Equipments Details
Description
The Goldwater Materials Science facility provides an extensive array of analytical tools and techniques for optical, structural and surface analysis; surface morphology, chemistry & microscopy; and synthesis & processing. Widely used techniques include X-ray Diffraction & Topography; Atomic Force Microscopy; FT-IR and Raman Spectroscopy; Auger and X-ray Photoelectron Spectroscopy; Optical & Stylus Profilometry; Residual Gas Analysis; Ellipsometry; and Thin film synthesis.
Optical Spectroscopy
Ellipsometer (VASE)
FT-IR / FT-Raman (Bruker IFS66V/S)
Micro-Raman Spectrometer
UV-Vis Spectrometer (Perkin Elmer Lambda 18)
Surface Composition & Film Deposition
Auger Electron Spectroscopy (AES
)X-ray Photoelectron Spectroscopy (VG 220i-XL)
Film Deposition
X-ray Diffraction
High Resolution X-ray Diffractometer (PANalytical X'Pert PRO MRD)
X-ray topography (Rigaku XRT-100)
Powder X-ray Diffractometer (Siemens D5000)
Surface Imaging
Optical Profilometer (ZeScope)
Stylus Profilometer (Bruker Dektak XT)
Scanning Probe/ Atomic force Microscopy (SPM/AFM)
Materials Processing & Calorimetry
Calorimetry (TGA/DTA/DSC)
Residual Gas Analysis (SRS200)
Furnaces
General Lab
Contact: Emmanuel Soignard
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