• 17516 Citations
  • 64 h-Index
1900 …2022

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output

3D nanocrystal images at atomic resolution from diffraction data using iterative algorithms

Wu, J. S. & Spence, J., 2003, In : Microscopy and Microanalysis. 9, SUPPL. 2, p. 1184-1185 2 p.

Research output: Contribution to journalArticle

50 Years of TEM of dislocations: Past, present and future

Hirsch, P., Cockayne, D., Spence, J. & Whelan, M., Oct 11 2006, In : Philosophical Magazine. 86, 29-31, p. 4519-4528 10 p.

Research output: Contribution to journalArticle

28 Scopus citations

7 Å resolution in protein twodimensional-crystal X-ray diffraction at Linac Coherent Light Source

Pedrini, B., Tsai, C. J., Capitani, G., Padeste, C., Hunter, M. S., Zatsepin, N., Barty, A., Henry Benner, W., Boutet, S., Feld, G. K., Hau-Riege, S. P., Kirian, R., Kupitz, C., Messerschmitt, M., Ogren, J. I., Pardini, T., Segelke, B., Williams, G. J., Spence, J., Abela, R. & 5 others, Coleman, M., Evans, J. E., Schertler, G. F. X., Frank, M. & Li, X. D., Jul 17 2014, In : Philosophical Transactions of the Royal Society B: Biological Sciences. 369, 1647, 20130500.

Research output: Contribution to journalArticle

29 Scopus citations

Aberration-free imaging by coherent diffractive imaging

Wu, J. S., Spence, J. & Weierstall, U., Aug 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 1464-1465 2 p.

Research output: Contribution to journalArticle

Aberrations of emission cathodes: Nanometer diameter field-emission electron sources

Scheinfein, M. R., Qian, W. & Spence, J., 1993, In : Journal of Applied Physics. 73, 5, p. 2057-2068 12 p.

Research output: Contribution to journalArticle

37 Scopus citations

Ab-initio LDA calculations of the mean Coulomb potential V0 in slabs of crystalline Si, Ge and MgO

Kim, M. Y., Zuo, J. M. & Spence, J., 1998, In : Physica Status Solidi (A) Applied Research. 166, 1, p. 445-454 10 p.

Research output: Contribution to journalArticle

26 Scopus citations

Ab-initio phasing using nanocrystal shape transforms with incomplete unit cells

Liu, H., Zatsepin, N. & Spence, J., Jan 1 2014, In : IUCrJ. 1, p. 19-27 9 p.

Research output: Contribution to journalArticle

14 Scopus citations

Absorption spectroscopy with sub-angstrom beams: ELS in STEM

Spence, J., Mar 1 2006, In : Reports on Progress in Physics. 69, 3, p. 725-758 34 p.

Research output: Contribution to journalArticle

36 Scopus citations

Achieving atomic resolution

Spence, J., 2002, In : Materials Today. 5, 3, p. 20-33 14 p.

Research output: Contribution to journalArticle

3 Scopus citations

A coherent photofield electron source for fast diffractive and point-projection imaging

Spence, J., Vecchione, T. & Weierstall, U., Dec 14 2010, In : Philosophical Magazine. 90, 35-36, p. 4691-4702 12 p.

Research output: Contribution to journalArticle

10 Scopus citations

ALCHEMI: a new technique for locating atoms in small crystals

Spence, J. & Taftø, J., 1983, In : Journal of Microscopy. 130, 2, p. 147-154 8 p.

Research output: Contribution to journalArticle

252 Scopus citations

Analysis of nano-scale strain near shallow trench isolation structures by energy-filtered convergent beam electron diffraction

Zhang, P., Mardinly, J., Karpenko, O., Istratov, A., He, H., Ager, J., Nelson, C., Stach, E., Kisielowski, C., Weber, E. & Spence, J., Aug 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 938-939 2 p.

