CLAS-NS: Solid State Science, LeRoy Eyring Center for (CSSS)

Research Output

1993

Microstructural evolution and coherent islands

Drucker, J., Dec 1 1993, Evolution of Surface and Thin Film Microstructure. Atwater, H. A., Chason, E., Grabow, M. H. & Lagally, M. G. (eds.). Publ by Materials Research Society, p. 389-392 4 p. (Materials Research Society Symposium Proceedings; vol. 280).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Microstructural study of reaction-bonded silicon carbide

Chowdhury, K. D., Carpenter, R. & Braue, W., Jan 1 1993, Materials Research Society Symposium Proceedings. Publ by Materials Research Society, p. 183-188 6 p. (Materials Research Society Symposium Proceedings; vol. 295).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Modeling of β-SiC MESFETs using hydrodynamic equations

Zhou, J. R., Vasileska, D. & Ferry, D. K., Sep 1993, In : Solid State Electronics. 36, 9, p. 1289-1294 6 p.

Research output: Contribution to journalArticle

18 Scopus citations

Nanometer-resolution Auger electron spectroscopy and microscopy of small particles

Liu, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 720-721 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanometer-resolution surface analysis with Auger electrons

Liu, J., Hembree, G. G., Spinnler, G. E. & Venables, J. A., Dec 1993, In : Ultramicroscopy. 52, 3-4, p. 369-376 8 p.

Research output: Contribution to journalArticle

12 Scopus citations

Observation of a supported metal catalyst in an ultra-high-resolution field-emission SEM

Liu, J. & Spinnler, G. E., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 784-785 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Observation of supported catalyst particles by high-resolution SEM

Yao, M. H., Smith, D. & Datye, A. K., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 782-783 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC

Bow, J. S., Carpenter, R. & Kim, M. J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 914-915 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Origins of high-resolution secondary-electron microscopy

Scheinfein, M. R., Drucker, J. & Weiss, J. K., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 766-767 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Origins of high spatial resolution secondary electron microscopy

Scheinfein, M. R., Drucker, J., Liu, J., Weiss, J. K., Hembree, G. G. & Cowley, J. M., Jan 1 1993, Materials Research Society Symposium Proceedings. Publ by Materials Research Society, p. 253-259 7 p. (Materials Research Society Symposium Proceedings; vol. 295).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Preparation of thin-film-metal/6H-SiC TEM specimens by RPR ion milling

Bow, J. S., Shaapur, F., Kim, M. J. & Carpenter, R., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 714-715 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Progress towards quantitative high-resolution electron microscopy

Smith, D., de Ruijter, W. J., McCartney, M. & Weiss, J. K., Dec 1993, In : Ultramicroscopy. 52, 3-4, p. 591-601 11 p.

Research output: Contribution to journalArticle

8 Scopus citations

Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera

Pan, M. & Crozier, P., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 670-671 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Quantitative imaging and diffraction of zeolites using a slow-scan CCD camera

Pan, M. & Crozier, P., Dec 1993, In : Ultramicroscopy. 52, 3-4, p. 487-498 12 p.

Research output: Contribution to journalArticle

31 Scopus citations

Real-time viewing of dynamic processes on CdTe surfaces at elevated temperature

Smith, D., Vogl, R. & Lu, P., Jan 1 1993, Materials Research Society Symposium Proceedings. Publ by Materials Research Society, p. 133-138 6 p. (Materials Research Society Symposium Proceedings; vol. 295).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Reflection electron energy-loss spectroscopy studies of Ca segregation on MgO (100) surfaces

Crozier, P. & Gajdardziska-Josifovska, M., Jan 1993, In : Ultramicroscopy. 48, 1-2, p. 63-76 14 p.

Research output: Contribution to journalArticle

12 Scopus citations

Reflection electron microscopy studies of GaP(110) surfaces in UHV-TEM

Gajdardziska-Josifovska, M., McCartney, M. & Smith, D., May 10 1993, In : Surface Science. 287-288, PART 2, p. 1062-1066 5 p.

Research output: Contribution to journalArticle

2 Scopus citations

Scanning reflection electron microscopy and associated techniques for surface studies

Liu, J. & Cowley, J. M., Apr 1993, In : Ultramicroscopy. 48, 4, p. 381-416 36 p.

Research output: Contribution to journalArticle

29 Scopus citations

Secondary-electron production pathways determined by coincidence electron spectroscopy

Scheinfein, M. R., Drucker, J. & Weiss, J. K., Jan 1 1993, In : Physical Review B. 47, 7, p. 4068-4071 4 p.

