Fingerprint Dive into the research topics where IAFSE-CIDSE: Computer Science and Engineering is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.

Data storage equipment Engineering & Materials Science
Semantics Engineering & Materials Science
Students Engineering & Materials Science
Planning Engineering & Materials Science
Experiments Engineering & Materials Science
Communication Engineering & Materials Science
Scheduling Engineering & Materials Science
Costs Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1982 2019

2019 IEEE World Congress on Services Message from the Steering Committee Chair

Bertino, E., Chang, R. N., Chen, P., Damiani, E., Foster, I., Gannon, D., Goul, K., Leymann, F., Mei, H. & Yau, S-S., Jul 1 2019, In : Proceedings - 2019 IEEE International Conference on Edge Computing, EDGE 2019 - Part of the 2019 IEEE World Congress on Services. p. XII 8812179.

Research output: Contribution to journalEditorial

1 Citation (Scopus)

24.5 A Twin-8T SRAM Computation-In-Memory Macro for Multiple-Bit CNN-Based Machine Learning

Si, X., Chen, J. J., Tu, Y. N., Huang, W. H., Wang, J. H., Chiu, Y. C., Wei, W. C., Wu, S. Y., Sun, X., Liu, R., Yu, S., Liu, R. S., Hsieh, C. C., Tang, K. T., Li, Q. & Chang, M. F., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 396-398 3 p. 8662392. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Static random access storage
Macros
Learning systems
Data storage equipment
Energy efficiency
1 Citation (Scopus)

25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source with <6×10 -6 Native Bit Error Rate

Pang, Y., Gao, B., Wu, D., Yi, S., Liu, Q., Chen, W. H., Chang, T. W., Lin, W. E., Sun, X., Yu, S., Qian, H., Chang, M. F. & Wu, H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 402-404 3 p. 8662307. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bit error rate
Silicon
Authentication
Cryptography
RRAM