CLAS-NS: Solid State Science, LeRoy Eyring Center for (CSSS)

Research Output

Characterization of charging in semiconductor device materials by electron holography

McCartney, M., Jun 1 2005, In : Journal of Electron Microscopy. 54, 3, p. 239-242 4 p.

Research output: Contribution to journalArticle

19 Scopus citations

Characterization of damage evolution in sic particle reinforced Al alloy matrix composites by in-situ X-ray synchrotron tomography

Williams, J. J., Chapman, N. C., Jakkali, V., Tanna, V. A., Chawla, N., Xiao, X. & De Carlo, F., Oct 1 2011, In : Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science. 42, 10, p. 2999-3005 7 p.

Research output: Contribution to journalArticle

27 Scopus citations

Characterization of electrical properties in axial Si-Ge nanowire heterojunctions using off-axis electron holography and atom-probe tomography

Gan, Z., Perea, D. E., Yoo, J., He, Y., Colby, R. J., Barker, J. E., Gu, M., Mao, S. X., Wang, C., Picraux, S. T., Smith, D. & McCartney, M., Sep 14 2016, In : Journal of Applied Physics. 120, 10, 104301.

Research output: Contribution to journalArticle

6 Scopus citations

CHARACTERIZATION OF ELECTRON TRAPS RESULTING FROM OXYGEN PRECIPITATION IN Cz SILICON.

Whitfield, J., Varker, C. J., Chan, S. S., Carpenter, R., Krause, S., Krause, S. J. & Weber, E. R., 1986, Proceedings of SPIE - The International Society for Optical Engineering. Sadana, D. K. & Current, M. I. (eds.). Bellingham, WA, USA: SPIE, Vol. 623. p. 83-90 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations

Characterization of epitaxially grown indium islands on Si(111)

Lunceford, C. & Drucker, J., Nov 1 2012, In : Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films. 30, 6, 061509.

Research output: Contribution to journalArticle

3 Scopus citations

Characterization of epitaxial SiGe thin films on Si: Analytical considerations

Evans, K. L., Anderson, T. A., Liaw, M., Gregory, R., Munukutla, L. V., Graham, R. J. & McCartney, M., Feb 1992, In : Surface and Interface Analysis. 18, 2, p. 129-136 8 p.

Research output: Contribution to journalArticle

6 Scopus citations

Characterization of fatigue behavior of long fiber reinforced thermoplastic (LFT) composites

Goel, A., Chawla, K. K., Vaidya, U. K., Chawla, N. & Koopman, M., Jun 1 2009, In : Materials Characterization. 60, 6, p. 537-544 8 p.

Research output: Contribution to journalArticle

37 Scopus citations

Characterization of filamentous carbon on Ni/MgO catalysts by high-resolution electron microscopy

Smith, D., McCartney, M., Tracz, E. & Borowiecki, T., Nov 1990, In : Ultramicroscopy. 34, 1-2, p. 54-59 6 p.

Research output: Contribution to journalArticle

7 Scopus citations

Characterization of food-grade titanium dioxide: The presence of nanosized particles

Yang, Y., Doudrick, K., Bi, X., Hristovski, K., Herckes, P., Westerhoff, P. & Kaegi, R., Jun 3 2014, In : Environmental Science and Technology. 48, 11, p. 6391-6400 10 p.

Research output: Contribution to journalArticle

130 Scopus citations

Characterization of GaN epitaxial films grown on SiN x and TiN x porous network templates

Xie, J., Fu, Y., Özgür, Ü., Moon, Y. T., Yun, F., Morkoç, H., Everitt, H. O., Sagar, A., Feenstra, R. M., Inoki, C. K., Kuan, T. S., Zhou, L. & Smith, D., May 24 2006, Gallium Nitride Materials and Devices. 61210B. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 6121).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Characterization of Group III-nitrides by high-resolution electron microscopy

Chandrasekhar, D., Smith, D., Strite, S., Lin, M. E. & Morkoc, H., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 846-847 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Characterization of Group III-nitride semiconductors by high-resolution electron microscopy

Chandrasekhar, D., Smith, D., Strite, S., Lin, M. E. & Morkoç, H., Jul 1 1995, In : Journal of Crystal Growth. 152, 3, p. 135-142 8 p.

