CLAS-NS: Solid State Science, LeRoy Eyring Center for (CSSS)

Research Output

Article
12 Scopus citations

A transmission and high-resolution electron microscope study of cozonally twinned growth of eutectic silicon in unmodified Al-Si alloys

Shamsuzzoha, M., Hogan, L. M., Smith, D. & Deymier, P. A., 1991, In : Journal of Crystal Growth. 112, 4, p. 635-643 9 p.

Research output: Contribution to journalArticle

8 Scopus citations

Auger electron spectroscopy and microscopy with probe-size limited resolution

Hembree, G. G., Drucker, J., Luo, F. C. H., Krishnamurthy, M. & Venables, J. A., 1991, In : Applied Physics Letters. 58, 17, p. 1890-1892 3 p.

Research output: Contribution to journalArticle

22 Scopus citations

Augmented hemoperfusion for hyperbilirubinemia

Brian, B. F., Dorson, W. J., Pizziconi, V., Ramseyer, P. J. & Brooker, J. E., 1988, In : ASAIO Transactions. 34, 3, p. 585-589 5 p.

Research output: Contribution to journalArticle

3 Scopus citations

Au on vapor-liquid-solid grown Si nanowires: Spreading of liquid AuSi from the catalytic seed

Dailey, E., Madras, P. & Drucker, J., Sep 15 2010, In : Journal of Applied Physics. 108, 6, 064320.

Research output: Contribution to journalArticle

24 Scopus citations
14 Scopus citations

Autism severity and muscle strength: A correlation analysis

Kern, J. K., Geier, D. A., Adams, J., Troutman, M. R., Davis, G., King, P. G., Young, J. L. & Geier, M. R., Jul 2011, In : Research in Autism Spectrum Disorders. 5, 3, p. 1011-1015 5 p.

Research output: Contribution to journalArticle

18 Scopus citations

Automated correlative segmentation of large Transmission X-ray Microscopy (TXM) tomograms using deep learning

Shashank Kaira, C., Yang, X., De Andrade, V., De Carlo, F., Scullin, W., Gursoy, D. & Chawla, N., Aug 1 2018, In : Materials Characterization. 142, p. 203-210 8 p.

Research output: Contribution to journalArticle

9 Scopus citations
18 Scopus citations

Avoidance of Catastrophic Structural Failure as an Evolutionary Constraint: Biomechanics of the Acorn Weevil Rostrum

Jansen, M. A., Williams, J., Chawla, N. & Franz, N., Jan 1 2019, (Accepted/In press) In : Advanced Materials. 1903526.

Research output: Contribution to journalArticle

23 Scopus citations

Background intensity problems in high resolution defect imaging

Howie, A., Jiang, N., Spence, J. & Wu, J., Aug 2006, In : Microscopy and Microanalysis. 12, SUPPL. 2, p. 900-901 2 p.

Research output: Contribution to journalArticle

9 Scopus citations

Ballistic quantum-mechanical simulation of 10nm FinFET using CBR method

Khan, H., Mamaluy, D. & Vasileska, D., May 10 2006, In : Journal of Physics: Conference Series. 38, 1, p. 196-199 4 p.

Research output: Contribution to journalArticle

5 Scopus citations

Band alignment at AlN/Si (111) and (001) interfaces

King, S. W., Nemanich, R. & Davis, R. F., Jul 28 2015, In : Journal of Applied Physics. 118, 4, 045304.

Research output: Contribution to journalArticle

5 Scopus citations
5 Scopus citations

Band alignment of vanadium oxide as an interlayer in a hafnium oxide-silicon gate stack structure

Zhu, C., Kaur, M., Tang, F., Liu, X., Smith, D. & Nemanich, R., Oct 15 2012, In : Journal of Applied Physics. 112, 8, 084105.

Research output: Contribution to journalArticle

8 Scopus citations
9 Scopus citations
12 Scopus citations

Band gap-engineered group-IV optoelectronic semiconductors, photodiodes and prototype photovoltaic devices

Beeler, R. T., Gallagher, J., Xu, C., Jiang, L., Senaratne, C. L., Smith, D., Menendez, J., Chizmeshya, A. & Kouvetakis, J., 2013, In : ECS Journal of Solid State Science and Technology. 2, 9

Research output: Contribution to journalArticle

14 Scopus citations

Band gap engineering of quaternary-alloyed ZnCdSSe quantum dots via a facile phosphine-free colloidal method

Deng, Z., Yan, H. & Liu, Y., Dec 16 2009, In : Journal of the American Chemical Society. 131, 49, p. 17744-17745 2 p.

Research output: Contribution to journalArticle

111 Scopus citations

Band gap shift in the indium-tin-oxide films on polyethylene napthalate after thermal annealing in air

Han, H., Mayer, J. W. & Alford, T., 2006, In : Journal of Applied Physics. 100, 8, 083715.

Research output: Contribution to journalArticle

115 Scopus citations

Band offsets of epitaxial cubic boron nitride deposited on polycrystalline diamond via plasma-enhanced chemical vapor deposition

Shammas, J., Yang, Y., Wang, X., Koeck, F. A. M., McCartney, M., Smith, D. & Nemanich, R., Oct 23 2017, In : Applied Physics Letters. 111, 17, 171604.

