CLAS: X-Ray Diffraction Facility

    Equipment/facility: Facility

    • Location

      United States

    Description

    The X-ray Diffraction Facility provides a variety of services including single crystal structural analysis, identification of materials, crystal orientation, structural database access and more.

    Bruker D8 specialized powder X-ray diffractometer
    The D8 Advance Diffractometer has many specialized diffraction capabilities. There are two high temperature stages, the first of which can examine samples in situ using non-corrosive gas environments from vacuum to 10 atmopheres and up to 900C in temperature. The second high temperature stage can examine samples in situ under vacuum up to 1200C. Other stages include an XYZ stage and microdiffraction collimators for examining small sections of larger samples, such as petrographic thin sections. A capillary stage is available to study air-sensitive samples. Two different primary beam monochromators enable very clean data that can be used in ab initio structure determination and Rietveld structure refinement.

    Siemens D5000 X-ray diffractometer
    The Siemens D5000 X-Ray Diffractometer is used mainly for collecting fast data used in identifying unknown solid powders. Data from this instrument can also be used for determining aggregate particle sizes (domain size) in samples, and many other attributes associated with high quality powder data.

    Single crystal structure analysis
    Working with good quality single crystal material having dimensions of 10 to 500 microns, a structural analysis will provide the bond lengths and angles in the crystalline solid as well as the packing of the material. A low-temperature device is available to cool the crystals in the range of room temperature down to 120K. It has been said that this technique is the ultimate analytical tool.

    X-ray database workstations
    The CLAS X-ray Diffraction Facility maintains two identical workstations that have software for analysis of the data acquired within the facility. Software packages include Jade, for identifying powders, determining unit cells and space groups, particle size analysis, etc. TOPAS has recently been installed, which is used for ab initio structure determination and refinement with powder data. The ICDD database is maintained yearly to current releases.

    Contact: Thomas Groy

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    Powders
    X ray diffraction
    X rays
    Diffractometers
    Single crystals
    Structural analysis
    Temperature
    Vacuum
    Monochromators
    Bond length
    Software packages
    Particle size analysis
    Crystal orientation
    Diffraction
    Crystal structure
    Gases
    Particle size
    Crystalline materials
    Crystals
    Air