Research output: Contribution to journalArticle

29 Scopus citations

Short-range order to long-range order transition in a Cu-Ti alloy

Lee, J. S., Carpenter, R., Lim, H. & Choo, W. K., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1180-1181 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Si(100) surface corrosion by NH4F studied using high spatial resolution secondary electron imaging in a UHV-STEM

Drucker, J., Bandari, A. & Burrows, V., Dec 1 1993, Surface Chemical Cleaning and Passivation for Semiconductor Processing. Higashi, G. S., Irene, E. A. & Ohmi, T. (eds.). Publ by Materials Research Society, p. 479-484 6 p. (Materials Research Society Symposium Proceedings; vol. 315).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

SSZ-26 and SSZ-33: Two molecular sieves with intersecting 10- and 12-ring pores

Lobo, R. F., Pan, M., Chan, I., Li, H. X., Medrud, R. C., Zones, S. I., Crozier, P. & Davis, M. E., Jan 1 1993, In : Science. 262, 5139, p. 1543-1546 4 p.

Research output: Contribution to journalArticle

130 Scopus citations

Structural characterization of thin Co/Cu superlattices

Smith, D., Modak, A. R. & Parkin, S. S. P., 1993, Multilayers and Surfaces. Publ by Materials Research Society, p. 437-442 6 p. (Materials Research Society Symposium Proceedings; vol. 313).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Structural properties of InN films grown on GaAs substrates: observation of the zincblende polytpe

Strite, S., Chandrasekhar, D., Smith, D., Sariel, J., Chen, H., Teraguchi, N. & Morkoç, H., Feb 2 1993, In : Journal of Crystal Growth. 127, 1-4, p. 204-208 5 p.

Research output: Contribution to journalArticle

90 Scopus citations

The composition and structure of SIPOS: A high spatial resolution electron microscopy study

Catalano, M., Kim, M. J., Carpenter, R., Chowdhury, K. D. & Wong, J., Nov 1993, In : Journal of Materials Research. 8, 11, p. 2893-2901 9 p.

Research output: Contribution to journalArticle

14 Scopus citations

The effectiveness of electron holography, microscopy, and energy-loss spectroscopy in characterizing thin silicon oxide-nitride-oxide structures

Waytena, G. L., Hren, J. & Rez, P., Jan 1 1993, In : Journal of Applied Physics. 73, 4, p. 1750-1760 11 p.

Research output: Contribution to journalArticle

4 Scopus citations

The occurrence and distribution of Mo and molybdenite in unaltered peralkaline rhyolites from Pantelleria, Italy

Lowenstern, J. B., Mahood, G. A., Hervig, R. & Sparks, J., May 1 1993, In : Contributions to Mineralogy and Petrology. 114, 1, p. 119-129 11 p.

Research output: Contribution to journalArticle

26 Scopus citations

Thin film Ti{plus 45 degree rule}6H-SiC interfacial reaction: high spatial resolution electron microscopy study

Bow, J. S., Porter, L. M., Kim, M. J., Carpenter, R. & Davis, R. F., Dec 1993, In : Ultramicroscopy. 52, 3-4, p. 289-296 8 p.

Research output: Contribution to journalArticle

11 Scopus citations

Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

Wang, L., Liu, J. & Cowley, J. M., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 968-969 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
1992

A comparative high-resolution study of interface chemistry in silicon-nitride-based ceramic matrix composites reinforced with silicon carbide whiskers

Chowdhury, K. D., Carpenter, R. & Braue, W., Mar 1992, In : Ultramicroscopy. 40, 3, p. 229-239 11 p.

Research output: Contribution to journalArticle

10 Scopus citations

A computer system for imaging and spectroscopy in analytical electron microscopy

Weiss, J. K., Rez, P. & Higgs, A. A., Jun 1992, In : Ultramicroscopy. 41, 4, p. 291-301 11 p.

Research output: Contribution to journalArticle

7 Scopus citations

Alumina-induced reconstruction on annealed (001) surfaces of rutile

Liu, J., Wang, L. & Cowley, J. M., 1992, In : Surface Science. 268, 1-3, p. L293-L299

Research output: Contribution to journalArticle

4 Scopus citations

Atomic structures at cobalt silicide-silicon interfaces

Catana, A., Schmid, P. E., Lu, P. & Smith, D., Dec 1992, In : Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties. 66, 6, p. 933-956 24 p.

Research output: Contribution to journalArticle

12 Scopus citations

Cause of chemical zoning in the Bishop (California) and Bandelier (New Mexico) magma chambers

Hervig, R. & Dunbar, N. W., Jun 1992, In : Earth and Planetary Science Letters. 111, 1, p. 97-108 12 p.