Research output: Contribution to journalArticle

5 Scopus citations

Basal-plane slip in InGaNGaN heterostructures in the presence of threading dislocations

Mei, J., Liu, R., Ponce, F., Omiya, H. & Mukai, T., 2007, In : Applied Physics Letters. 90, 17, 171922.

Research output: Contribution to journalArticle

10 Scopus citations

Beam-induced damage to thin specimens in an intense electron probe

Egerton, R. F., Wang, F. & Crozier, P., Feb 2006, In : Microscopy and Microanalysis. 12, 1, p. 65-71 7 p.

Research output: Contribution to journalArticle

83 Scopus citations

Beam transit effects in single molecule coherent diffraction

Gibson, J. M. & Treacy, M., Dec 1 2008, In : Physical Review B - Condensed Matter and Materials Physics. 78, 24, 245401.

Research output: Contribution to journalArticle

2 Scopus citations

Behavior of NDMA precursors at 21 full-scale water treatment facilities

Krasner, S. W., Westerhoff, P., Mitch, W. A., Hanigan, D., McCurry, D. L. & Von Gunten, U., Dec 1 2018, In : Environmental Science: Water Research and Technology. 4, 12, p. 1966-1978 13 p.

Research output: Contribution to journalArticle

4 Scopus citations

Beneficial effects of annealing on amorphous Nb-Si thin-film thermometers

Querlioz, D., Helgren, E., Queen, D. R., Hellman, F., Islam, R. & Smith, D., 2005, In : Applied Physics Letters. 87, 22, p. 1-3 3 p., 221901.

Research output: Contribution to journalArticle

18 Scopus citations

Bentonite, bandaids and borborygmi

Williams, L., Haydel, S. & Ferrell, R. E., Apr 2009, In : Elements. 5, 2, p. 99-104 6 p.

Research output: Contribution to journalArticle

30 Scopus citations

Beryllium analyses by secondary ion mass spectrometry

Hervig, R., 2002, In : Reviews in Mineralogy and Geochemistry. 50

Research output: Contribution to journalArticle

4 Scopus citations

Beryllium and boron in subduction zone minerals: An ion microprobe study

Domanik, K. J., Hervig, R. & Peacock, S. M., 1993, In : Geochimica et Cosmochimica Acta. 57, 21-22, p. 4997-5010 14 p.

Research output: Contribution to journalArticle

99 Scopus citations

Better Resolution of High-Spin Cobalt Hyperfine at Low Frequency: Co-Doped Ba(Zn1/3Ta2/3)O₃ as a Model Complex

Antholine, W. E., Zhang, S., Gonzales, J. & Newman, N., Nov 9 2018, In : International Journal of Molecular Sciences. 19, 11

Research output: Contribution to journalArticle

2 Scopus citations
21 Scopus citations

Beyond small-angle x-ray scattering: Exploiting angular correlations

Saldin, D. K., Poon, H. C., Shneerson, V. L., Howells, M., Chapman, H. N., Kirian, R., Schmidt, K. & Spence, J., May 7 2010, In : Physical Review B - Condensed Matter and Materials Physics. 81, 17, 174105.

Research output: Contribution to journalArticle

47 Scopus citations

Beyond the Boltzmann factor for corrections to scaling in ferromagnetic materials and critical fluids

Chamberlin, R., Vermaas, J. V. & Wolf, G., Sep 2009, In : European Physical Journal B. 71, 1, p. 1-6 6 p.

Research output: Contribution to journalArticle

13 Scopus citations

Bias dependent two-channel conduction in InAlN/AlN/GaN structures

Leach, J. H., Ni, X., Li, X., Wu, M., Özgür, U., Morko̧, H., Zhou, L., Cullen, D. A., Smith, D., Cheng, H., Kurdak, Ç., Meyer, J. R. & Vurgaftman, I., Apr 15 2010, In : Journal of Applied Physics. 107, 8, 083706.

Research output: Contribution to journalArticle

12 Scopus citations

Biassed secondary electron imaging in a UHV-STEM

Hembree, G. G., Crozier, P., Drucker, J., Krishnamurthy, M., Venables, J. A. & Cowley, J. M., 1989, In : Ultramicroscopy. 31, 1, p. 111-115 5 p.

Research output: Contribution to journalArticle

37 Scopus citations

Biassed secondary electron imaging of monatomic surface steps on vicinal Si(100) in a UHV STEM

Drucker, J., Krishnamurthy, M. & Hembree, G., 1991, In : Ultramicroscopy. 35, 3-4, p. 323-328 6 p.

Research output: Contribution to journalArticle

9 Scopus citations

Bias temperature instability model using dynamic defect potential for predicting CMOS aging

Fang, R., Livingston, I., Esqueda, I. S., Kozicki, M. & Barnaby, H., Jun 14 2018, In : Journal of Applied Physics. 123, 22, 225701.

Research output: Contribution to journalArticle

101 Scopus citations
13 Scopus citations
27 Scopus citations
55 Scopus citations