Research Output 1870 2019

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Conference contribution
1984
1 Citation (Scopus)

ATOMIC IMAGING OF PARTICLE SURFACES.

Marks, L. D. & Smith, D., Aug 1984, American Chemical Society, Division of Petroleum Chemistry, Preprints. 3 ed. ACS, Vol. 29. p. 830-835 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Imaging techniques
Catalysis
Electron microscopes
Surface reconstruction
Elastic deformation
3 Citations (Scopus)

DIFFUSION ANALYSIS USING SECONDARY ION MASS SPECTROSCOPY (SIMS).

Petuskey, W., 1984, Unknown Host Publication Title. Murch, G. E., Birnbaum, H. K. & Cost, J. R. (eds.). Warrendale, PA, USA: Metallurgical Soc of AIME, p. 179-202 24 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Spectroscopy
Ions
Secondary ion mass spectrometry
Standardization
Chemical analysis
1985

EFFECT OF TRANSIENT ANNEALING ON GRAIN GROWTH AND STRUCTURE OF POLYCRYSTALLINE SILICON FILMS.

Krause, S., Wilson, S. R., Paulson, W. M. & Gregory, R. B., 1985, Institute of Physics Conference Series. 76 ed. p. 105-110 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Crystal microstructure
Grain growth
Polysilicon
Annealing
Interfacial energy

ELECTRONIC STRUCTURE OF PARTIAL DISLOCATIONS IN SILICON.

Spence, J. & Chelikowsky, J. R., 1985, Unknown Host Publication Title. Warrendale, PA, USA: Metallurgical Soc of AIME, p. 451 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Metal insulator transition
Dislocations (crystals)
Band structure
Electronic structure
Paramagnetic resonance
2 Citations (Scopus)

GRAIN GROWTH PROCESSES DURING TRANSIENT ANNEALING OF As-IMPLANTED, POLYCRYSTALLINE-SILICON FILMS.

Krause, S., Wilson, S. R., Paulson, W. M. & Gregory, R. B., 1985, Materials Research Society Symposia Proceedings. Biegelsen, D. K. & Shank, C. V. (eds.). Pittsburgh, PA, USA: Materials Research Soc, Vol. 35. p. 721-726 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Grain growth
Polysilicon
Annealing
Temperature
1986
6 Citations (Scopus)

CHARACTERIZATION OF ELECTRON TRAPS RESULTING FROM OXYGEN PRECIPITATION IN Cz SILICON.

Whitfield, J., Varker, C. J., Chan, S. S., Carpenter, R., Krause, S., Krause, S. J. & Weber, E. R., 1986, Proceedings of SPIE - The International Society for Optical Engineering. Sadana, D. K. & Current, M. I. (eds.). Bellingham, WA, USA: SPIE, Vol. 623. p. 83-90 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron traps
Precipitates
traps
wafers
precipitates

STRUCTURAL ANALYSIS OF SOLIDS FOR MATERIALS DESIGN: HIGH RESOLUTION ANALYTICAL MICROSCOPY.

Carpenter, R., 1986, Unknown Host Publication Title. Warrendale, PA, USA: Metallurgical Soc of AIME, p. 335-354 20 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon carbide
Structural analysis
Microscopic examination
Sintered carbides
Silicon
1 Citation (Scopus)

STRUCTURE OF OXYGEN-IMPLANTED (111) SILICON BEFORE AND AFTER HEAT-PULSE ANNEALING.

Liliental-Weber, Z., Carpenter, R. & Kelly, J. C., 1986, Materials Research Society Symposia Proceedings. Sedgwick, T. O., Seidel, T. E. & Tsaur, B-Y. (eds.). Pittsburgh, PA, USA: Materials Research Soc, Vol. 52. p. 139-144 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Monocrystalline silicon
Silicon
Annealing
Oxygen
Defect density
1990

Multistep photoinitiated charge separation in a molecular pentad

Moore, T., Gust, D., Moore, A., Lee, S. J., Bittersmann, E., Luttrull, D. K., DeGraziano, J. M., Ma, X. C. & Gao, F., 1990, Proceedings of the Annual Conference on Engineering in Medicine and Biology. pt 4 ed. Piscataway, NJ, United States: Publ by IEEE, p. 1737-1738 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Bearings (structural)
Polyenes
Molecular electronics
Excitation energy
Chemical potential
1991
2 Citations (Scopus)