Research output: Contribution to journalArticle

54 Scopus citations

Characterization of Josephson and quasi-particle currents in MgB 2/MgB2 and Pb/Pb contact junctions

Shen, Y., Singh, R., Sanghavi, S., Wei, Y., Chamberlin, R., Moeckly, B. H., Rowell, J. M. & Newman, N., May 28 2010, In : Superconductor Science and Technology. 23, 7, 075003.

Research output: Contribution to journalArticle

7 Scopus citations

Characterization of light-absorbing carbon particles at three altitudes in East Asian outflow by transmission electron microscopy

Zhu, J., Crozier, P. & Anderson, J. R., Jul 30 2013, In : Atmospheric Chemistry and Physics. 13, 13, p. 6359-6371 13 p.

Research output: Contribution to journalArticle

18 Scopus citations

Characterization of medium-range order in self-assembled organic-inorganic hybrid by fluctuation X-ray microscopy

Fan, L., Paterson, D., McNulty, I., Treacy, M., Kumar, D., Du, P., Wiesner, U. & Murray Gibson, J., Dec 1 2007, Self Assembly of Nanostructures Aided by Ion- or Photon-Beam Irradiation: Fundamentals and Applications. p. 62-67 6 p. (Materials Research Society Symposium Proceedings; vol. 960).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Characterization of metal precipitates in magnesium oxide

Narayan, J., Chen, Y., Moon, R. M. & Carpenter, R., Aug 1984, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 49, 2, p. 287-300 14 p.

Research output: Contribution to journalArticle

38 Scopus citations

Characterization of nanoindentation damage in metal/ceramic multilayered films by transmission electron microscopy (TEM)

Sun, P. L., Chu, J. P., Lin, T. Y., Shen, Y. L. & Chawla, N., May 15 2010, In : Materials Science and Engineering A. 527, 12, p. 2985-2992 8 p.

Research output: Contribution to journalArticle

31 Scopus citations
29 Scopus citations

Characterization of N-polar GaN/AlGaN/GaN heterostructures using electron holography

Boley, A., Storm, D. F., McCartney, M. & Smith, D., Aug 1 2014, In : Microscopy and Microanalysis. 20, 3, p. 258-259 2 p.

Research output: Contribution to journalConference article

Characterization of organics in Arizona surface waters: Size and TEP

Westerhoff, P., Wang, J. & Chiu, C. A., Dec 1 2011, Water Quality Technology Conference and Exposition 2011. p. 908-915 8 p. (Water Quality Technology Conference and Exposition 2011).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Scopus citations

Characterization of Self-Assembled CdTe Quantum Dots Grown on ZnTe/GaSb

Tang, D., Smith, D., Pimpinella, R. E., Li, X., Dobrowolska, M. & Furdyna, J. K., 2012, In : Microscopy and Microanalysis. 18, S2, p. 1438-1439 2 p.

Research output: Contribution to journalArticle

Characterization of self-heating in high-mobility Ge FinFET pMOS devices

Bury, E., Kaczer, B., Mitard, J., Collaert, N., Khatami, N. S., Aksamija, Z., Vasileska, D., Raleva, K., Witters, L., Hellings, G., Linten, D., Groeseneken, G. & Thean, A., Aug 25 2015, Digest of Technical Papers - Symposium on VLSI Technology. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-August. p. T60-T61 7223703

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Scopus citations

Characterization of structural defects in SnSe2 thin films grown by molecular beam epitaxy on GaAs (111)B substrates

Tracy, B. D., Li, X., Liu, X., Furdyna, J., Dobrowolska, M. & Smith, D., Nov 1 2016, In : Journal of Crystal Growth. 453, p. 58-64 7 p.

Research output: Contribution to journalArticle

7 Scopus citations

Characterization of structural defects in wurtzite GaN grown on 6H SiC using plasma-enhanced molecular beam epitaxy

Smith, D., Chandrasekhar, D., Sverdlov, B., Botchkarev, A., Salvador, A. & Morkoç, H., Dec 1 1995, In : Applied Physics Letters. 67, 1 p.

Research output: Contribution to journalArticle

89 Scopus citations

Characterization of surface structure in heterogeneous catalysts by high-resolution transmission electron microscopy

Datye, A. K., Logan, A. D., Blankenburg, K. J. & Smith, D., Nov 1990, In : Ultramicroscopy. 34, 1-2, p. 47-53 7 p.

