AINE: Applied Nanoionics, Center for (CANi)

Research Output 2000 2019

Filter
Review article
2017
14 Citations (Scopus)

Review of radiation effects on ReRAM devices and technology

Gonzalez Velo, Y., Barnaby, H. & Kozicki, M., Jul 3 2017, In : Semiconductor Science and Technology. 32, 8, 083002.

Research output: Contribution to journalReview article

Radiation effects
random access memory
radiation effects
Data storage equipment
resilience
2016
39 Citations (Scopus)

Conductive bridging random access memory - Materials, devices and applications

Kozicki, M. & Barnaby, H., Oct 5 2016, In : Semiconductor Science and Technology. 31, 11, 113001.

Research output: Contribution to journalReview article

random access memory
Ions
Data storage equipment
filaments
ions