Characterisation of compound semiconductors by high resolution electron microscopy

Smith, D. & Lu, P., 1991, Institute of Physics Conference Series. 117 ed. Bristol, United Kingdom: Publ by Inst of Physics Publ Ltd, p. 1-10 10 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
electron microscopy
polarity
Semiconductor materials
Crystals
2 Citations (Scopus)

Investigation of the structural and insualting properties of cubic GaN for GaAs-GaN semiconductor-insulator devices

Strite, S., Mui, D. S. L., Martin, G., Li, Z., Smith, D. & Morkog, H., 1991, Institute of Physics Conference Series. Bristol, United Kingdom: Publ by IOP Publishing Ltd, Vol. 120. p. 89-93 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

SIS (semiconductors)
insulators
semiconductor diodes
MIS (semiconductors)
passivity
1993

Application of energy-filtered imaging to the characterization of heterogeneous catalysts

Crozier, P. & McCartney, M., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 724-725 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Amination
Imaging techniques
Catalysts
Metals
Microstructure
1 Citation (Scopus)

CBED study of low-temperature InP grown by gas source MBE

Rajesh, R., Kim, M. J., Bow, J. S., Carpenter, R. & Maracas, G. N., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 810-811 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Molecular beam epitaxy
Gases
Indium
Structural properties
Electric properties
1 Citation (Scopus)

Coherent electron nanodiffraction from clean silver nano particles in a UHV STEM

Liu, J., Pan, M. & Spinnler, G. E., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1058-1059 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silver
Electrons
Catalyst supports
Chemical properties
Catalysis
3 Citations (Scopus)

Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes

Liu, J., Pan, M. & Spinnler, G. E., 1993, Materials Research Society Symposium Proceedings. Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 295. p. 127-132 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Epitaxial growth
Electron microscopy
Air
Vacuum
Electron irradiation
1 Citation (Scopus)

Elemental analysis of matrix grain boundaries in SiC whisker reinforced Si3N4 based composites

Liu, J., Chowdhury, K. D., Carpenter, R. & Braue, W., 1993, Materials Research Society Symposium Proceedings. Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 287. p. 329-334 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Crystal whiskers
Grain boundaries
Yttrium
Composite materials
Chemical analysis

Energy filtered reflection electron microscopy and reflection high-energy electron diffraction on Zeiss 912 TEM

Liu, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 580-581 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron reflection
Reflection high energy electron diffraction
Electron microscopy
Transmission electron microscopy
Aberrations

Experimental low-voltage-point projection microscopy

Spence, J., Qian, W., Liu, J. & Lo, W., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1060-1061 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Nanotips
Radiation damage
Ray tracing
Aberrations
Field emission
1 Citation (Scopus)

Grain boundaries in silicon nitride

Chowdhury, K. D., Carpenter, R. & Braue, W., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 920-921 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon nitride
Grain boundaries
Oxygen
Electron energy loss spectroscopy
High resolution electron microscopy
3 Citations (Scopus)

High spatial resolution tem study of thin film metal/6h-SIC interfaces

Bow, J. S., Porter, L. M., Kim, M. J., Carpenter, R. & Davis, R. F., 1993, Materials Research Society Symposium Proceedings. Atwater, H. A., Chason, E., Grabow, M. H. & Lagally, M. G. (eds.). Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 280. p. 571-576 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hafnium
Metals
Thin films
Titanium
Platinum

HREM and AEM study of Pt/SiC interface annealed at high temperature

Bow, J. S., Porter, L. M., Kim, M. J., Carpenter, R. & Davis, R. F., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 832-833 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Annealing
Energy dissipation
Electric properties
Temperature
1 Citation (Scopus)

HREM image simulations for supported metal particle catalysts

Yao, M. H. & Smith, D., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 736-737 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Visibility
Catalysts
Metals
Chemical properties