Research output: Contribution to journalArticle

14 Scopus citations
19 Scopus citations

Characterization of thin films, interfaces and surfaces by high-resolution electron microscopy

Smith, D., Li, Z. G., Lu, P., McCartney, M. & Tsen, S. C. Y., Aug 1991, In : Ultramicroscopy. 37, 1-4, p. 169-179 11 p.

Research output: Contribution to journalArticle

10 Scopus citations

Characterization ofWC/B4C multilayers sputtered in argoWmethane atmospheres

Diehl, P. E., Lund, M. W., Madsenx, D. W., McIntyre, L. C. & Smith, D. J., Jan 21 1993, In : Proceedings of SPIE - The International Society for Optical Engineering. 1742, p. 354-364 11 p.

Research output: Contribution to journalConference article

1 Scopus citations

Characterization of WCx/B4C multilayers sputtered in reactive argon/methane atmospheres

Diehl, P. E., Lund, M. W., Madsen, D. W., McIntyre, L. C. & Smith, D., Feb 15 1994, In : Thin Solid Films. 239, 1, p. 57-70 14 p.

Research output: Contribution to journalArticle

11 Scopus citations

Characterization of Zinc Telluride Grown on Silicon by MBE

Kim, J. J., Smith, D., Chen, Y. & Brill, G. N., 2012, In : Microscopy and Microanalysis. 18, S2, p. 1848-1849 2 p.

Research output: Contribution to journalArticle

Characterization of ZnGeAs2 thin films produced by pulsed laser deposition

Tang, Z. Z., Zhang, L., Singh, R., Wright, D., Peshek, T., Gessert, T., Coutts, T. J., Van Schilfgaarde, M. & Newman, N., Dec 1 2009, 2009 34th IEEE Photovoltaic Specialists Conference, PVSC 2009. p. 437-439 3 p. 5411649. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Characterizing and addressing student learning issues and misconceptions (SLIMs) in materials science with muddiest point reflections and fast formative feedback

Krause, S., Baker, D. R., Carberry, A., Alford, T., Ankeny, J., Koretsky, M., Brooks, B. J., Waters, C., Gibbons, B. J., Maass, S. & Chan, C., 2014, ASEE Annual Conference and Exposition, Conference Proceedings. American Society for Engineering Education

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Character of organic matter in soil-aquifer treatment systems

Drewes, J. E., Quanrud, D. M., Amy, G. L. & Westerhoff, P., Nov 1 2006, In : Journal of Environmental Engineering. 132, 11, p. 1447-1458 12 p.

Research output: Contribution to journalArticle

51 Scopus citations

Charge control in N-polar InAlN high-electron-mobility transistors grown by plasma-assisted molecular beam epitaxy

Hardy, M. T., Storm, D. F., Downey, B. P., Katzer, D. S., Meyer, D. J., McConkie, T. O. & Smith, D., Nov 1 2015, In : Journal of Vacuum Science and Technology B:Nanotechnology and Microelectronics. 33, 6, 061207.

Research output: Contribution to journalArticle

7 Scopus citations

Charge density and chemical bonding in rutile, TiO2

Jiang, B., Zuo, J. M., Jiang, N., O'Keeffe, M. & Spence, J., Jul 1 2003, In : Acta Crystallographica Section A: Foundations of Crystallography. 59, 4, p. 341-350 10 p.

Research output: Contribution to journalArticle

58 Scopus citations

Charge Density of MgO: Implications of Precise New Measurements for Theory

Zuo, J. M., Rez, P., Spence, J. & Spence, J. C. H., Jun 23 1997, In : Physical Review Letters. 78, 25, p. 4777-4780 4 p.

Research output: Contribution to journalArticle

84 Scopus citations

Charge neutralization and oxygen isotopic analysis of insulators with the ion microprobe

Hervig, R., Thomas, R. M. & Williams, P., Jan 1 1989, In : US Geological Survey Bulletin. 1890, p. 137-143 7 p.

