Research Output 1990 2019

Filter
Conference article
2018

Implementing a 'design for online' approach for engineering courses

Mansfield, J. M., Alford, T. & Theodore, N. D., Jun 23 2018, In : ASEE Annual Conference and Exposition, Conference Proceedings. 2018-June

Research output: Contribution to journalConference article

Students
Materials science
Education
Blueprints
Studios

Misconception clarification in online graduate courses

Mansfield, J., Alford, T. & Theodore, N. D., Jun 23 2018, In : ASEE Annual Conference and Exposition, Conference Proceedings. 2018-June

Research output: Contribution to journalConference article

Students
Feedback
Materials science
2 Citations (Scopus)

The sensor signal and information processing REU site

Spanias, A., Blain Christen, J., Thornton, T., Anderson, K., Goryll, M., Arafa, H. M., Shanthamallu, U. S., Forzani, E., Ross, H. M., Barnard, W. & Ozev, S., Jun 23 2018, In : ASEE Annual Conference and Exposition, Conference Proceedings. 2018-June

Research output: Contribution to journalConference article

Signal processing
Sensors
Students
Computer programming
Learning algorithms
2003
1 Citation (Scopus)

A new radiation boundary condition for FDTD based on self-teleportation of fields

Diaz, R. & Scherbatko, I., Aug 18 2003, In : IEEE MTT-S International Microwave Symposium Digest. 3, p. 2073-2076 4 p.

Research output: Contribution to journalConference article

finite difference time domain method
Boundary conditions
boundary conditions
Radiation
radiation
26 Citations (Scopus)

Magnetic loading of artificial magnetic conductors for bandwidth enhancement

Diaz, R., Sanchez, V., Caswell, E. & Miller, A., Sep 1 2003, In : IEEE Antennas and Propagation Society, AP-S International Symposium (Digest). 2, p. 431-434 4 p.

Research output: Contribution to journalConference article

Bandwidth
Frequency bands
Foams
Antennas
2 Citations (Scopus)

Nanovision: A new paradigm for enabling fast optical inspection of nanoscale structures

Watts, M. E. & Diaz, R., Nov 27 2003, In : Proceedings of SPIE - The International Society for Optical Engineering. 5041, p. 194-202 9 p.

Research output: Contribution to journalConference article

Inspection
inspection
Paradigm
Defects
defects