Equipments Details
Description
As a global leader in high resolution electron microscopy, ASU plays an important role characterizing critical properties of materials. This facility houses a dozen electron microscopes that can probe the physical, electronic and chemical structure of matter on an atomic scale. Instruments & techniques include Ion Milling; Electron Microprobe; Scanning Electron Microscopy; Transmission Electron Microscopy; Scanning Transmission Electron Microscopy; and Aberration Corrected Electron Microscopy.
ACEM TEM / STEM
Nion UltraSTEM 100
ARM200F (JEOL)
Titan 300/80 (FEI)
FIB & Sample Prep
Focused Ion Beam - Nova 200 NanoLab (FEI)
Microprobe
Electron Microprobe
SEM
XL30 Environmental FEG (FEI)
TEM/STEM
2000FX (JEOL)
4000EX (JEOL)
2010F (JEOL)
CM200-FEG (Philips)
Tecnai F20 (FEI)
Contact: Karl Weiss
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