle

11 Scopus citations