Low-voltage scanning electron microscopy of urinary stones

Rez, P., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 416-417 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Insulating materials
Field emission
Electron microscopes
Scanning
Imaging techniques
1 Citation (Scopus)

Microstructural evolution and coherent islands

Drucker, J., 1993, Materials Research Society Symposium Proceedings. Atwater, H. A., Chason, E., Grabow, M. H. & Lagally, M. G. (eds.). Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 280. p. 389-392 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Microstructural evolution
Adatoms
Surface diffusion
Coarsening
Epitaxial growth

Microstructural study of reaction-bonded silicon carbide

Chowdhury, K. D., Carpenter, R. & Braue, W., 1993, Materials Research Society Symposium Proceedings. Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 295. p. 183-188 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon carbide
Impurities
Oxygen
High resolution electron microscopy
Precipitates

Nanometer-resolution Auger electron spectroscopy and microscopy of small particles

Liu, J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 720-721 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Auger electron spectroscopy
Electron microscopy
Microscopic examination
Scanning
Carbon

Observation of a supported metal catalyst in an ultra-high-resolution field-emission SEM

Liu, J. & Spinnler, G. E., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 784-785 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Field emission
Scanning electron microscopy
Catalysts
Metals

Observation of supported catalyst particles by high-resolution SEM

Yao, M. H., Smith, D. & Datye, A. K., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 782-783 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Catalyst supports
Scanning electron microscopy
Field emission
Catalysis
Lenses
1 Citation (Scopus)

Origin of the alternate bright/dark contrast in HREM images of hexagonal crystals, particularly 6H-SiC

Bow, J. S., Carpenter, R. & Kim, M. J., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 914-915 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Crystals
Atoms
Image resolution
Switches

Origins of high-resolution secondary-electron microscopy

Scheinfein, M. R., Drucker, J. & Weiss, J. K., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 766-767 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron energy loss spectroscopy
Electron microscopy
Microanalysis
Lenses
Microscopes
2 Citations (Scopus)

Origins of high spatial resolution secondary electron microscopy

Scheinfein, M. R., Drucker, J., Liu, J., Weiss, J. K., Hembree, G. G. & Cowley, J. M., 1993, Materials Research Society Symposium Proceedings. Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 295. p. 253-259 7 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron microscopy
Electrons
Electron spectroscopy
Ultrahigh vacuum
Momentum
1 Citation (Scopus)

Preparation of thin-film-metal/6H-SiC TEM specimens by RPR ion milling

Bow, J. S., Shaapur, F., Kim, M. J. & Carpenter, R., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 714-715 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Transmission electron microscopy
Thin films
Ions
Metals
Substrates

Quantitative analysis of low-dose high-resolution images and diffraction patterns from zeolites using a slow-scan CCD camera

Pan, M. & Crozier, P., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 670-671 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

CCD cameras
Image resolution
Zeolites
Diffraction patterns
Chemical analysis

Real-time viewing of dynamic processes on CdTe surfaces at elevated temperature

Smith, D., Vogl, R. & Lu, P., 1993, Materials Research Society Symposium Proceedings. Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 295. p. 133-138 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Temperature
Cadmium telluride
Video recording
Sublimation
Superconducting transition temperature

Short-range order to long-range order transition in a Cu-Ti alloy

Lee, J. S., Carpenter, R., Lim, H. & Choo, W. K., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 1180-1181 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Diffraction patterns
3 Citations (Scopus)

Si(100) surface corrosion by NH4F studied using high spatial resolution secondary electron imaging in a UHV-STEM

Drucker, J., Bandari, A. & Burrows, V., 1993, Materials Research Society Symposium Proceedings. Higashi, G. S., Irene, E. A. & Ohmi, T. (eds.). Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 315. p. 479-484 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Corrosion
Imaging techniques
Electrons
Salts
Ultrahigh vacuum

Structural characterization of thin Co/Cu superlattices

Smith, D., Modak, A. R. & Parkin, S. S. P., 1993, Materials Research Society Symposium Proceedings. Jonker, B. T., de Jonge, W. J. M., Farrow, R. F. C., Chappert, C., Clarke, R. & et al, A. (eds.). Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 313. p. 437-442 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Superlattices
Multilayers
Magnetic thin films
Exchange coupling
Microstructure
1 Citation (Scopus)