Research output: Contribution to journalArticle

76 Scopus citations

Characterization of epitaxial SiGe thin films on Si: Analytical considerations

Evans, K. L., Anderson, T. A., Liaw, M., Gregory, R., Munukutla, L. V., Graham, R. J. & McCartney, M., Feb 1992, In : Surface and Interface Analysis. 18, 2, p. 129-136 8 p.

Research output: Contribution to journalArticle

6 Scopus citations
19 Scopus citations

Chemical lattice imaging: a pedantic note

Rez, P., Jan 1 1992, In : Ultramicroscopy. 41, 1-3, p. 115-120 6 p.

Research output: Contribution to journalArticle

5 Scopus citations

Computer-assisted extrapolation method for absorption correction in quantitative X-ray microanalysis

Horita, Z., McCartney, M. & Weiss, J. K., Sep 1992, In : Ultramicroscopy. 45, 2, p. 263-265 3 p.

Research output: Contribution to journalLetter

8 Scopus citations

Direct atomic images of dislocation motion caused by image force near surfaces of Pd crystal

Hengqiang, Y., Xiaoguang, N. & Smith, D., Jun 1992, In : Chinese Physics Letters. 9, 6, p. 301-304 4 p.

Research output: Contribution to journalLetter

1 Scopus citations

Electron microscopy at 1-Å resolution by entropy maximization and likelihood ranking

Dong, W., Baird, T., Fryer, J. R., Gilmore, C. J., MacNicol, D. D., Bricogne, G., Smith, D., O'Keefe, M. A. & Hövmoller, S., Jan 1 1992, In : Nature. 355, 6361, p. 605-609 5 p.

Research output: Contribution to journalArticle

68 Scopus citations

Factors limiting the spatial resolution and sensitivity of EELS microanalysis in a STEM

Weiss, J. K. & Carpenter, R., Mar 1992, In : Ultramicroscopy. 40, 3, p. 339-351 13 p.

Research output: Contribution to journalArticle

2 Scopus citations

Foreword

Scheinfein, M. R. & Smith, D., Dec 1992, In : Ultramicroscopy. 47, 4, 1 p.

Research output: Contribution to journalEditorial

Foreword

Smith, D. & Carpenter, R., Mar 1992, In : Ultramicroscopy. 40, 3, p. 197-199 3 p.

Research output: Contribution to journalEditorial

High-angle annular dark-field microscopy of Mo/Si multilayer structures

Liu, J., Cheng, Y., Cowley, J. M. & Stearns, M. B., Mar 1992, In : Ultramicroscopy. 40, 3, p. 352-364 13 p.

Research output: Contribution to journalArticle

3 Scopus citations

High resolution Auger electron imaging of supported metal particles

Liu, J., Hembree, G. G., Spinnler, G. E. & Venables, J. A., Mar 1 1992, In : Catalysis Letters. 15, 1-2, p. 133-143 11 p.

Research output: Contribution to journalArticle

7 Scopus citations

High resolution Auger electron spectroscopy and microscopy of a supported metal catalyst

Liu, J., Hembree, G. G., Spinnler, G. E. & Venables, J. A., Feb 15 1992, In : Surface Science. 262, 3, p. L111-L117

Research output: Contribution to journalArticle

24 Scopus citations

High-resolution electron microscopy of planar inversion domain boundaries in aluminum nitride

McCartney, M., Youngman, R. A. & Teller, R. G., Mar 1992, In : Ultramicroscopy. 40, 3, p. 291-299 9 p.

Research output: Contribution to journalArticle

16 Scopus citations

Imaging x-ray multilayer structures using cross-sectional high resolution electron microscopy

Cheng, Y., Smith, D., Stearns, M. B. & Stearns, D. G., Dec 1 1992, In : Journal of Applied Physics. 72, 11, p. 5165-5171 7 p.

Research output: Contribution to journalArticle

14 Scopus citations

Magnesium silicide based multilayers for soft X-ray optics

Boher, P., Houdy, P., Hennet, L., Li, Z. G., Modak, A., Smith, D. J., Idir, M., Moreno, T., Barchewitz, R., Kühne, M., Müller, P. & Delaboudiniere, J. P., Jan 1 1992, In : Proceedings of SPIE - The International Society for Optical Engineering. 1546, p. 502-519 18 p.

Research output: Contribution to journalConference article

2 Scopus citations

Microanalysis of oxygen isotopes in insulators by secondary ion mass spectrometry

Hervig, R., Williams, P., Thomas, R. M., Schauer, S. N. & Steele, I. M., Oct 2 1992, In : International Journal of Mass Spectrometry and Ion Processes. 120, 1-2, p. 45-63 19 p.

Research output: Contribution to journalArticle

92 Scopus citations