LeRoy Eyring: John M. Cowley Center for High Resolution Electron Microscopy

Equipment/facility: Facility

  • Location

    United States

Description

As a global leader in high resolution electron microscopy, ASU plays an important role characterizing critical properties of materials. This facility houses a dozen electron microscopes that can probe the physical, electronic and chemical structure of matter on an atomic scale. Instruments & techniques include Ion Milling; Electron Microprobe; Scanning Electron Microscopy; Transmission Electron Microscopy; Scanning Transmission Electron Microscopy; and Aberration Corrected Electron Microscopy. ACEM TEM / STEM Nion UltraSTEM 100 ARM200F (JEOL) Titan 300/80 (FEI) FIB & Sample Prep Focused Ion Beam - Nova 200 NanoLab (FEI) Microprobe Electron Microprobe SEM XL30 Environmental FEG (FEI) TEM/STEM 2000FX (JEOL) 4000EX (JEOL) 2010F (JEOL) CM200-FEG (Philips) Tecnai F20 (FEI) Contact: Karl Weiss

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electron microscopy
transmission electron microscopy
high resolution
scanning electron microscopy
Titan
aberration
electron microscopes
ion beams
electronic structure
probes
ions
electrons