Electrical, Computer, and Energy Engineering, School of (ECEE)

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Profiles

James Aberle

IAFSE-ECEE: Connection One (C1) - Associate Professor
Engineering, Ira A. Fulton Schools of (IAFSE) - Associate Professor
Knowledge Enterprise (KE) - Assistant Professor
IAFSE-ECEE: Electrical Engineering - Associate Professor

Person

Terry Alford

Engineering, Ira A. Fulton Schools of (IAFSE) - Professor
IAFSE-ECEE: Connection One (C1) - Assistant Professor
Knowledge Enterprise (KE) - Assistant Professor
IAFSE-SEMTE: Chemical Engineering - Professor
CLAS-NS: Solid State Science, LeRoy Eyring Center for (CSSS) - Professor
IAFSE-SEMTE: Materials Science and Engineering - Professor
Flexible Electronics and Display Center (FEDC) - Professor
Global Futures Laboratory (GFL) - Assistant Professor

Person

Ahmed Alkhateeb

Engineering, Ira A. Fulton Schools of (IAFSE) - Assistant Professor
IAFSE-ECEE: Electrical Engineering - Assistant Professor
IAFSE-ECEE: Sensor, Signal and Information Processing Center (SenSIP) - Assistant Professor

Person

Research Output

In-Field Recovery of RF Circuits from Wearout Based Performance Degradation

Chang, D., N. Kitchen, J., Kiaei, S. & Ozev, S., Apr 1 2020, In : IEEE Transactions on Emerging Topics in Computing. 8, 2, p. 442-452 11 p., 8003495.

Research output: Contribution to journal › Article

1 Scopus citations

24.5 A Twin-8T SRAM Computation-In-Memory Macro for Multiple-Bit CNN-Based Machine Learning

Si, X., Chen, J. J., Tu, Y. N., Huang, W. H., Wang, J. H., Chiu, Y. C., Wei, W. C., Wu, S. Y., Sun, X., Liu, R., Yu, S., Liu, R. S., Hsieh, C. C., Tang, K. T., Li, Q. & Chang, M. F., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 396-398 3 p. 8662392. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

25 Scopus citations

25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source with <6×10 ^-6 Native Bit Error Rate

Pang, Y., Gao, B., Wu, D., Yi, S., Liu, Q., Chen, W. H., Chang, T. W., Lin, W. E., Sun, X., Yu, S., Qian, H., Chang, M. F. & Wu, H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 402-404 3 p. 8662307. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution