LeRoy Eyring: Ion Beam Analysis of Materials (IBeAM) Facility

Equipment/facility: Facility

  • Location

    United States

Equipments Details

Description

The IBeAM facility uses MeV ion beams to probe the elemental compositional and structural properties of materials. The process combines the advantages of non-destructive and standardless analysis of the surface and near surface regions of solids and liquids. Techniques include Rutherford Backscattering; Proton-Induced X-ray Emission; and X-ray Fluorescence.
Contact: Barry Wilkens

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