Zero-loss energy filtered REM and RHEED observations on rutile (110) surface

Wang, L., Liu, J. & Cowley, J. M., 1993, Proceedings - Annual Meeting, Microscopy Society of America. Publ by San Francisco Press Inc, p. 968-969 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron reflection
Reflection high energy electron diffraction
Electron microscopy
Energy dissipation
Inelastic scattering
1994

Characterization of Group III-nitrides by high-resolution electron microscopy

Chandrasekhar, D., Smith, D., Strite, S., Lin, M. E. & Morkoc, H., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 846-847 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Nitrides
Plasmas
Substrates
Molecular beam epitaxy
1 Citation (Scopus)

Energy-filtered chemical mapping: Current applications to materials science

Crozier, P., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 958-959 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Materials science
Electron microscopes
Image recording
Electron guns
Spectrometers

HREM image simulation of Ti5Si3/TiC/6H-SiC interfaces

Bow, J. S., Carpenter, R. & Kim, M. J., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 518-519 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Interfaces (computer)
Crystals
Crystal orientation
Computer simulation
1 Citation (Scopus)

Introduction to electron holography

McCartney, M., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 396-397 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Electron holography
Holograms
Imaging techniques
Holography
Wavefronts
3 Citations (Scopus)

MBE growth and characterization of epitaxial MnS and ZnSe heterostructures on GaAs

Skromme, B., Zhang, Y-H., Liu, W., Parameshwaran, B. & Smith, D., 1994, Materials Research Society Symposium Proceedings. Pittsburgh, PA, United States: Publ by Materials Research Society, Vol. 326. p. 15-20 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Molecular beam epitaxy
Excitons
Heterojunctions
Zinc
Photoluminescence

Nanoanalysis of precipitation in a modified Inconel 718 alloy

Liu, J., Dong, J. X., Chen, M. Z. & Xie, X. S., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 702-703 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Strengthening (metal)
Superalloys
Electron microscopy
Intermetallics
Precipitates
1 Citation (Scopus)

Observation of the evolution of 55-atom icosahedral Ag clusters by coherent electron nanodiffraction in a UHV stem

Liu, J. & Spinnler, G. E., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 788-789 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silver
Microscopes
Electron microscopes
Diffraction
Scanning

Structurally and chemical analysis of Pd-Ge ohmic contacts to epitaxially lifted-off GaAs

Rajesh, R., Liu, J., Fathollahnejad, H., Carpenter, R. & Maracas, G. N., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 842-843 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ohmic contacts
High resolution electron microscopy
Chemical analysis
Structural analysis
Annealing

TEM characterization of SiGeC material system

Chandrasekhar, D., Smith, D., Kouvetakis, J. & Robinson, M., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 840-841 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Transmission electron microscopy
Ions
Rutherford backscattering spectroscopy
Diffraction patterns
Lattice constants

Toward quantitative defect analysis using HREM

Smith, D., 1994, Proceedings - Annual Meeting, Microscopy Society of America. Bailey, G. W. & Garratt-Reed, A. J. (eds.). p. 714-715 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

High resolution electron microscopy
Imaging techniques
Defects
1995

Chemical widths at composite interfaces: Relationships to structural widths and methods for measurement

Carpenter, R., Bow, J. S., Kim, M. J., Chowdhury, K. D. & Braue, W., 1995, Materials Research Society Symposium - Proceedings. Materials Research Society, Vol. 357. p. 271-276 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Imaging techniques
Electron energy loss spectroscopy
Composite materials
Field emission
Grain boundaries

Electron beam assisted chemical vapor deposition of gold in an environmental tem

Kouvertakis, J., Sharma, R., Ramakrisna, B. L., Drucker, J. & Seidler, P., 1995, Materials Research Society Symposium - Proceedings. Materials Research Society, Vol. 388. p. 323-328 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Gold
Chemical vapor deposition
Electron beams
Irradiation
Deposition rates