Research output: Contribution to journalArticle

Analysis of nano-scale stress in strained silicon materials and microelectronics devices by energy-filtered convergent beam electron diffraction

Zhang, P., Istratov, A. A., He, H., Ager, J. W., Nelson, C., Stach, E., Mardinly, J., Kisielowski, C., Weber, E. R. & Spence, J., 2006, ECS Transactions. 2 ed. Vol. 2. p. 559-568 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

Howells, M. R., Beetz, T., Chapman, H. N., Cui, C., Holton, J. M., Jacobsen, C. J., Kirz, J., Lima, E., Marchesini, S., Miao, H., Sayre, D., Shapiro, D. A., Spence, J. & Starodub, D., Mar 2009, In : Journal of Electron Spectroscopy and Related Phenomena. 170, 1-3, p. 4-12 9 p.

Research output: Contribution to journalArticle

295 Scopus citations

A new apparatus for serial crystallography at the Advanced Light Source

Shapiro, D., Bruce Doak, R., Spence, J., Starodub, D., Weierstall, U. & Chapman, H., 2006, Progress in Biomedical Optics and Imaging - Proceedings of SPIE. Vol. 6318. 63180L

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Anisotropic excitons in (formula presented) from orientation-dependent electron-energy-loss spectroscopy

Jiang, N., Jiang, B., Spence, J., Yu, R. C., Li, S. C. & Jin, C. Q., Jan 1 2002, In : Physical Review B - Condensed Matter and Materials Physics. 66, 17, p. 1-4 4 p.

Research output: Contribution to journalArticle

19 Scopus citations

An off-axis zone-plate monochromator for high-power undulator radiation

Howells, M. R., Charalambous, P., He, H., Marcesini, S. & Spence, J., 2002, Proceedings of SPIE - The International Society for Optical Engineering. Mancini, D. C. (ed.). Vol. 4783. p. 65-73 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations

A novel inert crystal delivery medium for serial femtosecond crystallography

Conrad, C. E., Basu, S., James, D., Wang, D., Schaffer, A., Roy-Chowdhury, S., Zatsepin, N., Aquila, A., Coe, J., Gati, C., Hunter, M. S., Koglin, J. E., Kupitz, C., Nelson, G., Subramanian, G., White, T. A., Zhao, Y., Zook, J., Boutet, S., Cherezov, V. & 4 others, Spence, J., Fromme, R., Weierstall, U. & Fromme, P., Jul 1 2015, In : IUCrJ. 2, p. 421-430 10 p.

Research output: Contribution to journalArticle

69 Scopus citations

Application of a modified Oszlányi and Süto ab initio charge-flipping algorithm to experimental data

Wu, J. S., Spence, J., O'Keeffe, M. & Groy, T. L., Jul 2004, In : Acta Crystallographica Section A: Foundations of Crystallography. 60, 4, p. 326-330 5 p.

Research output: Contribution to journalArticle

15 Scopus citations

Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

Morniroli, J. P., Cordier, P., Van Cappellen, É., Zuo, J. M. & Spence, J., 1997, In : Microscopy Microanalysis Microstructures. 8, 3, p. 187-202 16 p.

Research output: Contribution to journalArticle

4 Scopus citations

Applications of modern microdiffraction to materials science

Carpenter, R. & Spence, J., 1984, In : Journal of Microscopy. 136, 2, p. 165-178 14 p.

Research output: Contribution to journalArticle

10 Scopus citations
15 Scopus citations

A Quantitative Nanodiffraction System for Ultrahigh Vacuum Scanning Transmission Electron Microscopy

Hembree, G. G., Koch, C. & Spence, J., Oct 2003, In : Microscopy and Microanalysis. 9, 5, p. 468-474 7 p.

Research output: Contribution to journalArticle

1 Scopus citations

Are HOLZ lines kinematic in off-zone-axis orientations?

Zuo, J. M., Weickenmeier, A. L., Holmestad, R. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 692-693 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
28 Scopus citations

Atomic Focusers in Electron Microscopy

Spence, J., Jan 1 1900

Research output: Patent

ATOMIC SITE AND SPECIES DETERMINATION USING THE CHANNELING EFFECT IN ELECTRON DIFFRACTION.

