Fingerprint Dive into the research topics where IAFSE-CIDSE: Computer Science and Engineering is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.

Data storage equipment Engineering & Materials Science
Semantics Engineering & Materials Science
Planning Engineering & Materials Science
Students Engineering & Materials Science
Experiments Engineering & Materials Science
Communication Engineering & Materials Science
Scheduling Engineering & Materials Science
Costs Engineering & Materials Science

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Research Output 1982 2019

24.5 A Twin-8T SRAM Computation-In-Memory Macro for Multiple-Bit CNN-Based Machine Learning

Si, X., Chen, J. J., Tu, Y. N., Huang, W. H., Wang, J. H., Chiu, Y. C., Wei, W. C., Wu, S. Y., Sun, X., Liu, R., Yu, S., Liu, R. S., Hsieh, C. C., Tang, K. T., Li, Q. & Chang, M. F., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 396-398 3 p. 8662392. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Static random access storage
Macros
Learning systems
Data storage equipment
Energy efficiency

25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source with <6×10 -6 Native Bit Error Rate

Pang, Y., Gao, B., Wu, D., Yi, S., Liu, Q., Chen, W. H., Chang, T. W., Lin, W. E., Sun, X., Yu, S., Qian, H., Chang, M. F. & Wu, H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 402-404 3 p. 8662307. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bit error rate
Silicon
Authentication
Cryptography
RRAM

Action-Stage Emphasized Spatiotemporal VLAD for Video Action Recognition

Tu, Z., Li, H., Zhang, D., Dauwels, J., Li, B. & Yuan, J., Jun 1 2019, In : IEEE Transactions on Image Processing. 28, 6, p. 2799-2812 14 p., 8600333.

Research output: Contribution to journalArticle

Sampling
Neural networks
Image recognition
Kinetics
Experiments