Research Output per year
Fingerprint Dive into the research topics where ECEE Centers is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.
Silicon
Engineering & Materials Science
Networks (circuits)
Engineering & Materials Science
Electric potential
Engineering & Materials Science
Solar cells
Engineering & Materials Science
Sensors
Engineering & Materials Science
Data storage equipment
Engineering & Materials Science
Electrons
Engineering & Materials Science
Temperature
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Profiles
James Aberle
- IAFSE-ECEE: Connection One (C1)
- Engineering, Ira A. Fulton Schools of (IAFSE)
- Knowledge Enterprise Development, Office of (OKED)
- IAFSE-ECEE: Electrical Engineering
Person
Terry Alford
- Engineering, Ira A. Fulton Schools of (IAFSE)
- IAFSE-ECEE: Connection One (C1)
- Sustainability, Julie Ann Wrigley Global Institute of (GIOS)
- Knowledge Enterprise Development, Office of (OKED)
- IAFSE-SEMTE: Chemical Engineering
- CLAS-NS: Solid State Science, LeRoy Eyring Center for (CSSS)
- IAFSE-SEMTE: Materials Science and Engineering
- Flexible Electronics and Display Center (FEDC)
Person
Research Output 1983 2019
24.5 A Twin-8T SRAM Computation-In-Memory Macro for Multiple-Bit CNN-Based Machine Learning
Si, X., Chen, J. J., Tu, Y. N., Huang, W. H., Wang, J. H., Chiu, Y. C., Wei, W. C., Wu, S. Y., Sun, X., Liu, R., Yu, S., Liu, R. S., Hsieh, C. C., Tang, K. T., Li, Q. & Chang, M. F., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 396-398 3 p. 8662392. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Static random access storage
Macros
Learning systems
Data storage equipment
Energy efficiency
25.2 A Reconfigurable RRAM Physically Unclonable Function Utilizing Post-Process Randomness Source with <6×10 -6 Native Bit Error Rate
Pang, Y., Gao, B., Wu, D., Yi, S., Liu, Q., Chen, W. H., Chang, T. W., Lin, W. E., Sun, X., Yu, S., Qian, H., Chang, M. F. & Wu, H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 402-404 3 p. 8662307. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Bit error rate
Silicon
Authentication
Cryptography
RRAM
27.5 A 91%-Efficiency Envelope-Tracking Modulator Using Hysteresis-Controlled Three-Level Switching Regulator and Slew-Rate-Enhanced Linear Amplifier for LTE-80MHz Applications
Mahmoudidaryan, P., Mandal, D., Bakkaloglu, B. & Kiaei, S., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 428-430 3 p. 8662305. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
Modulators
Hysteresis
Power amplifiers
Agglomeration
Bandwidth
Prizes
National Excellent Doctoral Dissertation Award
Hanqing Jiang (Recipient), 2003
Prize: Prize (including medals and awards)
National Science Foundation CAREER award
Pavan Kumar Turaga (Recipient), Jun 2015
Prize: Prize (including medals and awards)