Engineering & Materials Science
Oxides
100%
Field effect transistors
86%
FinFET
78%
Black Phosphorus
78%
Scattering
78%
Graphene
72%
Drain current
66%
Transport properties
65%
Radiation
62%
Boron nitride
57%
Memristors
57%
Surface potential
55%
Silicon
51%
Monolayers
47%
Cryogenics
43%
Charge carriers
39%
Graphene devices
38%
MOSFET devices
36%
Fermi level
35%
Transistors
35%
Ionizing radiation
34%
Temperature
34%
Electrostatics
32%
Chemical vapor deposition
31%
Oxide semiconductors
30%
Carrier concentration
29%
Charge density
28%
Doping (additives)
27%
Heterojunctions
26%
Metals
25%
Defects
25%
Ballistics
24%
Flip flop circuits
23%
Digital circuits
22%
Gamma rays
22%
Degradation
21%
Carbon nanotubes
21%
Carrier mobility
20%
Crystals
20%
Heavy ions
19%
Diodes
18%
X rays
18%
Networks (circuits)
17%
Dosimetry
17%
Irradiation
17%
Machine learning
15%
Defect density
14%
Linear regression
14%
Poisson equation
14%
Electrons
13%
Physics & Astronomy
field effect transistors
79%
dosage
76%
graphene
54%
oxides
52%
carbon nanotubes
39%
scattering
37%
metal oxide semiconductors
35%
traveling ionospheric disturbances
32%
boron nitrides
32%
insulators
30%
learning
29%
ionizing radiation
29%
single event upsets
29%
programming
28%
digital electronics
27%
defects
26%
traps
26%
machine learning
26%
synapses
25%
radiation dosage
24%
ballistics
24%
CMOS
22%
silicon
22%
layouts
21%
flip-flops
20%
phosphorus
20%
hardware
19%
trapping
19%
radiation
18%
analogs
18%
SOI (semiconductors)
18%
charge carriers
17%
conductors
16%
transport properties
16%
transistors
16%
approximation
16%
breakdown
15%
hysteresis
15%
electrostatics
15%
electric potential
14%
derivation
14%
simulation
14%
fins
12%
electric fields
12%
performance
11%
power efficiency
11%
gamma rays
10%
multiplication
10%
scaling
10%
Chemical Compounds
Interface Trap
58%
Schottky Barrier
56%
Potential Equation
54%
Transport Property
48%
Boron Nitride
46%
Surface Potential
45%
Cryogenics
45%
Drain Current
44%
Compound Mobility
39%
Black
36%
Phosphorus(.)
34%
Hexagonal Space Group
32%
Field Effect
32%
Monolayer
30%
Oxide
27%
Ionizing Radiation
25%
Fermi Level
23%
Voltage
21%
Reduction
20%
Simulation
19%
Carbon Nanotube
14%
Electrostatic Potential
14%
Flake Like Crystal
13%
Resistance
12%
Ambient Reaction Temperature
11%
Thermionic Emission
11%
Surface Roughness
10%
Charge Carrier
9%
Sulfurization
9%
Metal
8%
Chalcogen
8%
Semiconductor
7%
Application
6%
Charge Density
6%
Electric Field
6%
Dielectric Material
5%
Annealing
5%
Trap Density Measurement
5%
Electronic State
5%