Research output: Contribution to journalArticle

13 Scopus citations

Charge Redistribution at ‘Polytype’ Heterojunctions in InAs(Sb) Nanopillars

Li, L., Gan, Z., Liang, H., Yu, H., Smith, D. & McCarthy, M. R., 2012, In : Microscopy and Microanalysis. 18, p. 1812-1813 2 p.

Research output: Contribution to journalArticle

Charge transfer on the nanoscale: Current status

Adams, D. M., Brus, L., Chidsey, C. E. D., Creager, S., Creutz, C., Kagan, C. R., Kamat, P. V., Lieberman, M., Lindsay, S., Marcus, R. A., Metzger, R. M., Michel-Beyerle, M. E., Miller, J. R., Newton, M. D., Rolison, D. R., Sankey, O., Schanze, K. S., Yardley, J. & Zhu, X., Jul 17 2003, In : Journal of Physical Chemistry B. 107, 28, p. 6668-6697 30 p.

Research output: Contribution to journalArticle

844 Scopus citations

Charge transport in mesoscopic conducting polymer wires

He, J., Forzani, E., Nagahara, L. A., Tao, N. & Lindsay, S., Sep 17 2008, In : Journal of Physics Condensed Matter. 20, 37, 374120.

Research output: Contribution to journalArticle

8 Scopus citations

Charge transport within a Three-dimensional DNA nanostructure framework

Lu, N., Pei, H., Ge, Z., Simmons, C. R., Yan, H. & Fan, C., Aug 15 2012, In : Journal of the American Chemical Society. 134, 32, p. 13148-13151 4 p.

Research output: Contribution to journalArticle

79 Scopus citations

Chemical and mineralogical characteristics of French green clays used for healing

Williams, L., Haydel, S., Giese, R. F. & Eberl, D. D., Aug 1 2008, In : Clays and Clay Minerals. 56, 4, p. 437-452 16 p.

Research output: Contribution to journalArticle

59 Scopus citations

Chemical and semiconducting properties of NO2-activated H-terminated diamond

Geis, M. W., Fedynyshyn, T. H., Plaut, M. E., Wade, T. C., Wuorio, C. H., Vitale, S. A., Varghese, J. O., Grotjohn, T. A., Nemanich, R. & Hollis, M. A., Apr 1 2018, In : Diamond and Related Materials. 84, p. 86-94 9 p.

Research output: Contribution to journalArticle

5 Scopus citations

Chemical and Structural Widths of Interfaces and Grain Boundaries in Silicon Nitride–Silicon Carbide Whisker Composites

Chowdhury, K. D., Carpenter, R., Braue, W., Liu, J. & Ma, H., Oct 1995, In : Journal of the American Ceramic Society. 78, 10, p. 2579-2592 14 p.

Research output: Contribution to journalArticle

14 Scopus citations

Chemical imaging of InGaAs/InAlAs quantum wells

Mountjoy, G., Crozier, P., Fejes, P. L., Tsui, R. K. & Kramer, G. D., 1997, Materials Research Society Symposium - Proceedings. MRS, Vol. 466. p. 57-62 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chemical lattice imaging: a pedantic note

Rez, P., Jan 1 1992, In : Ultramicroscopy. 41, 1-3, p. 115-120 6 p.

Research output: Contribution to journalArticle

5 Scopus citations

Chemical recognition and binding kinetics in a functionalized tunnel junction

Chang, S., Huang, S., Liu, H., Zhang, P., Liang, F., Akahori, R., Li, S., Gyarfas, B., Shumway, J., Ashcroft, B., He, J. & Lindsay, S., Jun 15 2012, In : Nanotechnology. 23, 23, 235101.

Research output: Contribution to journalArticle

26 Scopus citations

Chemical routes to GeSi (100) structures for low temperature Si-based semiconductor applications

Wistey, M. A., Fang, Y. Y., Tolle, J., Chizmeshya, A. & Kouvetakis, J., Mar 1 2007, In : Applied Physics Letters. 90, 8, 082108.

Research output: Contribution to journalArticle

45 Scopus citations

Chemical Synthesis of Metastable Germanium-Carbon Alloys Grown Heteroepitaxially on (100) Si

Todd, M., McMurran, J., Kouvetakis, J. & Smith, D., Oct 1996, In : Chemistry of Materials. 8, 10, p. 2491-2498 8 p.

Research output: Contribution to journalArticle

17 Scopus citations