Research Output 1990 2019

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Book
2015
14 Citations (Scopus)

Circuit design for reliability

Reis, R., Wirth, G. & Cao, Y., Jan 1 2015, Springer New York. 272 p.

Research output: Book/ReportBook

Networks (circuits)
Electric network analysis
Fault detection
Hardening
2014
10 Citations (Scopus)
Textbooks
Nuclear energy
2007
47 Citations (Scopus)

Fundamentals of nanoscale film analysis

Alford, T., Feldman, L. C. & Mayer, J. W., 2007, Springer US. 338 p.

Research output: Book/ReportBook

Photons
Scanning probe microscopy
Nuclear reactions
Rutherford backscattering spectroscopy
Materials science