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Research Output 1976 2019

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1983
38 Citations (Scopus)

Structure of thermally induced microdefects in Czochralski silicon after high-temperature annealing

Ponce, F., Yamashita, T. & Hahn, S., 1983, In : Applied Physics Letters. 43, 11, p. 1051-1053 3 p.

Research output: Contribution to journalArticle

annealing
silicon
crystal defects
flat surfaces
precipitates
1982
35 Citations (Scopus)

Dynamic observation of defect annealing in CdTe at lattice resolution

Sinclair, R., Ponce, F., Yamashita, T., Smith, D., Camps, R. A., Freeman, L. A., Erasmus, S. J., Nixon, W. C., Smith, K. C. A. & Catto, C. J. D., 1982, In : Nature. 298, 5870, p. 127-131 5 p.

Research output: Contribution to journalArticle

annealing
defects
display devices
slip
electron microscopes
35 Citations (Scopus)

Fault-free silicon at the silicon/sapphire interface

Ponce, F., 1982, In : Applied Physics Letters. 41, 4, p. 371-373 3 p.

Research output: Contribution to journalArticle

sapphire
silicon
chemical bonds
silicon films
16 Citations (Scopus)

HIGH-RESOLUTION LATTICE IMAGING OF CADMIUM TELLURIDE.

Yamashita, T., Ponce, F., Pirouz, P. & Sinclair, R., Apr 1982, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 45, 4, p. 693-711 19 p.

Research output: Contribution to journalArticle

Tellurium
Cadmium telluride
cadmium tellurides
Cadmium
Imaging techniques
4 Citations (Scopus)

Imaging of interfaces in semiconductor materials using high resolution transmission electron microscopy

Ponce, F., 1982, In : Ultramicroscopy. 9, 3, p. 215-219 5 p.

Research output: Contribution to journalArticle

High resolution transmission electron microscopy
Heterojunctions
Semiconductor materials
Imaging techniques
transmission electron microscopy
1981
36 Citations (Scopus)

Atomic motion on the surface of a cadmium telluride single crystal

Sinclair, R., Yamashita, T. & Ponce, F., 1981, In : Nature. 290, 5805, p. 386-388 3 p.

Research output: Contribution to journalArticle

cadmium tellurides
single crystals
photoelectronics
crystal lattices
clocks
31 Citations (Scopus)

Imaging of the silicon on sapphire interface by high-resolution transmission electron microscopy

Ponce, F. & Aranovich, J., 1981, In : Applied Physics Letters. 38, 6, p. 439-441 3 p.

Research output: Contribution to journalArticle

sapphire
transmission electron microscopy
high resolution
silicon
vapor deposition
29 Citations (Scopus)

Native tellurium dioxide layer on cadmium telluride: A high-resolution electron microscopy study

Ponce, F., Sinclair, R. & Bube, R. H., 1981, In : Applied Physics Letters. 39, 12, p. 951-953 3 p.

Research output: Contribution to journalArticle

cadmium tellurides
tellurium
dioxides
electron microscopy
high resolution
1980
4 Citations (Scopus)

INTEGRATED OUTPUT POWER DETECTION FOR AlGaAs LASER ARRAY.

Scifres, D. R., Ponce, F. & Stutius, W., May 1980, In : IEEE Journal of Quantum Electronics. QE-16, 5, p. 502-504 3 p.

Research output: Contribution to journalArticle

aluminum gallium arsenides
Lasers
output
lasers
heat sinks
4 Citations (Scopus)

Reduction of GaAs diode laser spontaneous emission

Streifer, W., Ponce, F. & Scifres, D. R., 1980, In : Applied Physics Letters. 37, 1, p. 10-12 3 p.

Research output: Contribution to journalArticle

spontaneous emission
semiconductor lasers
flat surfaces
apertures
coatings
1979
6 Citations (Scopus)

LATERAL MODE STABILIZATION OF DIODE LASERS BY MEANS OF APERTURED FACET REFLECTORS.

Ponce, F., Scifres, D. R., Streifer, W. & Connell, G. A. N., Nov 1979, In : IEEE Journal of Quantum Electronics. QE-15, 11, p. 1205-1207 3 p.

Research output: Contribution to journalArticle

reflectors
Semiconductor lasers
flat surfaces
Stabilization
stabilization
1976
3 Citations (Scopus)

Temperature dependence of thin-film ferromagnetic resonance linewidths

Ponce, F., Bhagat, S. M. & Lubitz, P., 1976, In : Solid State Communications. 18, 4, p. 521-522 2 p.

Research output: Contribution to journalArticle

Ferromagnetic resonance
ferromagnetic resonance
Linewidth
Thin films
temperature dependence