Spence, J. & Tafto, J., 1982, In : Scanning Electron Microscopy. pt 2, p. 523-531 9 p.

Research output: Contribution to journalArticle

19 Scopus citations

Atomic site determination using the channeling effect in electron-induced x-ray emission

Taftø, J. & Spence, J., 1982, In : Ultramicroscopy. 9, 3, p. 243-247 5 p.

Research output: Contribution to journalArticle

53 Scopus citations
27 Scopus citations

Atomic species identification in STM using an imaging atom-probe technique

Weierstall, U. & Spence, J., 1998, In : Surface Science. 398, 1-2, p. 267-279 13 p.

Research output: Contribution to journalArticle

9 Scopus citations

Atomic string holography

Spence, J. & Koch, C., Jun 11 2001, In : Physical Review Letters. 86, 24, p. 5510-5513 4 p.

Research output: Contribution to journalArticle

8 Scopus citations
31 Scopus citations

ATOMIC STRUCTURE OF THE NiSi//2/(111)Si INTERFACE.

Cherns, D., Anstis, G. R., Hutchison, J. L. & Spence, J., Nov 1982, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 46, 5, p. 849-862 14 p.

Research output: Contribution to journalArticle

196 Scopus citations

Atomistics and mechanical properties of silicon

Spence, J., Nov 1999, In : Acta Materialia. 47, 15, p. 4153-4159 7 p.

Research output: Contribution to journalArticle

5 Scopus citations
14 Scopus citations

Automated electron nanocrystallography

Spence, J., McKeown, J., He, H. & Wu, J., 2008, Materials Research Society Symposium Proceedings. Vol. 1026. p. 20-29 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Automated structure factor refinement from convergent-beam patterns

Zuo, J. M. & Spence, J., 1991, In : Ultramicroscopy. 35, 3-4, p. 185-196 12 p.

Research output: Contribution to journalArticle

104 Scopus citations

Automatic recovery of missing amplitudes and phases in tilt-limited electron crystallography of two-dimensional crystals

Gipson, B. R., Masiel, D. J., Browning, N. D., Spence, J., Mitsuoka, K. & Stahlberg, H., Jul 22 2011, In : Physical Review E - Statistical, Nonlinear, and Soft Matter Physics. 84, 1, 011916.

Research output: Contribution to journalArticle

18 Scopus citations

Background intensity problems in high resolution defect imaging

Howie, A., Jiang, N., Spence, J. & Wu, J., Aug 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 900-901 2 p.

Research output: Contribution to journalArticle

Beyond small-angle x-ray scattering: Exploiting angular correlations

Saldin, D. K., Poon, H. C., Shneerson, V. L., Howells, M., Chapman, H. N., Kirian, R., Schmidt, K. & Spence, J., May 7 2010, In : Physical Review B - Condensed Matter and Materials Physics. 81, 17, 174105.

Research output: Contribution to journalArticle

47 Scopus citations

Biphasic droplet-based sample delivery of protein crystals for serial femtosecond crystallography with an x-ray free electron laser

Echelmeier, A., Nelson, G., Abdallah, B. G., James, D., Roy-Chowdhury, S., Tolstikova, A., Mariani, V., Kirian, R., Oberthüer, D., Dörner, K., Fromme, P., Chapman, H. N., Weierstall, U., Spence, J. & Ros, A., 2015, MicroTAS 2015 - 19th International Conference on Miniaturized Systems for Chemistry and Life Sciences. Chemical and Biological Microsystems Society, p. 1374-1376 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
111 Scopus citations

Brightness measurements of nanometer-sized field-emission-electron sources

Qian, W., Scheinfein, M. R. & Spence, J., 1993, In : Journal of Applied Physics. 73, 11, p. 7041-7045 5 p.

Research output: Contribution to journalArticle

52 Scopus citations

Brightness measurements of nanometer-sized field-emission tips

Scheinfein, M. R., Qian, W. & Spence, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 632-633 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations